| From IC debug to hardware security risk: The power of backside access and optical interaction C Boit, S Tajik, P Scholz, E Amini, A Beyreuther, H Lohrke, JP Seifert 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis …, 2016 | 36 | 2016 |
| Contactless Visible Light Probing for Nanoscale ICs through 10 μm Bulk Silicon C Boit, H Lohrke, P Scholz, A Beyreuther, U Kerst, Y Iwaki 35th Annual NANO Testing Symposium (NANOTS2015), 215-221, 2015 | 24 | 2015 |
| Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL H Lohrke, P Scholz, A Beyreuther, U Ganesh, E Uhlmann, S Kühne, ... 42nd International Symposium for Testing and Failure Analysis (November 6-10 …, 2016 | 23 | 2016 |
| A 3.1-dBm E-Band Truly Balanced Frequency Quadrupler in 22-nm FDSOI CMOS S Vehring, Y Ding, P Scholz, F Gerfers IEEE Microwave and Wireless Components Letters 30 (12), 1165-1168, 2020 | 16 | 2020 |
| Non-Linear PAM-4 VCSEL Equalization and 22 nm SOI CMOS DAC for 112 Gbit/s Data Transmission U Hecht, N Ledentsov, P Scholz, M Agustin, P Schulz, NN Ledentsov, ... 2019 12th German Microwave Conference (GeMiC), 115-118, 2019 | 15 | 2019 |
| 120Gbit/s multi-mode fiber transmission realized with feed forward equalization using 28GHz 850nm VCSELs U Hecht, N Ledentsov, L Chorchos, P Scholz, P Schulz, JP Turkiewicz, ... 45th European Conference on Optical Communication (ECOC 2019), 1-4, 2019 | 13 | 2019 |
| A 3 GS/s> 55 dBFS SNDR Time-Interleaved RF Track and Hold Amplifier with> 67 dBc SFDR up to 3 GHz in 22FDX E Wittenhagen, P Artz, P Scholz, F Gerfers 2021 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 139-142, 2021 | 11 | 2021 |
| A 44fs RMS Jitter 6GHz Limiting Amplifier in 22nm CMOS FDSOI M Runge, P Scholz, F Gerfers 2019 12th German Microwave Conference (GeMiC), 111-114, 2019 | 10 | 2019 |
| Creation of solid immersion lenses in bulk silicon using focused ion beam backside editing techniques P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist 34th International Symposium for Testing and Failure Analysis, ASM …, 2008 | 10 | 2008 |
| Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic H Lohrke, P Scholz, C Boit, S Tajik, JP Seifert 42nd International Symposium for Testing and Failure Analysis, ASM International, 2016 | 9 | 2016 |
| A Fully-Differential 146.6-157.4 GHz LNA Utilizing Back Gate Control to Adjust Gain in 22 nm FDSOI PJ Artz, P Scholz, T Mausolf, F Gerfers 2022 IEEE/MTT-S International Microwave Symposium-IMS 2022, 611-614, 2022 | 8 | 2022 |
| A 0.02-mm2 9-bit 100-MS/s Charge-Injection Cell Based SAR-ADC in 65-nm LP CMOS M Runge, D Schmeck, P Scholz, G Boeck, F Gerfers ESSCIRC 2018-IEEE 44th European Solid State Circuits Conference (ESSCIRC), 26-29, 2018 | 8 | 2018 |
| A low-phase noise 12 GHz digitally controlled oscillator in 65 nm CMOS for a FMCW radar frequency synthesizer D Maurath, AR Tavakoli, S Vehring, P Scholz, Y Ding, G Boeck, F Gerfers 2017 12th European Microwave Integrated Circuits Conference (EuMIC), 232-235, 2017 | 8 | 2017 |
| Visible light techniques in the FinFET era: Challenges, threats and opportunities H Lohrke, H Zöllner, P Scholz, S Tajik, C Boit, JP Seifert 2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017 | 8 | 2017 |
| A trimmable 24 GHz low-noise amplifier with 20 dB gain and 3.7 dB noise figure in 65 nm bulk CMOS S Vehring, Y Ding, P Scholz, D Maurath, SE Barbin, P Gerfers, G Boeck 2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference …, 2017 | 7 | 2017 |
| Single image spectral electroluminescence (photon emission) of GaN HEMTs P Scholz, A Glowacki, U Kerst, C Boit, P Ivo, R Lossy, HJ Würfl, ... 2013 IEEE International Reliability Physics Symposium (IRPS), CD. 3.1-CD. 3.7, 2013 | 7 | 2013 |
| Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments P Scholz, C Gallrapp, U Kerst, T Lundquist, C Boit Microelectronics Reliability 50 (9-11), 1441-1445, 2010 | 7 | 2010 |
| A versatile design of solid immersion lenses in bulk silicon using focused ion beam techniques P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist 35th International Symposium for Testing and Failure Analysis, ASM …, 2009 | 7 | 2009 |
| A 9-bit, 45 mW, 0.05 mm2 Source-Series-Terminated DAC Driver With Echo Canceller in 22-nm CMOS for In-Vehicle Communication H Ghafarian, S Shivapakash, S Mortazavi, P Scholz, N Lotfi, F Gerfers IEEE Solid-State Circuits Letters 4, 10-13, 2021 | 5 | 2021 |
| Turning sample into (re)solution: Focused Ion Beam shaped Solid Immersion Lenses P Scholz, M Sadowski, S Kupijai, M Henniges, C Theiss, S Meister, ... 41st International Symposium for Testing and Failure Analysis (ISTFA …, 2015 | 5 | 2015 |
