Physical Mechanisms behind the Field‐Cycling Behavior of HfO2 ‐Based Ferroelectric Capacitors M Pešić, FPG Fengler, L Larcher, A Padovani, T Schenk, ED Grimley, ...
Advanced Functional Materials 26 (25), 4601-4612, 2016
768 2016 Unveiling the double-well energy landscape in a ferroelectric layer M Hoffmann, FPG Fengler, M Herzig, T Mittmann, B Max, U Schroeder, ...
Nature 565 (7740), 464-467, 2019
384 2019 Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: A comparison of model and experiment MH Park, YH Lee, HJ Kim, T Schenk, W Lee, K Do Kim, FPG Fengler, ...
Nanoscale 9 (28), 9973-9986, 2017
338 2017 Lanthanum-doped hafnium oxide: a robust ferroelectric material U Schroeder, C Richter, MH Park, T Schenk, M Pesic, M Hoffmann, ...
Inorganic chemistry 57 (5), 2752-2765, 2018
316 2018 Effect of Zr Content on the Wake-Up Effect in Hf1–x Zrx O2 Films MH Park, HJ Kim, YJ Kim, YH Lee, T Moon, KD Kim, SD Hyun, F Fengler, ...
ACS applied materials & interfaces 8 (24), 15466-15475, 2016
208 2016 Domain pinning: Comparison of hafnia and PZT based ferroelectrics FPG Fengler, M Pešić, S Starschich, T Schneller, C Künneth, U Böttger, ...
Advanced Electronic Materials 3 (4), 1600505, 2017
128 2017 Optimizing process conditions for improved Hf1− xZrxO2 ferroelectric capacitor performance T Mittmann, FPG Fengler, C Richter, MH Park, T Mikolajick, U Schroeder
Microelectronic Engineering 178, 48-51, 2017
104 2017 On the relationship between field cycling and imprint in ferroelectric Hf0. 5Zr0. 5O2 FPG Fengler, M Hoffmann, S Slesazeck, T Mikolajick, U Schroeder
Journal of Applied Physics 123 (20), 2018
100 2018 Analysis of performance instabilities of hafnia‐based ferroelectrics using modulus spectroscopy and thermally stimulated depolarization currents FPG Fengler, R Nigon, P Muralt, ED Grimley, X Sang, V Sessi, ...
Advanced Electronic Materials 4 (3), 1700547, 2018
71 2018 Negative capacitance for electrostatic supercapacitors M Hoffmann, FPG Fengler, B Max, U Schroeder, S Slesazeck, T Mikolajick
Advanced Energy Materials 9 (40), 1901154, 2019
66 2019 Root cause of degradation in novel HfO2 -based ferroelectric memories M Pesic, FPG Fengler, S Slesazeck, U Schroeder, T Mikolajick, L Larcher, ...
2016 IEEE International Reliability Physics Symposium (IRPS), MY-3-1-MY-3-5, 2016
47 2016 A silicon nanowire ferroelectric field‐effect transistor V Sessi, M Simon, H Mulaosmanovic, D Pohl, M Loeffler, T Mauersberger, ...
Advanced Electronic Materials 6 (4), 1901244, 2020
37 2020 Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications FPG Fengler, M Pešić, S Starschich, T Schneller, U Böttger, T Schenk, ...
2016 46th European Solid-State Device Research Conference (ESSDERC), 369-372, 2016
34 2016 Field cycling behavior of ferroelectric HfO2-based capacitors F Fengler, MH Park, T Schenk, M Pešić, U Schroeder
Ferroelectricity in Doped Hafnium Oxide: Materials, Properties and Devices …, 2019
9 2019 Comparative study of ITO and TiN fabricated by low-temperature RF biased sputtering DK Simon, D Tröger, T Schenk, I Dirnstorfer, FPG Fengler, PM Jordan, ...
Journal of Vacuum Science & Technology A 34 (2), 2016
8 2016 2D mapping of chemical and field effect passivation of Al2O3 on silicon substrates PM Jordan, DK Simon, FPG Fengler, T Mikolajick, I Dirnstorfer
Energy Procedia 77, 91-98, 2015
6 2015 Low‐thermal budget flash light annealing for Al2 O3 surface passivation DK Simon, T Henke, PM Jordan, FPG Fengler, T Mikolajick, JW Bartha, ...
physica status solidi (RRL)–Rapid Research Letters 9 (11), 631-635, 2015
5 2015 10 Years Fluorite-type Ferroelectrics–A Survey T Schenk, M Pešić, MH Park, M Hoffmann, H Mulaosmanovic, C Richter, ...
2 2017 Investigation of local and integral polarization switching behavior of ultrathin HfO based films P Buragohain, O Bak, A Chernikova, A Zenkevich, U Schroeder, ...
Bulletin of the American Physical Society 62, 2017
2 2017 Analysis of the Field Cycling Behavior of Ferroelectric Capacitor Structures Based on Hafnia Zirconia Films FPG Fengler
Technische Universität Dresden, 2019
1 2019