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Co-authors
- Ilaria MalanchiniNokia Bell LabsVerified email at nokia-bell-labs.com
- Slawomir StanczakTechnische Universität Berlin and Fraunhofer HHIVerified email at tu-berlin.de
- Matteo CesanaFull Professor, Politecnico di MilanoVerified email at polimi.it
- Nikolaos PappasAssociate Professor, Linköping University (LiU)Verified email at liu.se
- Joerg WidmerResearch Professor, IMDEA Networks, Madrid, SpainVerified email at imdea.org
- S Amir HosseiniPhD candidate at NYU Tandon School of EngineeringVerified email at nyu.edu
- Nicola BuiSR Research Engineer, BastilleVerified email at bastille.io
- Paolo BaraccaSenior Staff Research Specialist, NokiaVerified email at nokia.com
- Federico PennaSamsung Semiconductor, Inc.Verified email at samsung.com
- Anastasios GiovanidisEricsson Research & CNRS (Dr.-Ing., habil.)Verified email at ericsson.com
- Lei YouTechnical University of DenmarkVerified email at dtu.dk
- Danish AzizSubject Matter Expert (RF & Microwave), Analog DevicesVerified email at analog.com
- David López-PérezUniversitat Politčcnica de ValčnciaVerified email at ieee.org
- Lorenzo Galati GiordanoSenior Research Engineer - MTS at Bell Labs, Nokia Stuttgart (Germany)Verified email at nokia-bell-labs.com
- Stefan ValentinProfessor at Darmstadt University of Applied SciencesVerified email at ieee.org
- Chun-Nam YuMember of Technical Staff, Nokia Bell LabsVerified email at cs.cornell.edu
- Tin Kam HoIBM Watson