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Ireneusz Mrozek
Ireneusz Mrozek
Verified email at pb.edu.pl
Title
Cited by
Cited by
Year
Antirandom test vectors for BIST in hardware/software systems
I Mrozek, V Yarmolik
Fundamenta Informaticae 119 (2), 163-185, 2012
272012
Iterative antirandom testing
I Mrozek, VN Yarmolik
Journal of Electronic Testing 28 (3), 301-315, 2012
262012
Multi background memory testing
SV Yarmolik, I Mrozek
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
202007
Multiple controlled random testing
I Mrozek, V Yarmolik
Fundamenta Informaticae 144 (1), 23-43, 2016
132016
Optimal backgrounds selection for multi run memory testing
I Mrozek, V Yarmolik
2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and …, 2008
132008
Multi-run memory tests for pattern sensitive faults
I Mrozek
Springer International Publishing, 2019
102019
Analysis of multibackground memory testing techniques
I Mrozek
Zielona Góra: Uniwersytet Zielonogórski, 2010
102010
Detection of Pattern Sensitive Faults by Multiple Transparent March Tests
I Mrozek, VN Yarmolik
Proceedings of the MIXDES 3, 2003
102003
Problemy funkcjonalnego testowania pamięci RAM
I Mrozek, VN Ârmolik
Oficyna Wydawnicza Politechniki Białostockiej, 2009
82009
Impact of the address changing on the detection of pattern sensitive faults
B Sokol, I Mrozek, W Yarmolik
Information Processing and Security Systems, 217-225, 2005
82005
Method for Generation Multiple Controlled Random Tests
I Mrozek, V Yarmolik
Proc. of the Computer Information Systems and Industrial Management (CISIM …, 2016
72016
MATS+ transparent memory test for pattern sensitive fault detection
I Mrozek, VN Yarmolik
2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008
72008
Two-run RAM march testing with address decimation
I Mrozek, V Yarmolik
Journal of Circuits, Systems and Computers 26 (02), 1750031, 2017
62017
Methods of synthesis of controlled random tests
I Mrozek, V Yarmolik
IFIP International Conference on Computer Information Systems and Industrial …, 2016
62016
Transparent March Tests to effective Pattern Sensitive Faults Detection
B Sokol, I Mrozek, VN Yarmolik
Proceedings of the IEEE East-West Design and Test International Workshop …, 2004
62004
Optimal controlled random tests
I Mrozek, V Yarmolik
IFIP International Conference on Computer Information Systems and Industrial …, 2017
42017
Transparentne testowanie pamięci RAM oparte na charakterystyce adresowej
I Mrozek, V Yarmolik
Elektronika: konstrukcje, technologie, zastosowania 51 (9), 161-163, 2010
42010
Address Sequences Generation for Multiple Run Memory Testing
SV Yarmolik, I Mrozek, B Sokol
Computer Information Systems and Industrial Management Applications, 2007 …, 2007
42007
Pseudo-exhaustive random access memory testing based on march tests with random background variation
I Mrozek, V Yarmolik
2018 IEEE East-West Design & Test Symposium (EWDTS), 1-8, 2018
32018
Controlled method of random test synthesis
VN Yarmolik, I Mrozek, SV Yarmolik
Automatic Control and Computer Sciences 49 (6), 395-403, 2015
32015
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Articles 1–20