| Open-set recognition using intra-class splitting P Schlachter, Y Liao, B Yang 2019 27th European signal processing conference (EUSIPCO), 1-5, 2019 | 34 | 2019 |
| Deep one-class classification using intra-class splitting P Schlachter, Y Liao, B Yang 2019 IEEE data science workshop (DSW), 100-104, 2019 | 33 | 2019 |
| Unsupervised image segmentation using convolutional autoencoder with total variation regularization as preprocessing C Wang, B Yang, Y Liao 2017 IEEE International Conference on Acoustics, Speech and Signal …, 2017 | 27 | 2017 |
| Feature selection using batch-wise attenuation and feature mask normalization Y Liao, R Latty, B Yang 2021 International Joint Conference on Neural Networks (IJCNN), 1-9, 2021 | 19 | 2021 |
| Anomaly detection based on selection and weighting in latent space Y Liao, A Bartler, B Yang 2021 IEEE 17th International Conference on Automation Science and …, 2021 | 12 | 2021 |
| Deep open set recognition using dynamic intra-class splitting P Schlachter, Y Liao, B Yang SN Computer Science 1, 1-12, 2020 | 12 | 2020 |
| A learning-aided generic framework for fault detection and recovery of inertial sensors in automated driving systems Y Liao, E Hashemi, T Wang, B Yang IEEE Systems Journal 15 (2), 3001-3011, 2020 | 9 | 2020 |
| Unsupervised fault detection and recovery for intelligent robotic rollators Y Liao, A Yeaser, B Yang, J Tung, E Hashemi Robotics and Autonomous Systems 146, 103876, 2021 | 8 | 2021 |
| One-class feature learning using intra-class splitting P Schlachter, Y Liao, B Yang 2019 27th European Signal Processing Conference (EUSIPCO), 1-5, 2019 | 8 | 2019 |
| Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
| Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information Y Liao, R Latty, PR Genssler, H Amrouch, B Yang 2022 IEEE International Test Conference (ITC), 1-9, 2022 | 4 | 2022 |
| Efficient and robust resistive open defect detection based on unsupervised deep learning Y Liao, ZP Najafi-Haghi, HJ Wunderlich, B Yang 2022 IEEE International Test Conference (ITC), 185-193, 2022 | 3 | 2022 |
| To generalize or not to generalize: Towards autoencoders in one-class classification Y Liao, B Yang 2022 International Joint Conference on Neural Networks (IJCNN), 1-8, 2022 | 3 | 2022 |
| A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning Y Liao, B Yang, R Latty, J Rivoir arXiv preprint arXiv:2207.00336, 2022 | 1 | 2022 |
| Conditional Variable Selection for Intelligent Test Y Liao, T Ge, R Latty, B Yang arXiv preprint arXiv:2207.00335, 2022 | 1 | 2022 |
| Experts in the Loop: Conditional Variable Selection Based on Deep Learning for Accelerating Post-Silicon Validation Y Liao, R Latty, B Yang IEEE Transactions on Semiconductor Manufacturing, 2024 | | 2024 |
| Experts in the Loop: Conditional Variable Selection for Accelerating Post-Silicon Analysis Based on Deep Learning Y Liao, R Latty, B Yang arXiv preprint arXiv:2209.15249, 2022 | | 2022 |
| Deep Feature Selection Using a Novel Complementary Feature Mask Y Liao, J Rivoir, R Latty, B Yang arXiv preprint arXiv:2209.12282, 2022 | | 2022 |
