| Evaluating luminescence based voltage images of silicon solar cells M Glatthaar, J Haunschild, R Zeidler, M Demant, J Greulich, B Michl, ... Journal of Applied Physics 108 (1), 2010 | 137 | 2010 |
| Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production J Haunschild, M Glatthaar, M Demant, J Nievendick, M Motzko, S Rein, ... Solar Energy Materials and Solar Cells 94 (12), 2007-2012, 2010 | 120 | 2010 |
| The advent of modern solar-powered electric agricultural machinery: A solution for sustainable farm operations S Gorjian, H Ebadi, M Trommsdorff, H Sharon, M Demant, S Schindele Journal of cleaner production 292, 126030, 2021 | 115 | 2021 |
| Key aspects for fabrication of p-type Cz-Si PERC solar cells exceeding 22% conversion efficiency S Werner, E Lohmüller, P Saint-Cast, JM Greulich, J Weber, S Schmidt, ... 33rd EU PVSEC, 406-412, 2017 | 56 | 2017 |
| Microcracks in silicon wafers I: Inline detection and implications of crack morphology on wafer strength M Demant, T Welschehold, M Oswald, S Bartsch, T Brox, S Schoenfelder, ... IEEE Journal of Photovoltaics 6 (1), 126 - 135, 2016 | 54 | 2016 |
| Detection and analysis of micro-cracks in multi-crystalline silicon wafers during solar cell production M Demant, S Rein, J Krisch, S Schoenfelder, C Fischer, S Bartsch, R Preu Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE, 1641-1646, 2011 | 42 | 2011 |
| Inline quality rating of multi‐crystalline wafers based on photoluminescence images M Demant, S Rein, J Haunschild, T Strauch, H Höffler, J Broisch, ... Progress in Photovoltaics: Research and Applications 24 (12), 1533-46, 2015 | 36 | 2015 |
| Impact of material and process variations on the distribution of multicrystalline silicon PERC cell efficiencies S Wasmer, J Greulich, H Höffler, N Wöhrle, M Demant, F Fertig, S Rein IEEE Journal of Photovoltaics 7 (1), 118-128, 2016 | 28 | 2016 |
| Rating and sorting of mc-Si as-cut wafers in solar cell production using PL imaging J Haunschild, IE Reis, T Chipei, M Demant, B Thaidigsmann, M Linse, ... Solar energy materials and solar cells 106, 71-75, 2012 | 26 | 2012 |
| Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks M Demant, P Virtue, A Kovvali, XY Stella, S Rein IEEE Journal of Photovoltaics 9 (4), 1064-1072, 2019 | 25 | 2019 |
| Analysis of luminescence images applying pattern recognition techniques M Demant, M Glatthaar, J Haunschild, S Rein Proceedings of the 25th European Photovoltaic Solar Energy Conference …, 2010 | 25 | 2010 |
| Microcracks in silicon wafers II: implications on solar cell characteristics, statistics and physical origin M Demant, T Welschehold, S Kluska, S Rein IEEE Journal of Photovoltaics 6 (1), 136 - 144, 2016 | 22 | 2016 |
| Micro-cracks in silicon wafers and solar cells: detection and rating of mechanical strength and electrical quality M Demant, M Oswald, T Welschehold, S Nold, S Bartsch, S Schoenfelder, ... Proceedings of the 29th European Photovoltaic Solar Energy Conference …, 2014 | 20 | 2014 |
| Visualizing material quality and similarity of mc-Si wafers learned by convolutional regression networks M Demant, P Virtue, A Kovvali, XY Stella, S Rein IEEE Journal of Photovoltaics 9 (4), 1073 - 1080, 2019 | 18 | 2019 |
| Bifacial p-type silicon PERL solar cells with screen-printed pure silver metallization and 89% bifaciality E Lohmüller, S Werner, MH Norouzi, S Mack, M Demant, S Gutscher, ... | 17 | 2017 |
| Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images T Strauch, M Demant, A Lorenz, J Haunschild, S Rein Proceedings of the 29th European Photovoltaic Solar Energy Conference …, 2014 | 17 | 2014 |
| Comparison of inline crack detection systems for multicrystalline silicon solar cells JM Greulich, M Demant, P Kunze, G Dost, K Ramspeck, A Vetter, C Probst IEEE Journal of Photovoltaics 10 (5), 1389-1395, 2020 | 15 | 2020 |
| Impact of texture roughness on the front-side metallization of stencil-printed silicon solar cells A Lorenz, T Strauch, M Demant, T Fellmeth, TB Hofmeister, M Linse, ... IEEE Journal of Photovoltaics 5 (4), 1237-1244, 2015 | 15 | 2015 |
| About the relevance of defect features in as-cut multicrystalline silicon wafers on solar cell performance A Kovvali, M Demant, T Trötschler, J Haunschild, S Rein AIP Conference Proceedings 1999 (1), 2018 | 14 | 2018 |
| Modelling of physically relevant features in photoluminescence images M Demant, J Greulich, M Glatthaar, J Haunschild, S Rein Energy Procedia 27, 247-252, 2012 | 14 | 2012 |
Johannes GreulichFraunhofer Institute for Solar Energy SystemsVerified email at ise.fraunhofer.de
