Jorge Tonfat
Jorge Tonfat
Austrian Space Research Institute (IWF)
Verified email at ieee.org
Title
Cited by
Cited by
Year
Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, FL Kastensmidt, P Rech, R Reis, HM Quinn
IEEE transactions on nuclear science 62 (6), 3080-3087, 2015
322015
Low power 3–2 and 4–2 adder compressors implemented using ASTRAN
J Tonfat, R Reis
2012 IEEE 3rd Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2012
262012
Analyzing the impact of radiation-induced failures in programmable SoCs
LA Tambara, P Rech, E Chielle, J Tonfat, FL Kastensmidt
IEEE Transactions on Nuclear Science 63 (4), 2217-2224, 2016
252016
Reliability on ARM processors against soft errors through SIHFT techniques
E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ...
IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016
222016
Multiple fault injection platform for SRAM-based FPGA based on ground-level radiation experiments
J Tarrillo, J Tonfat, L Tambara, FL Kastensmidt, R Reis
2015 16th Latin-American Test Symposium (LATS), 1-6, 2015
212015
Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017
182017
Method to analyze the susceptibility of HLS designs in SRAM-based FPGAs under soft errors
J Tonfat, L Tambara, A Santos, F Kastensmidt
International Symposium on Applied Reconfigurable Computing, 132-143, 2016
182016
Energy efficient frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, F Kastensmidt, R Reis
2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 1-8, 2015
172015
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
FL Kastensmidt, J Tonfat, T Both, P Rech, G Wirth, R Reis, F Bruguier, ...
Microelectronics Reliability 54 (9-10), 2344-2348, 2014
172014
Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors
LA Tambara, J Tonfat, A Santos, FL Kastensmidt, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (2), 874-881, 2017
162017
On the reliability of linear regression and pattern recognition feedforward artificial neural networks in FPGAs
F Libano, P Rech, L Tambara, J Tonfat, F Kastensmidt
IEEE Transactions on Nuclear Science 65 (1), 288-295, 2017
112017
Applying TMR in hardware accelerators generated by high-level synthesis design flow for mitigating multiple bit upsets in SRAM-based FPGAs
AF dos Santos, LA Tambara, F Benevenuti, J Tonfat, FL Kastensmidt
International Symposium on Applied Reconfigurable Computing, 202-213, 2017
92017
SET susceptibility estimation of clock tree networks from layout extraction
R Chipana, FL Kastensmidt, J Tonfat, R Reis
2012 13th Latin American Test Workshop (LATW), 1-6, 2012
92012
Analyzing the influence of voltage scaling for soft errors in SRAM-based FPGAs
J Tonfat, JR Azambuja, G Nazar, P Rech, C Frost, FL Kastensmidt, ...
2013 14th European Conference on Radiation and Its Effects on Components and …, 2013
62013
Soft-error probability due to SET in clock tree networks
R Chipana, E Chielle, FL Kastensmidt, J Tonfat, R Reis
2012 IEEE Computer Society Annual Symposium on VLSI, 338-343, 2012
62012
Soft error susceptibility analysis methodology of HLS designs in SRAM-based FPGAs
J Tonfat, L Tambara, A Santos, FL Kastensmidt
Microprocessors and Microsystems 51, 209-219, 2017
52017
Leakage current analysis in static cmos logic gates for a transistor network design approach
J Tonfat, G Flach, R Reis
2016 26th International Workshop on Power and Timing Modeling, Optimization …, 2016
52016
Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects
LA Tambara, JL Tonfat, R Reis, FL Kastensmidt, ECF Pereira, RG Vaz, ...
2014 15th Latin American Test Workshop-LATW, 1-6, 2014
52014
SET susceptibility analysis in buffered tree clock distribution networks
R Chipana, FL Kastensmidt, J Tonfat, R Reis, M Guthaus
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
42011
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs
FL Kastensmidt, J Tonfat, T Both, P Rech, G Wirth, R Reis, F Bruguier, ...
2014 19th IEEE European Test Symposium (ETS), 1-2, 2014
32014
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