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Dhruv Singh
Dhruv Singh
Purdue University, Intel Corporation, GlobalFoundries
Bestätigte E-Mail-Adresse bei globalfoundries.com
Titel
Zitiert von
Zitiert von
Jahr
Mechanism of thermal conductivity reduction in few-layer graphene
D Singh, JY Murthy, TS Fisher
Journal of Applied Physics 110 (4), 044317, 2011
1942011
Reliability of Raman measurements of thermal conductivity of single-layer graphene due to selective electron-phonon coupling: A first-principles study
AK Vallabhaneni, D Singh, H Bao, J Murthy, X Ruan
Physical Review B 93 (12), 125432, 2016
1362016
Self-heat reliability considerations on Intel's 22nm Tri-Gate technology
C Prasad, L Jiang, D Singh, M Agostinelli, C Auth, P Bai, T Eiles, J Hicks, ...
2013 IEEE International Reliability Physics Symposium (IRPS), 5D. 1.1-5D. 1.5, 2013
1172013
Effect of Phonon Dispersion on Thermal Conduction Across Si/Ge Interfaces
D Singh, JY Murthy, TS Fisher
ASME 2009 InterPACK Conference collocated with the ASME 2009 Summer Heat …, 2009
872009
Spectral phonon conduction and dominant scattering pathways in graphene
D Singh, JY Murthy, TS Fisher
Journal of Applied Physics 110 (9), 094312, 2011
692011
Modeling of Subcontinuum Thermal Transport Across Semiconductor-Gas Interfaces
D Singh, X Guo, A Alexeenko, JY Murthy, TS Fisher
ASME 2008 Heat Transfer Summer Conference collocated with the Fluids …, 2008
64*2008
A 7nm CMOS technology platform for mobile and high performance compute application
S Narasimha, B Jagannathan, A Ogino, D Jaeger, B Greene, C Sheraw, ...
2017 IEEE International Electron Devices Meeting (IEDM), 29.5. 1-29.5. 4, 2017
632017
A Fast Hybrid Fourier–Boltzmann Transport Equation Solver for Nongray Phonon Transport
JM Loy, JY Murthy, D Singh
Journal of Heat Transfer 135 (1), 011008, 2013
502013
On the accuracy of classical and long wavelength approximations for phonon transport in graphene
D Singh, JY Murthy, TS Fisher
Journal of Applied Physics 110 (11), 113510, 2011
462011
Device reliability metric for end-of-life performance optimization based on circuit level assessment
A Kerber, P Srinivasan, S Cimino, P Paliwoda, S Chandrashekhar, ...
2017 IEEE International Reliability Physics Symposium (IRPS), 2D-3.1-2D-3.5, 2017
322017
Phonon transport across mesoscopic constrictions
D Singh, JY Murthy, TS Fisher
Journal of Heat Transfer 133 (4), 042402, 2011
232011
Modeling of subcontinuum thermal transport across semiconductor-gas interfaces
D Singh, X Guo, A Alexeenko, JY Murthy, TS Fisher
Journal of Applied Physics 106 (2), 024314, 2009
232009
Self-heating assessment on bulk FinFET devices through characterization and predictive simulation
P Paliwoda, PP Manik, D Singh, Z Chbili, A Kerber, J Johnson, D Misra
IEEE Transactions on Device and Materials Reliability 18 (2), 133-138, 2018
222018
Numerical simulation of gas-phonon coupling in thermal transpiration flows
X Guo, D Singh, J Murthy, AA Alexeenko
Physical Review E 80 (4), 046310, 2009
162009
Lattice boltzmann and discrete ordinates methods for phonon transport modeling: A comparative study
FN Donmezer, D Singh, W James, A Christensen, S Graham, JY Murthy
ASME 2011 International Mechanical Engineering Congress and Exposition, 333-343, 2011
142011
Frequency and polarization resolved phonon transport in carbon and silicon nanostructures
D Singh
132011
Non-Gray Phonon Transport Using a Hybrid BTE-Fourier Solver
JM Loy, D Singh, JY Murthy
ASME 2009 Heat Transfer Summer Conference collocated with the InterPACK09 …, 2009
132009
Ambient temperature and layout impact on self-heating characterization in FinFET devices
P Paliwoda, Z Chbili, A Kerber, D Singh, D Misra
2018 IEEE International Reliability Physics Symposium (IRPS), 6E. 2-1-6E. 2-5, 2018
122018
Reconstruction of time-dependent concentration gradients around a KDP crystal growing from its aqueous solution
A Srivastava, D Singh, K Muralidhar
Journal of Crystal Growth 311 (4), 1166-1177, 2009
122009
Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies
D Singh, OD Restrepo, PP Manik, NR Mavilla, H Zhang, P Paliwoda, ...
2018 IEEE International Reliability Physics Symposium (IRPS), 6F. 6-1-6F. 6-7, 2018
112018
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