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Adrian Phoulady
Adrian Phoulady
UConn Tech Park
Bestätigte E-Mail-Adresse bei uconn.edu
Titel
Zitiert von
Zitiert von
Jahr
The weighted Tsetlin machine: Compressed representations with clause weighting
A Phoulady, OC Granmo, SR Gorji, HA Phoulady
arXiv preprint arXiv:1911.12607, 2019
212019
A Tsetlin machine with multigranular clauses
S Rahimi Gorji, OC Granmo, A Phoulady, M Goodwin
International Conference on Innovative Techniques and Applications of …, 2019
182019
The weighted tsetlin machine: compressed representations with weighted clauses
A Phoulady, OC Granmo, SR Gorji, HA Phoulady
arXiv preprint arXiv:1911.12607, 2019
82019
Rapid high-resolution volumetric imaging via laser ablation delayering and confocal imaging
A Phoulady, N May, H Choi, Y Suleiman, S Shahbazmohamadi, ...
Scientific Reports 12 (1), 12277, 2022
62022
A novel material detection method using femtosecond laser, confocal imaging and image processing enabling endpointing in fast inspection of microelectronics
A Phoulady, N May, H Choi, S Shahbazmohamadi, P Tavousi
Microelectronics Reliability 126, 114287, 2021
62021
Rapid three-dimensional reconstruction of printed circuit board using femtosecond laser delayering and digital microscopy
H Choi, N May, A Phoulady, Y Suleiman, D DiMase, ...
Microelectronics Reliability 138, 114659, 2022
52022
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation
N May, H Choi, A Phoulady, Y Suleiman, D DiMase, P Tavousi, ...
Microelectronics Reliability 138, 114660, 2022
52022
Single Image Composite Tomography Utilizing Large Scale Femtosecond Laser Cross-sectioning and Scanning Electron Microscopy
N May, A Phoulady, H Choi, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 876-878, 2022
52022
Gas-assisted femtosecond pulsed laser machining: A high-throughput alternative to focused ion beam for creating large, high-resolution cross sections
N May, H Choi, A Phoulady, S Amini, P Tavousi, S Shahbazmohamadi
Plos one 18 (5), e0285158, 2023
42023
Three-Dimensional Reconstruction of Printed Circuit Boards: Comparative Study between 3D Femtosecond Laser Serial Sectioning and Optical Imaging versus 3D X-Ray Computed Tomography
N May, H Choi, A Phoulady, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 28 (S1), 284-286, 2022
42022
Synthetic data augmentation to enhance manual and automated defect detection in microelectronics
A Phoulady, Y Suleiman, H Choi, T Moore, N May, S Shahbazmohamadi, ...
Microelectronics Reliability 150, 115220, 2023
22023
Terahertz-readable laser engraved marks as a novel solution for product traceability
P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi
Scientific Reports 13 (1), 12474, 2023
22023
Automated, real-time material detection during ultrashort pulsed laser machining using laser-induced breakdown spectroscopy, for process tuning, end-pointing, and segmentation
H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi
Plos one 19 (1), e0290761, 2024
12024
Model for predicting surface properties of lasered samples
A Phoulady, H Choi, N May, B Ahmadi, P Tavousi, S Shahbazmohamadi
Microscopy and Microanalysis 27 (S1), 3186-3189, 2021
12021
Automated endpointing in microelectronics failure analysis using laser induced breakdown spectroscopy
P Hoveida, A Phoulady, H Choi, Y Suleiman, N May, T Moore, ...
Microelectronics Reliability 150, 115224, 2023
2023
System and method of detecting or predicting materials in microelectronic devices and laser-based machining techniques with co2 assisted processing
MAY Nicholas, H Choi, V Ray, P Tavousi, S Shahbazmohamadi, ...
US Patent App. 18/160,986, 2023
2023
Synthetic Data for Deep Learning: Segmentation of PCB X-Ray Images
A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi
Microscopy and Microanalysis 29 (Supplement_1), 1897-1897, 2023
2023
Terahertz Readable Laser Tags for Information Storage and Traceability
P Hoveida, A Phoulady, H Choi, N May, S Shahbazmohamadi, P Tavousi
Microscopy and Microanalysis 29 (Supplement_1), 818-818, 2023
2023
Intelligent Ultrashort Pulsed Laser Machining Using Laser-Induced Breakdown Spectroscopy
H Choi, A Phoulady, P Hoveida, N May, S Shahbazmohamadi, P Tavousi
Microscopy and Microanalysis 29 (Supplement_1), 2014-2014, 2023
2023
Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples
Y Yuan, S Clusiau, R Gauvin, C Bleck, A Phoulady, P Tavousi, ...
Microscopy and Microanalysis 27 (S1), 776-777, 2021
2021
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