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Adam Kubec
Adam Kubec
XRnanotech GmbH
Bestätigte E-Mail-Adresse bei xrnanotech.ch
Titel
Zitiert von
Zitiert von
Jahr
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film
J Keckes, R Daniel, J Todt, J Zalesak, B Sartory, S Braun, J Gluch, ...
Acta materialia 144, 862-873, 2018
562018
Hard X-ray transient grating spectroscopy on bismuth germanate
JR Rouxel, D Fainozzi, R Mankowsky, B Rösner, G Seniutinas, ...
Nature Photonics 15 (7), 499-503, 2021
482021
Full-field X-ray microscopy with crossed partial multilayer Laue lenses
S Niese, P Krüger, A Kubec, S Braun, J Patommel, CG Schroer, A Leson, ...
Optics express 22 (17), 20008-20013, 2014
462014
Pushing the temporal resolution in absorption and Zernike phase contrast nanotomography: enabling fast in situ experiments
S Flenner, M Storm, A Kubec, E Longo, F Döring, DM Pelt, C David, ...
Journal of synchrotron radiation 27 (5), 1339-1346, 2020
372020
Ptychography with multilayer Laue lenses
A Kubec, S Braun, S Niese, P Krüger, J Patommel, M Hecker, A Leson, ...
Journal of synchrotron radiation 21 (5), 1122-1127, 2014
292014
Towards X-ray transient grating spectroscopy
C Svetina, R Mankowsky, G Knopp, F Koch, G Seniutinas, B Rösner, ...
Optics letters 44 (3), 574-577, 2019
282019
Multilayer Laue lenses with focal length of 10 mm
S Braun, A Kubec, M Menzel, S Niese, P Krüger, F Seiboth, J Patommel, ...
Journal of Physics: Conference Series 425 (5), 052019, 2013
242013
Nanobeam X-ray fluorescence and diffraction computed tomography on human bone with a resolution better than 120 nm
J Palle, NK Wittig, A Kubec, S Niese, M Rosenthal, M Burghammer, ...
Journal of Structural Biology 212 (3), 107631, 2020
222020
Point focusing with flat and wedged crossed multilayer Laue lenses
A Kubec, K Melzer, J Gluch, S Niese, S Braun, J Patommel, ...
Journal of Synchrotron Radiation 24 (2), 413-421, 2017
222017
An achromatic X-ray lens
A Kubec, MC Zdora, UT Sanli, A Diaz, J Vila-Comamala, C David
Nature Communications 13 (1), 1305, 2022
212022
Efficiency of a multilayer-Laue-lens with a 102 μm aperture
AT Macrander, A Kubec, R Conley, N Bouet, J Zhou, M Wojcik, J Maser
Applied Physics Letters 107 (8), 2015
162015
Hard X-ray nano-holotomography with a Fresnel zone plate
S Flenner, A Kubec, C David, M Storm, CF Schaber, F Vollrath, M Müller, ...
Optics express 28 (25), 37514-37525, 2020
152020
Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
S Niese, P Krüger, A Kubec, R Laas, P Gawlitza, K Melzer, S Braun, ...
Thin Solid Films 571, 321-324, 2014
142014
Multifocus off-axis zone plates for x-ray free-electron laser experiments
F Döring, B Rösner, M Langer, A Kubec, A Kleibert, J Raabe, CAF Vaz, ...
Optica 7 (8), 1007-1014, 2020
132020
Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples
M Lyubomirskiy, F Wittwer, M Kahnt, F Koch, A Kubec, KV Falch, ...
Scientific reports 12 (1), 6203, 2022
122022
Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics
DP Gruber, J Todt, N Wöhrl, J Zalesak, M Tkadletz, A Kubec, S Niese, ...
Carbon 144, 666-674, 2019
122019
Fabrication and efficiency measurement of a Mo/C/Si/C three material system multilayer Laue lens
A Kubec, J Maser, P Formánek, V Franke, S Braun, P Gawlitza, A Leson, ...
Applied Physics Lete+ters 110 (11), 2017
112017
Rapid aberration correction for diffractive X-ray optics by additive manufacturing
F Seiboth, A Kubec, A Schropp, S Niese, P Gawlitza, J Garrevoet, ...
Optics Express 30 (18), 31519-31529, 2022
102022
Diffraction properties of multilayer Laue lenses with an aperture of 102 µm and WSi2/Al bilayers
A Kubec, N Kujala, R Conley, N Bouet, J Zhou, TM Mooney, D Shu, ...
Optics express 23 (21), 27990-27997, 2015
102015
Sub 25 nm focusing with a long working distance using multilayer Laue lenses
A Kubec, S Niese, M Rosenthal, J Gluch, M Burghammer, P Gawlitza, ...
Journal of Instrumentation 13 (04), C04011, 2018
72018
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