| Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy B Singh, A Diwan, V Jain, A Herrera-Gomez, J Terry, MR Linford Applied Surface Science 387, 155-162, 2016 | 71 | 2016 |
| A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic … S Chatterjee, B Singh, A Diwan, ZR Lee, MH Engelhard, J Terry, ... Applied Surface Science 433, 994-1017, 2018 | 50 | 2018 |
| Improved efficiency of reversed‐phase carbon/nanodiamond/polymer core–shell particles for HPLC using carbonized poly (divinylbenzene) microspheres as the core materials CH Hung, LA Wiest, B Singh, A Diwan, MJC Valentim, JM Christensen, ... Journal of separation science 36 (24), 3821-3829, 2013 | 35 | 2013 |
| Porous, High Capacity Coatings for Solid Phase Microextraction by Sputtering A Diwan, B Singh, T Roychowdhury, DD Yan, L Tedone, PN Nesterenko, ... Analytical chemistry 88 (3), 1593-1600, 2016 | 30 | 2016 |
| Good practices for XPS (and other types of) peak fitting B Singh, R Hesse, MR Linford Vac Technol Coating 12, 25-31, 2015 | 26 | 2015 |
| Good practices for XPS (and other types of) peak fitting B Singh, R Hesse, MR Linford Vac Technol Coating 12, 25-31, 2015 | 26 | 2015 |
| The equivalent width as a figure of merit for XPS narrow scans B Singh, D Velázquez, J Terry, MR Linford Journal of Electron Spectroscopy and Related Phenomena 197, 56-63, 2014 | 17 | 2014 |
| Comparison of the equivalent width, the autocorrelation width, and the variance as figures of merit for XPS narrow scans B Singh, D Velázquez, J Terry, MR Linford Journal of Electron Spectroscopy and Related Phenomena 197, 112-117, 2014 | 16 | 2014 |
| Multi-instrument characterization of five nanodiamond samples: a thorough example of nanomaterial characterization B Singh, SJ Smith, DS Jensen, HF Jones, AE Dadson, PB Farnsworth, ... Analytical and bioanalytical chemistry 408 (4), 1107-1124, 2016 | 15 | 2016 |
| Good Practices for XPS Peak Fitting, II B Singh, A Herrera-Gomez, J Terry, MR Linford Vacuum Technology & Coating, 2016 | 7 | 2016 |
| Multi‐instrument characterization of poly (divinylbenzene) microspheres for use in liquid chromatography: as received, air oxidized, carbonized, and acid treated CH Hung, B Singh, MG Landowski, M Ibrahim, AJ Miles, DS Jensen, ... Surface and Interface Analysis 47 (8), 815-823, 2015 | 5 | 2015 |
| Hydroxylation of the silica in microfabricated thin layer chromatography plates as probed by time‐of‐flight secondary ion mass spectrometry and diffuse reflectance infrared … SS Kanyal, B Singh, CV Cushman, DT Jankowski, MR Linford Surface and Interface Analysis 47 (3), 340-344, 2015 | 4 | 2015 |
| Layer‐by‐layer deposition of nitrilotris (methylene) triphosphonic acid and Zr (IV): an XPS, ToF‐SIMS, ellipsometry, and AFM study A Diwan, B Singh, CJ Hurley, MR Linford Surface and Interface Analysis 48 (2), 105-110, 2016 | 3 | 2016 |
| Probing the Retention Mechanism of the Flare Mixed-Mode Column at Low pH via Acidic Herbicides with Different pKa Values B Singh, DS Jensen, AJ Miles, AE Dadson, MR Linford Diamond Analytics: Orem, UT, 2013 | 2 | 2013 |
| Materials Study of Nanoscale Fuses for Solid State Data Storage AC Pearson, B Singh, MR Linford, B Lunt, R Davis International Symposium on Optical Memory, 2012 | 1 | 2012 |
| Solid Phase Coatings for Microextraction MR Linford, A Diwan, B Singh US Patent App. 15/908,151, 2018 | | 2018 |
| Solid phase coatings for microextraction MR Linford, A Diwan, B Singh US Patent 9,939,351, 2018 | | 2018 |
| New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal … MR Linford, B Singh, D Velázquez, J Terry, JD Bagley, DH Tolley, ... Microscopy and Microanalysis 22 (S3), 344-345, 2016 | | 2016 |
| Advanced data analysis tools and multi-instrument material characterization B Singh Brigham Young University, 2015 | | 2015 |
| Porous, High Capacity Coatings for Solid Phase Microextraction (SPME) by Sputtering A Diwan, B Singh, T Roychowdhury, DD Yan, L Tedone, PN Nesterenko, ... | | |
