Folgen
Atthawut Chanthaphan
Atthawut Chanthaphan
Bestätigte E-Mail-Adresse bei asf.mls.eng.osaka-u.ac.jp - Startseite
Titel
Zitiert von
Zitiert von
Jahr
Synchrotron x-ray photoelectron spectroscopy study on thermally grown SiO2/4H-SiC (0001) interface and its correlation with electrical properties
H Watanabe, T Hosoi, T Kirino, Y Kagei, Y Uenishi, A Chanthaphan, ...
Applied Physics Letters 99 (2), 2011
1512011
Investigation of unusual mobile ion effects in thermally grown SiO2 on 4H-SiC (0001) at high temperatures
A Chanthaphan, T Hosoi, S Mitani, Y Nakano, T Nakamura, T Shimura, ...
Applied Physics Letters 100 (25), 2012
542012
Study of SiO2/4H-SiC interface nitridation by post-oxidation annealing in pure nitrogen gas
TSHW Atthawut Chanthaphan, Takuji Hosoi
AIP Advance 5 (9), 097134, 2015
482015
Understanding and controlling bias-temperature instability in SiC metal-oxide-semiconductor devices induced by unusual generation of mobile ions
A Chanthaphan, T Hosoi, Y Nakano, T Nakamura, T Shimura, ...
Applied Physics Letters 102 (9), 2013
302013
Improved bias-temperature instability characteristics in SiC metal-oxide-semiconductor devices with aluminum oxynitride dielectrics
A Chanthaphan, T Hosoi, Y Nakano, T Nakamura, T Shimura, ...
Applied Physics Letters 104 (12), 2014
192014
Enhancing biological relevance of a weighted gene co-expression network for functional module identification
S Prom-On, A Chanthaphan, JH Chan, A Meechai
Journal of Bioinformatics and Computational Biology 9 (01), 111-129, 2011
162011
Insight into metal-enhanced oxidation using barium on 4H-SiC surfaces
A Chanthaphan, Y Katsu, T Hosoi, T Shimura, H Watanabe
Japanese Journal of Applied Physics 55 (12), 120303, 2016
142016
Impact of Interface Defect Passivation on Conduction Band Offset at SiO2/4H-SiC Interface
T Hosoi, T Kirino, A Chanthaphan, Y Uenishi, D Ikeguchi, A Yoshigoe, ...
Materials Science Forum 717, 721-724, 2012
102012
Impact of stacked AlON/SiO2 gate dielectrics for SiC power devices
H Watanabe, T Kirino, Y Uenishi, A Chanthaphan, A Yoshigoe, Y Teraoka, ...
ECS Transactions 35 (2), 265, 2011
102011
Structure and Surface Morphology of Thermal SiO2 Grown on 4H-SiC by Metal-Enhanced Oxidation Using Barium
A Chanthaphan, Y Katsu, T Hosoi, T Shimura, H Watanabe
Materials Science Forum 897, 340-343, 2017
82017
Cathodoluminescence study of radiative interface defects in thermally grown SiO2/4H-SiC (0001) structures
Y Fukushima, A Chanthaphan, T Hosoi, T Shimura, H Watanabe
Applied Physics Letters 106 (26), 2015
72015
Materials Science Forum
H Watanabe, T Hosoi, T Kirino, Y Uenishi, A Chanthaphan, A Yoshigoe, ...
Trans Tech Publications Ltd, 697-702, 2012
62012
Gate stack technologies for SiC power MOSFETs
H Watanabe, T Hosoi, T Kirino, Y Uenishi, A Chanthaphan, D Ikeguchi, ...
ECS Transactions 41 (3), 77, 2011
52011
Improvement of SiO2/4H-SiC Interface Quality by Post-Oxidation Annealing in N2 at High-Temperatures
A Chanthaphan, YH Cheng, T Hosoi, T Shimura, H Watanabe
Materials Science Forum 858, 627-630, 2016
32016
Study on Bias-temperature Instability in 4H-SiC Metal-oxide-semiconductor Devices
A Chanthaphan
32014
Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC (0001) Si-face and (000-1) C-face Substrates
H Watanabe, T Hosoi, T Kirino, Y Uenishi, A Chanthaphan, A Yoshigoe, ...
Materials Science Forum 717, 697-702, 2012
32012
Degradation of SiO2/SiC Interface Properties due to Mobile Ions Intrinsically Generated by High-Temperature Hydrogen Annealing
A Chanthaphan, T Hosoi, Y Nakano, T Nakamura, T Shimura, ...
Materials Science Forum 778, 541-544, 2014
22014
Identifying Functional Modules Using MST-Based Weighted Gene Co-Expression Networks
A Chanthaphan, S Prom-on, A Meechai, J Chan
2009 Ninth IEEE International Conference on Bioinformatics and …, 2009
22009
Improvement of physical and electrical properties in SiC-MOS devices using deposited insulators on barium-enhanced thermal oxides
A Chanthaphan, T Hosoi, T Shimura, H Watanabe
JSAP Annual Meetings Extended Abstracts The 77th JSAP Autumn Meeting 2016 …, 2016
2016
Cathodoluminescence Study of SiO2/4H-SiC Structures Treated with High-Temperature Post-Oxidation Annealing
A Chanthaphan, Y Fukushima, K Yamamoto, M Aketa, H Asahara, ...
Materials Science Forum 858, 445-448, 2016
2016
Das System kann den Vorgang jetzt nicht ausführen. Versuchen Sie es später erneut.
Artikel 1–20