Mojtaba Ebrahimi
Mojtaba Ebrahimi
Functional Safety Engineer, Robert Bosch GmbH
Verified email at bosch.com
Title
Cited by
Cited by
Year
Evaluation of hybrid memory technologies using SOT-MRAM for on-chip cache hierarchy
F Oboril, R Bishnoi, M Ebrahimi, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
962015
Ultra-fast and high-reliability SOT-MRAM: From cache replacement to normally-off computing
G Prenat, K Jabeur, P Vanhauwaert, G Di Pendina, F Oboril, R Bishnoi, ...
IEEE Transactions on Multi-Scale Computing Systems 2 (1), 49-60, 2016
792016
Read disturb fault detection in STT-MRAM
R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori
2014 International Test Conference, 1-7, 2014
582014
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales
M Ebrahimi, A Evans, MB Tahoori, R Seyyedi, E Costenaro, ...
Proceedings of the conference on Design, Automation & Test in Europe, 30, 2014
532014
Aging-aware logic synthesis
M Ebrahimi, F Oboril, S Kiamehr, MB Tahoori
Proceedings of the International Conference on Computer-Aided Design, 61-68, 2013
532013
SCFIT: A FPGA-based fault injection technique for SEU fault model
A Mohammadi, M Ebrahimi, A Ejlali, SG Miremadi
Proceedings of the Conference on Design, Automation and Test in Europe, 586-589, 2012
522012
Avoiding unnecessary write operations in STT-MRAM for low power implementation
R Bishnoi, F Oboril, M Ebrahimi, MB Tahoori
Fifteenth International Symposium on Quality Electronic Design, 548-553, 2014
512014
CEP: correlated error propagation for hierarchical soft error analysis
L Chen, M Ebrahimi, MB Tahoori
Journal of Electronic Testing 29 (2), 143-158, 2013
512013
Comprehensive analysis of sequential and combinational soft errors in an embedded processor
M Ebrahimi, A Evans, MB Tahoori, E Costenaro, D Alexandrescu, ...
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2015
492015
A layout-based approach for multiple event transient analysis
M Ebrahimi, H Asadi, MB Tahoori
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2013
482013
A fast, flexible, and easy-to-develop fpga-based fault injection technique
M Ebrahimi, A Mohammadi, A Ejlali, SG Miremadi
Microelectronics Reliability 54 (5), 1000-1008, 2014
452014
Architectural aspects in design and analysis of SOT-based memories
R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC), 700-707, 2014
392014
Aging mitigation in memory arrays using self-controlled bit-flipping technique
A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ...
The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015
362015
Class: Combined logic and architectural soft error sensitivity analysis
M Ebrahimi, L Chen, H Asadi, MB Tahoori
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 601-607, 2013
352013
Layout-based modeling and mitigation of multiple event transients
M Ebrahimi, H Asadi, R Bishnoi, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
342016
Protecting SRAM-based FPGAs against multiple bit upsets using erasure codes
PMB Rao, M Ebrahimi, R Seyyedi, MB Tahoori
2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2014
332014
Asynchronous asymmetrical write termination (AAWT) for a low power STT-MRAM
R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori
Proceedings of the conference on Design, Automation & Test in Europe, 180, 2014
332014
Improving write performance for STT-MRAM
R Bishnoi, M Ebrahimi, F Oboril, MB Tahoori
IEEE Transactions on Magnetics 52 (8), 1-11, 2016
322016
Low-cost scan-chain-based technique to recover multiple errors in TMR systems
M Ebrahimi, SG Miremadi, H Asadi, M Fazeli
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (8 …, 2013
282013
Low-Cost Multiple Bit Upset Correction in SRAM-Based FPGA Configuration Frames
M Ebrahimi, PMB Rao, R Seyyedi, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (3), 932-943, 2016
272016
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