Alexandre Cuenat
Alexandre Cuenat
Verified email at npl.co.uk
Title
Cited by
Cited by
Year
New approach to inter-technique comparisons for nanoparticle size measurements; using atomic force microscopy, nanoparticle tracking analysis and dynamic light scattering
RD Boyd, SK Pichaimuthu, A Cuenat
Colloids and Surfaces A: Physicochemical and Engineering Aspects 387 (1-3 …, 2011
1462011
dot organization on substrates patterned by focused ion beam
A Karmous, A Cuenat, A Ronda, I Berbezier, S Atha, R Hull
Applied physics letters 85 (26), 6401-6403, 2004
1192004
Traceable size determination of nanoparticles, a comparison among European metrology institutes
F Meli, T Klein, E Buhr, CG Frase, G Gleber, M Krumrey, A Duta, S Duta, ...
Measurement Science and Technology 23 (12), 125005, 2012
1072012
Dynamic properties of AFM cantilevers and the calibration of their spring constants
DA Mendels, M Lowe, A Cuenat, MG Cain, E Vallejo, D Ellis, F Mendels
Journal of Micromechanics and Microengineering 16 (8), 1720, 2006
812006
Lateral Templating for Guided Self‐Organization of Sputter Morphologies
A Cuenat, HB George, KC Chang, JM Blakely, MJ Aziz
Advanced Materials 17 (23), 2845-2849, 2005
692005
Optimization of 2DEG InAs/GaSb Hall sensors for single particle detection
O Kazakova, JC Gallop, DC Cox, E Brown, A Cuenat, K Suzuki
IEEE Transactions on Magnetics 44 (11), 4480-4483, 2008
612008
New analysis procedure for fast and reliable size measurement of nanoparticles from atomic force microscopy images
RD Boyd, A Cuenat
Journal of Nanoparticle Research 13 (1), 105-113, 2011
402011
Spontaneous pattern formation from focused and unfocused ion beam irradiation
A Cuenat, MJ Aziz
MRS Online Proceedings Library 707 (1), 381-386, 2001
302001
Overview of MEMS sensors and the metrology requirements for their manufacture
SP REILLY, RK LEACH, A CUENAT, SA AWAN, M LOWE
172006
Microscopy of semiconducting materials
W Zhou, A Cuenat, MJ Aziz
Proceedings of the 13th International Conference on Microscopy of …, 2003
162003
Amorphization in Al induced by high-energy Ni ion implantation
A Wyser, R Schäublin, R Gotthardt
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1996
111996
Combined anomalous Nernst effect and thermography studies of ultrathin CoFeB/Pt nanowires
J Wells, E Selezneva, P Krzysteczko, X Hu, HW Schumacher, R Mansell, ...
AIP Advances 7 (5), 055904, 2017
102017
Scanning thermal microscopy techniques for polymeric thin films using temperature contrast mode to measure thermal diffusivity and a novel approach in conductivity contrast …
A Dawson, M Rides, AS Maxwell, A Cuenat, AR Samano
Polymer Testing 41, 198-208, 2015
92015
Quantitative nanoscale surface voltage measurement on organic semiconductor blends
A Cuenat, A Muñiz-Piniella, M Muñoz-Rojo, WC Tsoi, CE Murphy
Nanotechnology 23, 045703, 2012
92012
Good practice guide for the determination of the size distributions of spherical nanoparticle samples.
RD Boyd, A Cuenat, F Meli, T Klein, CG Frase, G Gleber, M Krumrey, ...
82011
Formation of self-organized nanostructures on Ge during focused ion beam sputtering
W Zhou, A Cuenat, MJ Aziz
Conference Series-Institute of Physics 180, 625-628, 2003
82003
Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al
A Cuenat, R Schäublin, A Hessler-Wyser, R Gotthardt
Ultramicroscopy 83 (3-4), 179-191, 2000
62000
Scanning Probe and particle beam microscopy
A Cuenat
Fundamental Principles of Engineering Nanometrology, 177-210, 2009
52009
Nanometrology foresight review
H Bosse, U Brand, HU Danzebrink, T Dziomba, J Flügge, G Frase, ...
Co-nanomet project output www. co-nanomet. eu, 2009
42009
Determination of the elastic properties of multi-layered foils by the four-point micro-bending test
DA MENDELS*, NMP Evanno, A Cuenat
Philosophical Magazine 85 (16), 1765-1782, 2005
42005
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Articles 1–20