| Spectroscopic ellipsometry: principles and applications H Fujiwara John Wiley & Sons, 2007 | 3956 | 2007 |
| Effects of carrier concentration on the dielectric function of ZnO:Ga and studied by spectroscopic ellipsometry: Analysis of free-carrier and band-edge … H Fujiwara, M Kondo Physical Review B 71 (7), 075109, 2005 | 548 | 2005 |
| Optical Transitions in Hybrid Perovskite Solar Cells: Ellipsometry, Density Functional Theory, and Quantum Efficiency Analyses for M Shirayama, H Kadowaki, T Miyadera, T Sugita, M Tamakoshi, M Kato, ... Physical Review Applied 5 (1), 014012, 2016 | 375 | 2016 |
| Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films H Fujiwara, J Koh, PI Rovira, RW Collins Physical Review B 61 (16), 10832, 2000 | 347 | 2000 |
| Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry J Koh, Y Lee, H Fujiwara, CR Wronski, RW Collins Applied Physics Letters 73 (11), 1526-1528, 1998 | 309 | 1998 |
| Hydrogen-doped In2O3 as high-mobility transparent conductive oxide T Koida, H Fujiwara, M Kondo Japanese journal of applied physics 46 (7L), L685, 2007 | 286 | 2007 |
| Effects of a‐Si: H layer thicknesses on the performance of a‐Si: H∕ c‐Si heterojunction solar cells H Fujiwara, M Kondo Journal of Applied Physics 101 (5), 2007 | 281 | 2007 |
| Impact of epitaxial growth at the heterointerface of a-Si: H∕ c-Si solar cells H Fujiwara, M Kondo Applied Physics Letters 90 (1), 2007 | 281 | 2007 |
| Degradation mechanism of CH3NH3PbI3 perovskite materials upon exposure to humid air M Shirayama, M Kato, T Miyadera, T Sugita, T Fujiseki, S Hara, ... Journal of Applied Physics 119 (11), 2016 | 224 | 2016 |
| Real-time spectroscopic ellipsometry studies of the nucleation and grain growth processes in microcrystalline silicon thin films H Fujiwara, M Kondo, A Matsuda Physical Review B 63 (11), 115306, 2001 | 193 | 2001 |
| Enhancement of light trapping in thin-film hydrogenated microcrystalline Si solar cells using back reflectors with self-ordered dimple pattern H Sai, H Fujiwara, M Kondo, Y Kanamori Applied Physics Letters 93 (14), 2008 | 182 | 2008 |
| Application of hydrogenated amorphous silicon oxide layers to c-Si heterojunction solar cells H Fujiwara, T Kaneko, M Kondo Applied Physics Letters 91 (13), 2007 | 166 | 2007 |
| High-mobility hydrogen-doped In2O3 transparent conductive oxide for a-Si: H/c-Si heterojunction solar cells T Koida, H Fujiwara, M Kondo Solar Energy Materials and Solar Cells 93 (6-7), 851-854, 2009 | 163 | 2009 |
| Hydrogen-doped In2O3 transparent conducting oxide films prepared by solid-phase crystallization method T Koida, M Kondo, K Tsutsumi, A Sakaguchi, M Suzuki, H Fujiwara Journal of Applied Physics 107 (3), 2010 | 154 | 2010 |
| Spectroscopic ellipsometry for photovoltaics H Fujiwara, RW Collins Springer, 2018 | 153 | 2018 |
| Dielectric function of Cu (In, Ga) Se2-based polycrystalline materials S Minoura, K Kodera, T Maekawa, K Miyazaki, S Niki, H Fujiwara Journal of Applied Physics 113 (6), 2013 | 137 | 2013 |
| Real-time monitoring and process control in amorphous∕ crystalline silicon heterojunction solar cells by spectroscopic ellipsometry and infrared spectroscopy H Fujiwara, M Kondo Applied Physics Letters 86 (3), 2005 | 131 | 2005 |
| Quantitative determination of optical and recombination losses in thin-film photovoltaic devices based on external quantum efficiency analysis A Nakane, H Tampo, M Tamakoshi, S Fujimoto, KM Kim, S Kim, H Shibata, ... Journal of Applied Physics 120 (6), 2016 | 127 | 2016 |
| Universal rules for visible-light absorption in hybrid perovskite materials M Kato, T Fujiseki, T Miyadera, T Sugita, S Fujimoto, M Tamakoshi, ... Journal of Applied Physics 121 (11), 2017 | 119 | 2017 |
| Reduction of optical loss in hydrogenated amorphous silicon/crystalline silicon heterojunction solar cells by high-mobility hydrogen-doped In2O3 transparent conductive oxide T Koida, H Fujiwara, M Kondo Applied physics express 1 (4), 041501, 2008 | 111 | 2008 |
