Philipp Scholz
Philipp Scholz
Technische Universität Berlin - Department of Computer Engineering and Microelectronic
Bestätigte E-Mail-Adresse bei tu-berlin.de - Startseite
Titel
Zitiert von
Zitiert von
Jahr
From IC debug to hardware security risk: The power of backside access and optical interaction
C Boit, S Tajik, P Scholz, E Amini, A Beyreuther, H Lohrke, JP Seifert
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis …, 2016
202016
Contactless Visible Light Probing for Nanoscale ICs through 10 μm Bulk Silicon
C Boit, H Lohrke, P Scholz, A Beyreuther, U Kerst, Y Iwaki
35th Annual NANO Testing Symposium (NANOTS2015), 215-221, 2015
152015
Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL
H Lohrke, P Scholz, A Beyreuther, U Ganesh, E Uhlmann, S Kühne, ...
42nd International Symposium for Testing and Failure Analysis (November 6-10 …, 2016
112016
Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic
H Lohrke, P Scholz, C Boit, S Tajik, JP Seifert
42nd International Symposium for Testing and Failure Analysis, ASM International, 2016
82016
Creation of solid immersion lenses in bulk silicon using focused ion beam backside editing techniques
P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist
34th International Symposium for Testing and Failure Analysis, ASM …, 2008
82008
A versatile design of solid immersion lenses in bulk silicon using focused ion beam techniques
P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist
35th International Symposium for Testing and Failure Analysis, ASM …, 2009
72009
A 44fs RMS Jitter 6GHz Limiting Amplifier in 22nm CMOS FDSOI
M Runge, P Scholz, F Gerfers
2019 12th German Microwave Conference (GeMiC), 111-114, 2019
62019
Single image spectral electroluminescence (photon emission) of GaN HEMTs
P Scholz, A Glowacki, U Kerst, C Boit, P Ivo, R Lossy, HJ Würfl, ...
2013 IEEE International Reliability Physics Symposium (IRPS), CD. 3.1-CD. 3.7, 2013
62013
120Gbit/s multi-mode fiber transmission realized with feed forward equalization using 28GHz 850nm VCSELs
U Hecht, N Ledentsov, L Chorchos, P Scholz, P Schulz, JP Turkiewicz, ...
45th European Conference on Optical Communication (ECOC 2019), 1-4, 2019
52019
A low-phase noise 12 GHz digitally controlled oscillator in 65 nm CMOS for a FMCW radar frequency synthesizer
D Maurath, AR Tavakoli, S Vehring, P Scholz, Y Ding, G Boeck, F Gerfers
2017 12th European Microwave Integrated Circuits Conference (EuMIC), 232-235, 2017
52017
Visible light techniques in the FinFET era: Challenges, threats and opportunities
H Lohrke, H Zöllner, P Scholz, S Tajik, C Boit, JP Seifert
2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017
52017
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments
P Scholz, C Gallrapp, U Kerst, T Lundquist, C Boit
Microelectronics Reliability 50 (9-11), 1441-1445, 2010
52010
Turning sample into (re)solution: Focused Ion Beam shaped Solid Immersion Lenses
P Scholz, M Sadowski, S Kupijai, M Henniges, C Theiss, S Meister, ...
41st International Symposium for Testing and Failure Analysis (ISTFA …, 2015
42015
Non-Linear PAM-4 VCSEL Equalization and 22 nm SOI CMOS DAC for 112 Gbit/s Data Transmission
U Hecht, N Ledentsov, P Scholz, M Agustin, P Schulz, NN Ledentsov, ...
2019 12th German Microwave Conference (GeMiC), 115-118, 2019
32019
A 0.02-mm2 9-bit 100-MS/s Charge-Injection Cell Based SAR-ADC in 65-nm LP CMOS
M Runge, D Schmeck, P Scholz, G Boeck, F Gerfers
ESSCIRC 2018-IEEE 44th European Solid State Circuits Conference (ESSCIRC), 26-29, 2018
32018
A trimmable 24 GHz low-noise amplifier with 20 dB gain and 3.7 dB noise figure in 65 nm bulk CMOS
S Vehring, Y Ding, P Scholz, D Maurath, SE Barbin, P Gerfers, G Boeck
2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference …, 2017
32017
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials–An adaptive calibration algorithm
P Scholz, N Herfurth, M Sadowski, T Lundquist, U Kerst, C Boit
Microelectronics Reliability 54 (9-11), 1794-1797, 2014
32014
Instant solid immersion lens creation in silicon with a focused ion beam - Comparing refractive and diffractive methods
P Scholz, U Kerst, T Kujawa, T Lundquist, C Boit
37th International Symposium for Testing and Failure Analysis (ISTFA 2011 …, 2011
32011
A 3.1-dBm E-Band Truly Balanced Frequency Quadrupler in 22-nm FDSOI CMOS
S Vehring, Y Ding, P Scholz, F Gerfers
IEEE Microwave and Wireless Components Letters 30 (12), 1165-1168, 2020
22020
IC Debug and Fault Isolation for an Age of IoE and High Data Rates—A Vision
C Boit, P Scholz
IEEE Transactions on Components, Packaging and Manufacturing Technology 8 (5 …, 2018
12018
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