Alexander Shard
Alexander Shard
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Zitiert von
Zitiert von
ARXPS characterisation of plasma polymerised surface chemical gradients
KL Parry, AG Shard, RD Short, RG White, JD Whittle, A Wright
Surface and Interface Analysis: An International Journal devoted to the …, 2006
Effect of crystallization on the electronic energy levels and thin film morphology of P3HT: PCBM blends
WC Tsoi, SJ Spencer, L Yang, AM Ballantyne, PG Nicholson, A Turnbull, ...
Macromolecules 44 (8), 2944-2952, 2011
XPS and AFM surface studies of solvent-cast PS/PMMA blends
C Ton-That, AG Shard, DOH Teare, RH Bradley
Polymer 42 (3), 1121-1129, 2001
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard
Analytical chemistry 82 (1), 98-105, 2010
Emerging techniques for submicrometer particle sizing applied to Stober silica
NC Bell, C Minelli, J Tompkins, MM Stevens, AG Shard
Langmuir 28 (29), 10860-10872, 2012
A NEXAFS examination of unsaturation in plasma polymers of allylamine and propylamine
G Alexander, JD Whittle, AJ Beck, PN Brookes, NA Bullett, RA Talib, ...
The Journal of Physical Chemistry B 108 (33), 12472-12480, 2004
Effects of annealing on the surface composition and morphology of PS/PMMA blend
C Ton-That, AG Shard, R Daley, RH Bradley
Macromolecules 33 (22), 8453-8459, 2000
Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials
AG Shard, PJ Brewer, FM Green, IS Gilmore
Surface and Interface Analysis: An International Journal devoted to the …, 2007
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ...
Analytical chemistry 84 (18), 7865-7873, 2012
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
G Alexander, FM Green, PJ Brewer, MP Seah, IS Gilmore
The Journal of Physical Chemistry B 112 (9), 2596-2605, 2008
Thickness of spin-cast polymer thin films determined by angle-resolved XPS and AFM tip-scratch methods
C Ton-That, AG Shard, RH Bradley
Langmuir 16 (5), 2281-2284, 2000
Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays
AG Shard
Surface and Interface Analysis 46 (3), 175-185, 2014
Surface analysis of biodegradable polymer blends of poly (sebacic anhydride) and poly (DL-lactic acid)
MC Davies, KM Shakesheff, AG Shard, A Domb, CJ Roberts, SJB Tendler, ...
Macromolecules 29 (6), 2205-2212, 1996
Quantitative analysis of adsorbed proteins by X-ray photoelectron spectroscopy
S Ray, AG Shard
Analytical chemistry 83 (22), 8659-8666, 2011
Synthesis and characterization of segmented polyurethanes based on amphiphilic polyether diols
PN Lan, S Corneillie, E Schacht, M Davies, A Shard
Biomaterials 17 (23), 2273-2280, 1996
A straightforward method for interpreting XPS data from core–shell nanoparticles
AG Shard
The Journal of Physical Chemistry C 116 (31), 16806-16813, 2012
Surface feature size of spin cast PS/PMMA blends
C Ton-That, AG Shard, RH Bradley
Polymer 43 (18), 4973-4977, 2002
Surface oxidation of polyethylene, polystyrene, and PEEK: the synthon approach
AG Shard, JPS Badyal
Macromolecules 25 (7), 2053-2054, 1992
Plasma co‐polymerisation of two strongly interacting monomers: Acrylic acid and allylamine
AJ Beck, JD Whittle, NA Bullett, P Eves, S Mac Neil, SL McArthur, ...
Plasma processes and polymers 2 (8), 641-649, 2005
Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study
P Sjovall, D Rading, S Ray, L Yang, AG Shard
The Journal of Physical Chemistry B 114 (2), 769-774, 2010
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