| Editors' Choice Communication—Comparison of Nanoscale Focused Ion Beam and Electrochemical Lithiation in β-Sn Microspheres S Takeuchi, WR McGehee, JL Schaefer, TM Wilson, KA Twedt, EH Chang, ... Journal of The Electrochemical Society 163 (6), A1010-A1012, 2016 | 8 | 2016 |
| Reconstructing focused ion beam current density profile by iterative simulation methodology E Chang, K Toula, V Ray Journal of Vacuum Science & Technology B, Nanotechnology and …, 2016 | 6 | 2016 |
| Methodology for Studying Nanoscale Details of Focused Ion Beam Gas-Assisted Etching and Deposition by TEM and Numerical Modeling V Ray, E Chang, K Toula, SC Liou, WA Chiou Microscopy and Microanalysis 21 (S3), 1843-1844, 2015 | 3 | 2015 |
| Optimizing Gas Assisted Processes for Ga+ and Xe+ FIB Circuit Edit Application V Ray, JV Oboña, S Sharma, L Rotkina, E Chang, K Toula | 3* | |
| Focused Ion Beams for Lithiation of High Capacity Host Materials for Negative Electrodes S Takeuchi, WR McGehee, JL Schaefer, TM Wilson, KA Twedt, EH Chang, ... Meeting Abstracts, 200-200, 2016 | | 2016 |
