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Ireneusz Mrozek
Ireneusz Mrozek
Verified email at pb.edu.pl
Title
Cited by
Cited by
Year
Iterative antirandom testing
I Mrozek, VN Yarmolik
Journal of Electronic Testing 28, 301-315, 2012
352012
Antirandom test vectors for BIST in hardware/software systems
I Mrozek, V Yarmolik
Fundamenta Informaticae 119 (2), 163-185, 2012
292012
Multi background memory testing
SV Yarmolik, I Mrozek
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
212007
Multiple controlled random testing
I Mrozek, V Yarmolik
Fundamenta Informaticae 144 (1), 23-43, 2016
182016
Multi-run memory tests for pattern sensitive faults
I Mrozek
Springer International Publishing, 2019
152019
Optimal backgrounds selection for multi run memory testing
I Mrozek, V Yarmolik
2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008
152008
Analysis of multibackground memory testing techniques
I Mrozek
International Journal of Applied Mathematics and Computer Science 20 (1 …, 2010
122010
Detection of Pattern Sensitive Faults by Multiple Transparent March Tests
I Mrozek, VN Yarmolik
Proceedings of the MIXDES 3, 2003
102003
Problemy funkcjonalnego testowania pamięci RAM
I Mrozek, VN Ārmolik
Oficyna Wydawnicza Politechniki Białostockiej, 2009
92009
MATS+ transparent memory test for pattern sensitive fault detection
I Mrozek, VN Yarmolik
2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008
92008
Impact of the address changing on the detection of pattern sensitive faults
B Sokol, I Mrozek, W Yarmolik
Information Processing and Security Systems, 217-225, 2005
92005
Method for Generation Multiple Controlled Random Tests
I Mrozek, V Yarmolik
Proc. of the Computer Information Systems and Industrial Management (CISIM …, 2016
82016
Methods of synthesis of controlled random tests
I Mrozek, V Yarmolik
Computer Information Systems and Industrial Management: 15th IFIP TC8 …, 2016
82016
Two-run RAM march testing with address decimation
I Mrozek, V Yarmolik
Journal of Circuits, Systems and Computers 26 (02), 1750031, 2017
72017
Optimal controlled random tests
I Mrozek, V Yarmolik
Computer Information Systems and Industrial Management: 16th IFIP TC8 …, 2017
62017
Controlled method of random test synthesis
VN Yarmolik, I Mrozek, SV Yarmolik
Automatic Control and Computer Sciences 49, 395-403, 2015
62015
Transparent March Tests to effective Pattern Sensitive Faults Detection
B Sokol, I Mrozek, VN Yarmolik
EAST-WEST DESIGN & TEST WORKSHOP-EWDTW 4, 166-171, 2004
62004
Transparent memory tests based on the double address sequences
I Mrozek, VN Yarmolik
Entropy 23 (7), 894, 2021
52021
Transparent memory tests with even repeating addresses for storage devices
VN Yarmolik, I Mrozek, VA Levantsevich, DV Demenkovets
Informatika [Informatics] 18 (3), 18-35, 2021
42021
Pseudo-exhaustive random access memory testing based on march tests with random background variation
I Mrozek, V Yarmolik
2018 IEEE East-West Design & Test Symposium (EWDTS), 1-8, 2018
42018
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Articles 1–20