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Philipp Scholz
Philipp Scholz
Technische Universität Berlin - Department of Computer Engineering and Microelectronic
Verified email at tu-berlin.de - Homepage
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From IC debug to hardware security risk: The power of backside access and optical interaction
C Boit, S Tajik, P Scholz, E Amini, A Beyreuther, H Lohrke, JP Seifert
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis …, 2016
302016
Contactless Visible Light Probing for Nanoscale ICs through 10 μm Bulk Silicon
C Boit, H Lohrke, P Scholz, A Beyreuther, U Kerst, Y Iwaki
35th Annual NANO Testing Symposium (NANOTS2015), 215-221, 2015
202015
Contactless Fault Isolation for FinFET Technologies with Visible Light and GaP SIL
H Lohrke, P Scholz, A Beyreuther, U Ganesh, E Uhlmann, S Kühne, ...
42nd International Symposium for Testing and Failure Analysis (November 6-10 …, 2016
152016
120Gbit/s multi-mode fiber transmission realized with feed forward equalization using 28GHz 850nm VCSELs
U Hecht, N Ledentsov, L Chorchos, P Scholz, P Schulz, JP Turkiewicz, ...
45th European Conference on Optical Communication (ECOC 2019), 1-4, 2019
112019
Creation of solid immersion lenses in bulk silicon using focused ion beam backside editing techniques
P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist
34th International Symposium for Testing and Failure Analysis, ASM …, 2008
92008
A low-phase noise 12 GHz digitally controlled oscillator in 65 nm CMOS for a FMCW radar frequency synthesizer
D Maurath, AR Tavakoli, S Vehring, P Scholz, Y Ding, G Boeck, F Gerfers
2017 12th European Microwave Integrated Circuits Conference (EuMIC), 232-235, 2017
82017
Automated Detection of Fault Sensitive Locations for Reconfiguration Attacks on Programmable Logic
H Lohrke, P Scholz, C Boit, S Tajik, JP Seifert
42nd International Symposium for Testing and Failure Analysis, ASM International, 2016
82016
A 44fs RMS Jitter 6GHz Limiting Amplifier in 22nm CMOS FDSOI
M Runge, P Scholz, F Gerfers
2019 12th German Microwave Conference (GeMiC), 111-114, 2019
72019
Single image spectral electroluminescence (photon emission) of GaN HEMTs
P Scholz, A Glowacki, U Kerst, C Boit, P Ivo, R Lossy, HJ Würfl, ...
2013 IEEE International Reliability Physics Symposium (IRPS), CD. 3.1-CD. 3.7, 2013
72013
A versatile design of solid immersion lenses in bulk silicon using focused ion beam techniques
P Scholz, U Kerst, C Boit, CC Tsao, T Lundquist
35th International Symposium for Testing and Failure Analysis, ASM …, 2009
72009
Non-Linear PAM-4 VCSEL Equalization and 22 nm SOI CMOS DAC for 112 Gbit/s Data Transmission
U Hecht, N Ledentsov, P Scholz, M Agustin, P Schulz, NN Ledentsov, ...
2019 12th German Microwave Conference (GeMiC), 115-118, 2019
62019
A 0.02-mm2 9-bit 100-MS/s Charge-Injection Cell Based SAR-ADC in 65-nm LP CMOS
M Runge, D Schmeck, P Scholz, G Boeck, F Gerfers
ESSCIRC 2018-IEEE 44th European Solid State Circuits Conference (ESSCIRC), 26-29, 2018
62018
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments
P Scholz, C Gallrapp, U Kerst, T Lundquist, C Boit
Microelectronics Reliability 50 (9-11), 1441-1445, 2010
62010
A 3.1-dBm E-Band Truly Balanced Frequency Quadrupler in 22-nm FDSOI CMOS
S Vehring, Y Ding, P Scholz, F Gerfers
IEEE Microwave and Wireless Components Letters 30 (12), 1165-1168, 2020
52020
Visible light techniques in the FinFET era: Challenges, threats and opportunities
H Lohrke, H Zöllner, P Scholz, S Tajik, C Boit, JP Seifert
2017 IEEE 24th International Symposium on the Physical and Failure Analysis …, 2017
52017
Turning sample into (re)solution: Focused Ion Beam shaped Solid Immersion Lenses
P Scholz, M Sadowski, S Kupijai, M Henniges, C Theiss, S Meister, ...
41st International Symposium for Testing and Failure Analysis (ISTFA …, 2015
52015
A trimmable 24 GHz low-noise amplifier with 20 dB gain and 3.7 dB noise figure in 65 nm bulk CMOS
S Vehring, Y Ding, P Scholz, D Maurath, SE Barbin, P Gerfers, G Boeck
2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference …, 2017
42017
Instant solid immersion lens creation in silicon with a focused ion beam - Comparing refractive and diffractive methods
P Scholz, U Kerst, T Kujawa, T Lundquist, C Boit
37th International Symposium for Testing and Failure Analysis (ISTFA 2011 …, 2011
42011
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials–An adaptive calibration algorithm
P Scholz, N Herfurth, M Sadowski, T Lundquist, U Kerst, C Boit
Microelectronics Reliability 54 (9-11), 1794-1797, 2014
32014
NRZ, DB, and DMT performance for short-reach VCSEL-based optical interconnects
L Chorchos, N Ledentsov Jr, O Makarov, P Scholz, U Hecht, C Kottke, ...
Optical Interconnects XXI 11692, 56-63, 2021
22021
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