The weighted Tsetlin machine: Compressed representations with clause weighting A Phoulady, OC Granmo, SR Gorji, HA Phoulady arXiv preprint arXiv:1911.12607, 2019 | 21 | 2019 |
A Tsetlin machine with multigranular clauses S Rahimi Gorji, OC Granmo, A Phoulady, M Goodwin International Conference on Innovative Techniques and Applications of …, 2019 | 18 | 2019 |
The weighted tsetlin machine: compressed representations with weighted clauses A Phoulady, OC Granmo, SR Gorji, HA Phoulady arXiv preprint arXiv:1911.12607, 2019 | 8 | 2019 |
Rapid high-resolution volumetric imaging via laser ablation delayering and confocal imaging A Phoulady, N May, H Choi, Y Suleiman, S Shahbazmohamadi, ... Scientific Reports 12 (1), 12277, 2022 | 6 | 2022 |
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics A Phoulady, N May, H Choi, S Shahbazmohamadi, P Tavousi Microelectronics Reliability 126, 114287, 2021 | 6 | 2021 |
Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ... Microelectronics Reliability 138, 114659, 2022 | 5 | 2022 |
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ... Microelectronics Reliability 138, 114660, 2022 | 5 | 2022 |
Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy N May, A Phoulady, H Choi, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 28 (S1), 876-878, 2022 | 5 | 2022 |
Gas-assisted femtosecond pulsed laser machining: A high-throughput alternative to focused ion beam for creating large, high-resolution cross sections N May, H Choi, A Phoulady, S Amini, P Tavousi, S Shahbazmohamadi Plos one 18 (5), e0285158, 2023 | 4 | 2023 |
Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography N May, H Choi, A Phoulady, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 28 (S1), 284-286, 2022 | 4 | 2022 |
Synthetic data augmentation to enhance manual and automated defect detection in microelectronics A Phoulady, Y Suleiman, H Choi, T Moore, N May, S Shahbazmohamadi, ... Microelectronics Reliability 150, 115220, 2023 | 2 | 2023 |
Terahertz-readable laser engraved marks as a novel solution for product traceability P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi Scientific Reports 13 (1), 12474, 2023 | 2 | 2023 |
Automated, real-time material detection during ultrashort pulsed laser machining using laser-induced breakdown spectroscopy, for process tuning, end-pointing, and segmentation H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi Plos one 19 (1), e0290761, 2024 | 1 | 2024 |
Model for predicting surface properties of lasered samples A Phoulady, H Choi, N May, B Ahmadi, P Tavousi, S Shahbazmohamadi Microscopy and Microanalysis 27 (S1), 3186-3189, 2021 | 1 | 2021 |
Automated endpointing in microelectronics failure analysis using laser induced breakdown spectroscopy P Hoveida, A Phoulady, H Choi, Y Suleiman, N May, T Moore, ... Microelectronics Reliability 150, 115224, 2023 | | 2023 |
System and method of detecting or predicting materials in microelectronic devices and laser-based machining techniques with co2 assisted processing MAY Nicholas, H Choi, V Ray, P Tavousi, S Shahbazmohamadi, ... US Patent App. 18/160,986, 2023 | | 2023 |
Synthetic Data for Deep Learning: Segmentation of PCB X-Ray Images A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi Microscopy and Microanalysis 29 (Supplement_1), 1897-1897, 2023 | | 2023 |
Terahertz Readable Laser Tags for Information Storage and Traceability P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi Microscopy and Microanalysis 29 (Supplement_1), 818-818, 2023 | | 2023 |
Intelligent Ultrashort Pulsed Laser Machining Using Laser-Induced Breakdown Spectroscopy H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi Microscopy and Microanalysis 29 (Supplement_1), 2014-2014, 2023 | | 2023 |
Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples Y Yuan, S Clusiau, R Gauvin, C Bleck, A Phoulady, P Tavousi, ... Microscopy and Microanalysis 27 (S1), 776-777, 2021 | | 2021 |