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Vadim Migunov
Vadim Migunov
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg
Verified email at fz-juelich.de - Homepage
Title
Cited by
Cited by
Year
Experimental and Theoretical Understanding of Nitrogen-Doping-Induced Strong Metal–Support Interactions in Pd/TiO2 Catalysts for Nitrobenzene Hydrogenation
P Chen, A Khetan, F Yang, V Migunov, P Weide, SP Stürmer, P Guo, ...
ACS Catalysis 7 (2), 1197-1206, 2017
1572017
Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
F de la Peña, T Ostasevicius, VT Fauske, P Burdet, P Jokubauskas, ...
Microscopy and Microanalysis 23 (S1), 214-215, 2017
962017
Rapid low dose electron tomography using a direct electron detection camera
V Migunov, H Ryll, X Zhuge, M Simson, L Strüder, KJ Batenburg, ...
Scientific reports 5, 14516, 2015
942015
hyperspy/hyperspy: HyperSpy 1.3
F De La Peña, T Ostasevicius, V Tonaas Fauske, P Burdet, ...
Zenodo, 2017
682017
Atomic-scale quantification of charge densities in two-dimensional materials
K Müller-Caspary, M Duchamp, M Rösner, V Migunov, F Winkler, H Yang, ...
Physical Review B 98 (12), 121408, 2018
512018
LiberTEM: Software platform for scalable multidimensional data processing in transmission electron microscopy
A Clausen, D Weber, K Ruzaeva, V Migunov, A Baburajan, A Bahuleyan, ...
Journal of Open Source Software 5 (50), 2006, 2020
392020
hyperspy/hyperspy: Release v1. 6.5
F De La Peña, E Prestat, V Tonaas Fauske, P Burdet, J Lähnemann, ...
Zenodo, 2021
372021
Model-independent measurement of the charge density distribution along an Fe atom probe needle using off-axis electron holography without mean inner potential effects
V Migunov, A London, M Farle, RE Dunin-Borkowski
Journal of applied physics 117 (13), 134301, 2015
352015
Planar-defect characteristics and cross-sections of< 001>,< 111>, and< 112> InAs nanowires
ZA Li, C Möller, V Migunov, M Spasova, M Farle, A Lysov, C Gutsche, ...
Journal of Applied Physics 109 (11), 2011
322011
Automated discrete electron tomography–Towards routine high-fidelity reconstruction of nanomaterials
X Zhuge, H Jinnai, RE Dunin-Borkowski, V Migunov, S Bals, P Cool, ...
Ultramicroscopy 175, 87-96, 2017
302017
Fabrication and characterization of a focused ion beam milled lanthanum hexaboride based cold field electron emitter source
G Singh, R Bücker, G Kassier, M Barthelmess, F Zheng, V Migunov, ...
Applied Physics Letters 113 (9), 2018
282018
hyperspy/hyperspy: Release v1. 7.3
F De La Peña, E Prestat, V Tonaas Fauske, P Burdet, J Lähnemann, ...
Zenodo, 2022
262022
Tunable caustic phenomena in electron wavefields
AH Tavabi, V Migunov, C Dwyer, RE Dunin-Borkowski, G Pozzi
Ultramicroscopy 157, 57-64, 2015
252015
Operando Transmission Electron Microscopy Study of All-Solid-State Battery Interface: Redistribution of Lithium among Interconnected Particles
S Basak, V Migunov, AH Tavabi, C George, Q Lee, P Rosi, V Arszelewska, ...
ACS applied energy materials 3 (6), 5101-5106, 2020
182020
Tunable Ampere phase plate for low dose imaging of biomolecular complexes
AH Tavabi, M Beleggia, V Migunov, A Savenko, O Öktem, ...
Scientific reports 8 (1), 5592, 2018
182018
Prospects for quantitative and time-resolved double and continuous exposure off-axis electron holography
V Migunov, C Dwyer, CB Boothroyd, G Pozzi, RE Dunin-Borkowski
Ultramicroscopy 178, 48-61, 2017
182017
Enhancement of magneto-optical response in nanocomposite-hydrogenated amorphous silicon multilayers
EA Gan’shina, NS Perov, S Phonghirun, VE Migunov, YE Kalinin, ...
Bulletin of the Russian Academy of Sciences: Physics 72, 1379-1381, 2008
162008
Measurement of charge density in nanoscale materials using off-axis electron holography
F Zheng, J Caron, V Migunov, M Beleggia, G Pozzi, RE Dunin-Borkowski
Journal of electron spectroscopy and related phenomena 241, 146881, 2020
132020
In situ transmission electron microscopy of resistive switching in thin silicon oxide layers
M Duchamp, V Migunov, AH Tavabi, A Mehonic, M Buckwell, M Munde, ...
Resolution and Discovery 1 (1), 27-33, 2016
132016
Quantitative measurement of charge accumulation along a quasi-one-dimensional W 5 O 14 nanowire during electron field emission
F Zheng, G Pozzi, V Migunov, L Pirker, M Remškar, M Beleggia, ...
Nanoscale 12 (19), 10559-10564, 2020
102020
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Articles 1–20