Sven Rißland
Sven Rißland
Senior Process Technologist, Hanwha Q Cells GmbH
Bestätigte E-Mail-Adresse bei q-cells.com
Titel
Zitiert von
Zitiert von
Jahr
A two-diode model regarding the distributed series resistance
O Breitenstein, S Rißland
Solar Energy Materials and Solar Cells 110, 77-86, 2013
622013
High resolution saturation current density imaging at grain boundaries by lock-in thermography
S Rißland, O Breitenstein
Solar Energy Materials and Solar Cells 104, 121-124, 2012
242012
Influence of cracks on the local current-voltage parameters of silicon solar cells
TM Pletzer, JI van Mölken, S Rißland, O Breitenstein, J Knoch
Progress in Photovoltaics: Research and Applications, DOI: 10.1002/pip.2443, 2013
232013
Evaluation of luminescence images of solar cells for injection-level dependent lifetimes
S Rißland, O Breitenstein
Solar Energy Materials and Solar Cells 111, 112-114, 2013
182013
Considering the Distributed Series Resistance in a Two-Diode Model
S Rißland, O Breitenstein
Energy Procedia 38 (Proceedings of the SiliconPV 2013), 167-175, 2013
172013
Local Thermographic Efficiency Analysis of Multicrystalline and Cast-Mono Silicon Solar Cells
S Rißland, TM Pletzer, H Windgassen, O Breitenstein
Journal of Photovoltaics 3 (4), 1192-1199, 2013
122013
Comment on “Evaluation of the spatial distribution of series and shunt resistance of a solar cell using dark lock-in thermography”[J. Appl. Phys. 115, 034901 (2014)]
O Breitenstein, S Rißland
Journal of Applied Physics 116 (4), 046101, 2014
11*2014
Kerfless Wafering for Silicon Wafers by Using a Reusable Metal Layer
S Schönfelder, O Breitenstein, S Rißland, R De Donno, J Bagdahn
Energy Procedia 38 (Proceedings of the SiliconPV 2013), 942-949, 2013
112013
Glue-cleave: kerfless wafering for silicon wafers with metal on glueing and removable interface
S Schönfelder, O Breitenstein, S Rißland, R De Donno, J Bagdahn
22nd Workshop on Crystalline Silicon Solar Cells and Modules: Materials and …, 2012
72012
Evaluation of Recombination Velocities of Grain Boundaries Measured by High Resolution Lock-In Thermography
S Rißland, O Breitenstein
Energy Procedia 38 (Proceedings of the SiliconPV 2013), 161-166, 2013
62013
Distributed series resistance in a one-dimensional two-diode model revisited
JM Wagner, S Rißland, A Schütt, J Carstensen, R Adelung
Energy Procedia 124, 197-206, 2017
52017
Quantitative local current-voltage analysis with different spatially-resolved camera-based techniques of silicon solar cells with cracks
TM Pletzer, JI van Mölken, S Rißland, B Hallam, E Cornagliotti, J John, ...
40th IEEE Photovoltaic Specialists Conference, Denver (Colorado, USA), 2014
32014
Comparison of the recombination velocity at grain boundaries gained by lock-in thermography and light beam induced current measurements
S Rißland, G Micard, O Breitenstein, A Zuschlag, S Seren, B Terheiden, ...
28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC …, 2013
32013
Der Einfluss von Cracks auf die lokale Kennlinie von Silizium-Solarzellen
S Rißland, TM Pletzer
Workshop SiliconFOREST, 2014
12014
Erratum zur Berechnung der Rekombinationsgeschwindigkeit
S Rißland, G Micard
2014
Der Einfluss von Kristalldefekten und Zellstrukturen auf die Dunkelkennlinie von Siliziumsolarzellen
S Rißland
Martin-Luther-Universität Halle-Wittenberg, 2014
2014
Investigation of recombination-active grain boundaries by high resolution lock-in thermography and light beam induced current measurements
S Rißland, O Breitenstein, G Micard, A Zuschlag, S Seren, B Terheiden, ...
Annual Report 2013 - Max Planck Institute of Microstructure Physics, 2013
2013
Analysis of local diffusion current density in solar cells by lock-in thermography
S Rißland
506th Wilhelm and Else Heraeus Seminar: Infrared: Science, Technology, and …, 2012
2012
Herstellung und Charakterisierung transparent leitfähiger ZnO:Al-Schichten auf PET und deren Co-Dotierung mit Indium
S Rißland
Ilmenau, University of Technology, 2010
2010
Untersuchung von Shunts in Dünnschichtmodulen mit Hilfe der Lock-In-Thermografie
S Rißland
Ilmenau, University of Technology, 2008
2008
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