Iterative antirandom testing I Mrozek, VN Yarmolik Journal of Electronic Testing 28, 301-315, 2012 | 35 | 2012 |
Antirandom test vectors for BIST in hardware/software systems I Mrozek, V Yarmolik Fundamenta Informaticae 119 (2), 163-185, 2012 | 29 | 2012 |
Multi background memory testing SV Yarmolik, I Mrozek 2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007 | 21 | 2007 |
Multiple controlled random testing I Mrozek, V Yarmolik Fundamenta Informaticae 144 (1), 23-43, 2016 | 18 | 2016 |
Multi-run memory tests for pattern sensitive faults I Mrozek Springer International Publishing, 2019 | 15 | 2019 |
Optimal backgrounds selection for multi run memory testing I Mrozek, V Yarmolik 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008 | 15 | 2008 |
Analysis of multibackground memory testing techniques I Mrozek International Journal of Applied Mathematics and Computer Science 20 (1 …, 2010 | 12 | 2010 |
Detection of Pattern Sensitive Faults by Multiple Transparent March Tests I Mrozek, VN Yarmolik Proceedings of the MIXDES 3, 2003 | 10 | 2003 |
Problemy funkcjonalnego testowania pamięci RAM I Mrozek, VN Ārmolik Oficyna Wydawnicza Politechniki Białostockiej, 2009 | 9 | 2009 |
MATS+ transparent memory test for pattern sensitive fault detection I Mrozek, VN Yarmolik 2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008 | 9 | 2008 |
Impact of the address changing on the detection of pattern sensitive faults B Sokol, I Mrozek, W Yarmolik Information Processing and Security Systems, 217-225, 2005 | 9 | 2005 |
Method for Generation Multiple Controlled Random Tests I Mrozek, V Yarmolik Proc. of the Computer Information Systems and Industrial Management (CISIM …, 2016 | 8 | 2016 |
Methods of synthesis of controlled random tests I Mrozek, V Yarmolik Computer Information Systems and Industrial Management: 15th IFIP TC8 …, 2016 | 8 | 2016 |
Two-run RAM march testing with address decimation I Mrozek, V Yarmolik Journal of Circuits, Systems and Computers 26 (02), 1750031, 2017 | 7 | 2017 |
Optimal controlled random tests I Mrozek, V Yarmolik Computer Information Systems and Industrial Management: 16th IFIP TC8 …, 2017 | 6 | 2017 |
Controlled method of random test synthesis VN Yarmolik, I Mrozek, SV Yarmolik Automatic Control and Computer Sciences 49, 395-403, 2015 | 6 | 2015 |
Transparent March Tests to effective Pattern Sensitive Faults Detection B Sokol, I Mrozek, VN Yarmolik EAST-WEST DESIGN & TEST WORKSHOP-EWDTW 4, 166-171, 2004 | 6 | 2004 |
Transparent memory tests based on the double address sequences I Mrozek, VN Yarmolik Entropy 23 (7), 894, 2021 | 5 | 2021 |
Transparent memory tests with even repeating addresses for storage devices VN Yarmolik, I Mrozek, VA Levantsevich, DV Demenkovets Informatika [Informatics] 18 (3), 18-35, 2021 | 4 | 2021 |
Pseudo-exhaustive random access memory testing based on march tests with random background variation I Mrozek, V Yarmolik 2018 IEEE East-West Design & Test Symposium (EWDTS), 1-8, 2018 | 4 | 2018 |