Wolfgang Mertin
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Zitiert von
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The effect of degree of reduction on the electrical properties of functionalized graphene sheets
C Punckt, F Muckel, S Wolff, IA Aksay, CA Chavarin, G Bacher, W Mertin
Applied Physics Letters 102 (2), 023114, 2013
1132013
Local voltage drop in a single functionalized graphene sheet characterized by Kelvin probe force microscopy
L Yan, C Punckt, IA Aksay, W Mertin, G Bacher
Nano letters 11 (9), 3543-3549, 2011
792011
Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy
S Vinaji, A Lochthofen, W Mertin, I Regolin, C Gutsche, W Prost, ...
Nanotechnology 20 (38), 385702, 2009
422009
Monolithic gallium arsenide cantilever for scanning near-field microscopy
S Heisig, HU Danzebrink, A Leyk, W Mertin, S Münster, E Oesterschulze
Ultramicroscopy 71 (1-4), 99-105, 1998
381998
Voltage drop in an light-emitting diode probed by Kelvin probe force microscopy
KD Katzer, W Mertin, G Bacher, A Jaeger, K Streubel
Applied physics letters 89 (10), 103522, 2006
322006
Spatially resolved photoelectric performance of axial GaAs nanowire pn-diodes
A Lysov, S Vinaji, M Offer, C Gutsche, I Regolin, W Mertin, M Geller, ...
Nano Research 4 (10), 987-995, 2011
312011
Electrical investigation of V-defects in GaN using Kelvin probe and conductive atomic force microscopy
A Lochthofen, W Mertin, G Bacher, L Hoeppel, S Bader, J Off, B Hahn
Applied Physics Letters 93 (2), 2107, 2008
312008
Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique
W Mertin, C Bohm, LJ Balk, E Kubalek
1992 IEEE MTT-S Microwave Symposium Digest, 1443-1446, 1992
241992
Low resistive edge contacts to CVD‐grown graphene using a CMOS compatible metal
M Shaygan, M Otto, AA Sagade, CA Chavarin, G Bacher, W Mertin, ...
Annalen der Physik 529 (11), 1600410, 2017
202017
On the origin of contact resistances in graphene devices fabricated by optical lithography
CA Chavarin, AA Sagade, D Neumaier, G Bacher, W Mertin
Applied Physics A 122 (2), 58, 2016
202016
Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
G David, S Redlich, W Mertin, RM Bertenburg, S Koßlowski, FJ Tegude, ...
Microwave Conference, 1993. 23rd European, 497-499, 1993
201993
Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
W Mertin, A Leyk, G David, RM Bertenburg, S Koßlowski, FJ Tegude, ...
1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 94CH3389 …, 1994
181994
Contactless gigahertz testing
W Mertin, A Leyk, U Behnke, V Wittpahl
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
141998
Time resolved near-field scanning optical microscopy
C Bohm, J Bangert, W Mertin, E Kubalek
Journal of Physics D: Applied Physics 27 (10), 2237, 1994
141994
Probe tip invasiveness at indirect electro-optic sampling of MMIC
W Mertin, C Roths, F Taenzler, E Kubalek
1993 IEEE MTT-S International Microwave Symposium Digest, 1351-1354, 1993
131993
Cantilever influence suppression of contactless IC-testing by electric force microscopy
V Wittpahl, U Behnke, B Wand, W Mertin
Microelectronics Reliability 38 (6-8), 981-986, 1998
121998
Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
W Mertin, A Leyk, T Novak, G David, D Jäger, E Kubalek
Microelectronic Engineering 24 (1-4), 377-384, 1994
121994
Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy
A Lochthofen, W Mertin, G Bacher, M Furitsch, G Brüderl, U Strauss, ...
Journal of Physics D: Applied Physics 41 (13), 135115, 2008
112008
New aspects in electro-optic sampling
W Mertin
Microelectronic Engineering 31 (1-4), 365-376, 1996
111996
Graphene growth through a recrystallization process in plasma enhanced chemical vapor deposition
B Bekdüz, Y Beckmann, J Mischke, J Twellmann, W Mertin, G Bacher
Nanotechnology 29 (45), 455603, 2018
102018
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