| Ultraslow growth rates of giant gypsum crystals AES Van Driessche, JM García-Ruíz, K Tsukamoto, LD Patino-Lopez, ... Proceedings of the National Academy of Sciences 108 (38), 15721-15726, 2011 | 85 | 2011 |
| Control of silicate weathering by interface-coupled dissolution-precipitation processes at the mineral-solution interface CRNAP Encarnación Ruiz-Agudo1, Helen E. King, Luis D. Patiño-López ... Geology 44 (7), 2016 | 84 | 2016 |
| A new passive PV heatsink design to reduce efficiency losses: A computational and experimental evaluation JG Hernandez-Perez, JG Carrillo, A Bassam, M Flota-Banuelos, ... Renewable Energy 147, 1209-1220, 2020 | 73 | 2020 |
| Four different approaches for the measurement of IC surface temperature: application to thermal testing J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ... Microelectronics journal 33 (9), 689-696, 2002 | 64 | 2002 |
| Thermal performance of a discontinuous finned heatsink profile for PV passive cooling JG Hernandez-Perez, JG Carrillo, A Bassam, M Flota-Banuelos, ... Applied Thermal Engineering 184, 116238, 2021 | 63 | 2021 |
| A high-throughput multiplexed microfluidic device for COVID-19 serology assays R Rodriguez-Moncayo, DF Cedillo-Alcantar, PE Guevara-Pantoja, ... Lab on a Chip 21 (1), 93-104, 2021 | 57 | 2021 |
| Laser probes for the thermal and thermomechanical characterisation of microelectronic devices W Claeys, S Dilhaire, S Jorez, LD Patiño-Lopez Microelectronics Journal 32 (10-11), 891-898, 2001 | 34 | 2001 |
| Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope LDP Lopez, S Grauby, S Dilhaire, MA Salhi, W Claeys, S Lefèvre, S Volz Microelectronics journal 35 (10), 797-803, 2004 | 28 | 2004 |
| Use of cross-linked poly (ethylene glycol)-based hydrogels for protein crystallization JA Gavira, A Cera-Manjarres, K Ortiz, J Mendez, JA Jimenez-Torres, ... Crystal growth & design 14 (7), 3239-3248, 2014 | 26 | 2014 |
| Precise protein solubility determination by laser confocal differential interference contrast microscopy AES Van Driessche, JA Gavira, LDP Lopez, F Otalora Journal of Crystal Growth 311 (13), 3479-3484, 2009 | 26 | 2009 |
| Laser diode COFD analysis by thermoreflectance microscopy S Dilhaire, S Grauby, S Jorez, LDP Lopez, E Schaub, W Claeys Microelectronics Reliability 41 (9-10), 1597-1601, 2001 | 22 | 2001 |
| Measurement of the thermomechanical strain of electronic devices by shearography S Dilhaire, S Jorez, A Cornet, LDP Lopez, W Claeys Microelectronics Reliability 40 (8-10), 1509-1514, 2000 | 21 | 2000 |
| Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues S Grauby, A Salhi, LDP Lopez, W Claeys, B Charlot, S Dilhaire Microelectronics Reliability 48 (2), 204-211, 2008 | 20 | 2008 |
| Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers Y Ezzahri, LDP Lopez, O Chapuis, S Dilhaire, S Grauby, W Claeys, S Volz Superlattices and Microstructures 38 (1), 69-75, 2005 | 20 | 2005 |
| Determination of ZT of PN thermoelectric couples by AC electrical measurement S Dilhaire, LD Patino-Lopez, S Grauby, JM Rampnoux, S Jorez, W Claeys Twenty-First International Conference on Thermoelectrics, 2002. Proceedings …, 2002 | 17 | 2002 |
| Surface displacement imaging by interferometry with a light emitting diode S Dilhaire, S Grauby, S Jorez, LDP Lopez, JM Rampnoux, W Claeys Applied optics 41 (24), 4996-5001, 2002 | 16 | 2002 |
| Dynamical behavior and cut-off frequency of Si/SiGe microcoolers Y Ezzahri, S Dilhaire, LD Patino-Lopez, S Grauby, W Claeys, Z Bian, ... Superlattices and Microstructures 41 (1), 7-16, 2007 | 15 | 2007 |
| Joule expansion imaging techniques on microlectronic devices S Grauby, LDP Lopez, A Salhi, E Puyoo, JM Rampnoux, W Claeys, ... Microelectronics journal 40 (9), 1367-1372, 2009 | 14 | 2009 |
| Laser diode light efficiency determination by thermoreflectance microscopy S Dilhaire, S Jorez, LD Patiño-Lopez, W Claeys, E Schaub Microelectronics journal 32 (10-11), 899-901, 2001 | 10 | 2001 |
| Calibration procedure of temperature measurements by thermoreflectance upon microelectronic devices E Schaub, S Dlihaire, S Jorez, LDP Lopez, W Claeys International Conference on Photoacoustic and Photothermal Phenomena, Kyoto …, 2000 | 9 | 2000 |
