| Investigating data representation for efficient and reliable convolutional neural networks A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio Microprocessors and Microsystems 86, 104318, 2021 | 34 | 2021 |
| Test and reliability in approximate computing L Anghel, M Benabdenbi, A Bosio, M Traiola, EI Vatajelu Journal of Electronic Testing 34 (4), 375-387, 2018 | 31 | 2018 |
| Multi-objective application-driven approximate design method S Barone, M Traiola, M Barbareschi, A Bosio IEEE Access 9, 86975-86993, 2021 | 24 | 2021 |
| A survey of testing techniques for approximate integrated circuits M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio Proceedings of the IEEE 108 (12), 2178-2194, 2020 | 21 | 2020 |
| A survey on deep learning resilience assessment methodologies A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio Computer 56 (2), 57-66, 2023 | 19 | 2023 |
| Testing approximate digital circuits: Challenges and opportunities M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 19 | 2018 |
| Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications M Traiola, A Savino, S Di Carlo Microelectronics Reliability 102, 113309, 2019 | 17 | 2019 |
| Predicting the impact of functional approximation: From component-to application-level M Traiola, A Savino, M Barbareschi, S Di Carlo, A Bosio 2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018 | 17 | 2018 |
| Qamr: an approximation-based fully reliable tmr alternative for area overhead reduction B Deveautour, M Traiola, A Virazel, P Girard 2020 IEEE European test symposium (ETS), 1-6, 2020 | 16 | 2020 |
| A test pattern generation technique for approximate circuits based on an ILP-formulated pattern selection procedure M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio IEEE Transactions on Nanotechnology 18, 849-857, 2019 | 15 | 2019 |
| Towards approximation during test of integrated circuits I Wali, M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio 2017 IEEE 20th International Symposium on Design and Diagnostics of …, 2017 | 15 | 2017 |
| Xbargen: A memristor based boolean logic synthesis tool M Traiola, M Barbareschi, A Mazzeo, A Bosio 2016 IFIP/IEEE International Conference on Very Large Scale Integration …, 2016 | 14 | 2016 |
| Selective hardening of critical neurons in deep neural networks A Ruospo, G Gavarini, I Bragaglia, M Traiola, A Bosio, E Sanchez 2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022 | 13 | 2022 |
| On the comparison of different atpg approaches for approximate integrated circuits M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio 2018 IEEE 21st International Symposium on Design and Diagnostics of …, 2018 | 13 | 2018 |
| Design, verification, test and in-field implications of approximate computing systems A Bosio, S Di Carlo, P Girard, E Sanchez, A Savino, L Sekanina, M Traiola, ... 2020 IEEE European Test Symposium (ETS), 1-10, 2020 | 12 | 2020 |
| A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators M Barbareschi, S Barone, A Bosio, J Han, M Traiola ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (3), 1-25, 2022 | 11 | 2022 |
| Emerging computing devices: Challenges and opportunities for test and reliability A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ... 2021 IEEE European test symposium (ETS), 1-10, 2021 | 11 | 2021 |
| Evaluating data encryption effects on the resilience of an artificial neural network R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 10 | 2020 |
| Maximizing yield for approximate integrated circuits M Traiola, A Virazel, P Girard, M Barbareschi, A Bosio 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 810-815, 2020 | 10 | 2020 |
| Investigation of mean-error metrics for testing approximate integrated circuits M Traiola, A Virazel, P Girard, M Barbarcschi, A Bosio 2018 IEEE international symposium on defect and fault tolerance in VLSI and …, 2018 | 10 | 2018 |
Mario BarbareschiTenured Assistant Professor | Dipartimento di Ingegneria Elettrica e delle Tecnologie dellBestätigte E-Mail-Adresse bei unina.it
