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Georges Pavlidis
Georges Pavlidis
Bestätigte E-Mail-Adresse bei uconn.edu - Startseite
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Zitiert von
Zitiert von
Jahr
Field-effect transistors based on wafer-scale, highly uniform few-layer p-type WSe 2
PM Campbell, A Tarasov, CA Joiner, MY Tsai, G Pavlidis, S Graham, ...
Nanoscale 8 (4), 2268-2276, 2016
712016
Spontaneous current constriction in threshold switching devices
JM Goodwill, G Ramer, D Li, BD Hoskins, G Pavlidis, JJ McClelland, ...
Nature communications 10 (1), 1628, 2019
642019
High resolution thermal characterization and simulation of power AlGaN/GaN HEMTs using micro-Raman thermography and 800 picosecond transient thermoreflectance imaging
K Maize, G Pavlidis, E Heller, L Yates, D Kendig, S Graham, A Shakouri
2014 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 1-8, 2014
602014
Thermal characterization of gallium nitride pin diodes
J Dallas, G Pavlidis, B Chatterjee, JS Lundh, M Ji, J Kim, T Kao, ...
Applied Physics Letters 112 (7), 2018
582018
Characterization of AlGaN/GaN HEMTs using gate resistance thermometry
G Pavlidis, S Pavlidis, ER Heller, EA Moore, R Vetury, S Graham
IEEE Transactions on Electron Devices 64 (1), 78-83, 2016
532016
Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing
G Pavlidis, D Kendig, ER Heller, S Graham
IEEE Transactions on Electron Devices 65 (5), 1753-1758, 2018
482018
Revealing the Distribution of Metal Carboxylates in Oil Paint from the Micro‐to Nanoscale
X Ma, V Beltran, G Ramer, G Pavlidis, DY Parkinson, M Thoury, ...
Angewandte Chemie 131 (34), 11778-11782, 2019
352019
The Effects of AlN and Copper Back Side Deposition on the Performance of Etched Back GaN/Si HEMTs
G Pavlidis, SH Kim, I Abid, M Zegaoui, F Medjdoub, S Graham
IEEE Electron Device Letters 40 (7), 1060-1063, 2019
292019
Thermal Performance of GaN/Si HEMTs Using Near-Bandgap Thermoreflectance Imaging
G Pavlidis, L Yates, D Kendig, CF Lo, H Marchand, B Barabadi, S Graham
IEEE Transactions on Electron Devices 67 (3), 822-827, 2020
262020
A comparative study on the junction temperature measurements of LEDs with raman spectroscopy, microinfrared (IR) imaging, and Forward voltage methods
E Tamdogan, G Pavlidis, S Graham, M Arik
IEEE Transactions on Components, Packaging and Manufacturing Technology 8 …, 2018
262018
Micro to nano: multiscale IR analyses reveal zinc soap heterogeneity in a 19th-century painting by Corot
X Ma, G Pavlidis, E Dillon, V Beltran, JJ Schwartz, M Thoury, F Borondics, ...
Analytical Chemistry 94 (7), 3103-3110, 2022
202022
Experimental confirmation of long hyperbolic polariton lifetimes in monoisotopic (10B) hexagonal boron nitride at room temperature
G Pavlidis, JJ Schwartz, J Matson, T Folland, S Liu, JH Edgar, ...
APL materials 9 (9), 2021
192021
Improving the Transient Thermal Characterization of GaN HEMTs
G Pavlidis, D Kendig, L Yates, S Graham
2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2018
182018
The thermal effects of substrate removal on GaN HEMTs using Raman thermometry
G Pavlidis, D Mele, T Cheng, F Medjdoub, S Graham
2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016
162016
High throughput nanoimaging of thermal conductivity and interfacial thermal conductance
M Wang, G Ramer, DJ Perez-Morelo, G Pavlidis, JJ Schwartz, L Yu, R Ilic, ...
Nano Letters 22 (11), 4325-4332, 2022
142022
Scalable Modeling of Transient Self-Heating of GaN High-Electron-Mobility Transistors Based on Experimental Measurements
A Cutivet, G Pavlidis, B Hassan, M Bouchilaoun, C Rodriguez, A Soltani, ...
IEEE Transactions on Electron Devices 66 (5), 2139-2145, 2019
132019
Monitoring the Joule heating profile of GaN/SiC high electron mobility transistors via cross-sectional thermal imaging
G Pavlidis, AM Hilton, JL Brown, ER Heller, S Graham
Journal of Applied Physics 128 (7), 2020
122020
Understanding Cantilever Transduction Efficiency and Spatial Resolution in Nanoscale Infrared Microscopy
JJ Schwartz, G Pavlidis, A Centrone
Analytical Chemistry 94 (38), 13126-13135, 2022
102022
Thermal simulation of heterogeneous GaN/InP/silicon 3DIC stacks
TR Harris, EJ Wyers, L Wang, S Graham, G Pavlidis, PD Franzon, ...
2015 International 3D Systems Integration Conference (3DIC), TS10. 2.1-TS10. 2.4, 2015
102015
Thermal raman and IR measurement of heterogeneous integration stacks
TR Harris, G Pavlidis, EJ Wyers, DM Newberry, S Graham, P Franzon, ...
2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016
92016
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