| Covalent functionalization and passivation of exfoliated black phosphorus via aryl diazonium chemistry CR Ryder, JD Wood, SA Wells, Y Yang, D Jariwala, TJ Marks, GC Schatz, ... Nature Chemistry, 2016 | 775 | 2016 |
| Anisotropic Thermal Conductivity of Exfoliated Black Phosphorus H Jang, JD Wood, CR Ryder, MC Hersam, DG Cahill Advanced Materials 27 (48), 8017-8022, 2015 | 270 | 2015 |
| Chemically Tailoring Semiconducting Two-Dimensional Transition Metal Dichalcogenides and Black Phosphorus CR Ryder, JD Wood, SA Wells, MC Hersam ACS nano 10 (4), 3900-3917, 2016 | 269 | 2016 |
| Stable aqueous dispersions of optically and electronically active phosphorene J Kang, SA Wells, JD Wood, JH Lee, X Liu, CR Ryder, J Zhu, JR Guest, ... Proceedings of the National Academy of Sciences 113 (42), 11688-11693, 2016 | 244 | 2016 |
| Probing Out-of-Plane Charge Transport in Black Phosphorus with Graphene-Contacted Vertical Field-Effect Transistors J Kang, D Jariwala, CR Ryder, SA Wells, Y Choi, E Hwang, JH Cho, ... Nano letters 16 (4), 2580-2585, 2016 | 137 | 2016 |
| 3D Anisotropic Thermal Conductivity of Exfoliated Rhenium Disulfide H Jang, CR Ryder, JD Wood, MC Hersam, DG Cahill Advanced Materials 29 (35), 2017 | 102 | 2017 |
| Rapid and Large-Area Characterization of Exfoliated Black Phosphorus Using Third-Harmonic Generation Microscopy A Autere, CR Ryder, A Säynätjoki, L Karvonen, B Amirsolaimani, ... The Journal of Physical Chemistry Letters 8 (7), 1343-1350, 2017 | 93 | 2017 |
| Resolving the In‐Plane Anisotropic Properties of Black Phosphorus X Liu, CR Ryder, SA Wells, MC Hersam Small Methods, 2017 | 92 | 2017 |
| Metal oxide nanoparticle growth on graphene via chemical activation with atomic oxygen JE Johns, JMP Alaboson, S Patwardhan, CR Ryder, GC Schatz, ... Journal of the American Chemical Society 135 (48), 18121-18125, 2013 | 38 | 2013 |
| All-Electrical Determination of Crystal Orientation in Anisotropic Two-Dimensional Materials L Peng, SA Wells, CR Ryder, MC Hersam, M Grayson Physical Review Letters 120 (8), 086801, 2018 | 20 | 2018 |
| Reliability Characteristics of a High Density Metal-Insulator-Metal Capacitor on Intel’s 10+ Process CY Lin, UE Avci, MA Blount, R Grover, J Hicks, R Kasim, A Kundu, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020 | 9 | 2020 |
