| Antirandom test vectors for BIST in hardware/software systems I Mrozek, V Yarmolik Fundamenta Informaticae 119 (2), 163-185, 2012 | 27 | 2012 |
| Iterative antirandom testing I Mrozek, VN Yarmolik Journal of Electronic Testing 28 (3), 301-315, 2012 | 26 | 2012 |
| Multi background memory testing SV Yarmolik, I Mrozek 2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007 | 20 | 2007 |
| Multiple controlled random testing I Mrozek, V Yarmolik Fundamenta Informaticae 144 (1), 23-43, 2016 | 13 | 2016 |
| Optimal backgrounds selection for multi run memory testing I Mrozek, V Yarmolik 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008 | 13 | 2008 |
| Multi-run memory tests for pattern sensitive faults I Mrozek Springer International Publishing, 2019 | 10 | 2019 |
| Analysis of multibackground memory testing techniques I Mrozek Zielona Góra: Uniwersytet Zielonogórski, 2010 | 10 | 2010 |
| Detection of Pattern Sensitive Faults by Multiple Transparent March Tests I Mrozek, VN Yarmolik Proceedings of the MIXDES 3, 2003 | 10 | 2003 |
| Problemy funkcjonalnego testowania pamięci RAM I Mrozek, VN Ârmolik Oficyna Wydawnicza Politechniki Białostockiej, 2009 | 8 | 2009 |
| Impact of the address changing on the detection of pattern sensitive faults B Sokol, I Mrozek, W Yarmolik Information Processing and Security Systems, 217-225, 2005 | 8 | 2005 |
| Method for Generation Multiple Controlled Random Tests I Mrozek, V Yarmolik Proc. of the Computer Information Systems and Industrial Management (CISIM …, 2016 | 7 | 2016 |
| MATS+ transparent memory test for pattern sensitive fault detection I Mrozek, VN Yarmolik 2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008 | 7 | 2008 |
| Two-run RAM march testing with address decimation I Mrozek, V Yarmolik Journal of Circuits, Systems and Computers 26 (02), 1750031, 2017 | 6 | 2017 |
| Methods of synthesis of controlled random tests I Mrozek, V Yarmolik IFIP International Conference on Computer Information Systems and Industrial …, 2016 | 6 | 2016 |
| Transparent March Tests to effective Pattern Sensitive Faults Detection B Sokol, I Mrozek, VN Yarmolik Proceedings of the IEEE East-West Design and Test International Workshop …, 2004 | 6 | 2004 |
| Optimal controlled random tests I Mrozek, V Yarmolik IFIP International Conference on Computer Information Systems and Industrial …, 2017 | 4 | 2017 |
| Transparentne testowanie pamięci RAM oparte na charakterystyce adresowej I Mrozek, V Yarmolik Elektronika: konstrukcje, technologie, zastosowania 51 (9), 161-163, 2010 | 4 | 2010 |
| Address Sequences Generation for Multiple Run Memory Testing SV Yarmolik, I Mrozek, B Sokol Computer Information Systems and Industrial Management Applications, 2007 …, 2007 | 4 | 2007 |
| Pseudo-exhaustive random access memory testing based on march tests with random background variation I Mrozek, V Yarmolik 2018 IEEE East-West Design & Test Symposium (EWDTS), 1-8, 2018 | 3 | 2018 |
| Controlled method of random test synthesis VN Yarmolik, I Mrozek, SV Yarmolik Automatic Control and Computer Sciences 49 (6), 395-403, 2015 | 3 | 2015 |
