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Basab Datta
Basab Datta
Intel, Netronome, Advanced Micro Devices, PhD - University of Massachusetts-Amherst
Verified email at intel.com - Homepage
Title
Cited by
Cited by
Year
Low-power and robust on-chip thermal sensing using differential ring oscillators
B Datta, W Burleson
2007 50th Midwest Symposium on Circuits and Systems, 29-32, 2007
432007
Collaborative monitors for embedded system security
T Wolf, S Mao, D Kumar, B Datta, WP Burleson, G Gogniat
1st Workshop on Embedded Systems Security (EMSOFT). ACM, 2006
242006
Temperature effects on energy optimization in sub-threshold circuit design
B Datta, W Burleson
2009 10th International Symposium on Quality Electronic Design, 680-685, 2009
192009
Low-power, process-variation tolerant on-chip thermal monitoring using track and hold based thermal sensors
B Datta, W Burleson
Proceedings of the 19th ACM Great Lakes symposium on VLSI, 145-148, 2009
172009
Calibration of on-chip thermal sensors using process monitoring circuits
B Datta, W Burleson
2010 11th international symposium on quality electronic design (ISQED), 461-467, 2010
162010
Low power on-chip thermal sensors based on wires
B Datta, WP Burleson
2007 IFIP International Conference on Very Large Scale Integration, 258-263, 2007
122007
Thermal-aware voltage droop compensation for multi-core architectures
J Zhao, B Datta, W Burleson, R Tessier
Proceedings of the 20th symposium on Great lakes symposium on VLSI, 335-340, 2010
102010
Analysis of a ring oscillator based on chip thermal sensor in 65nm technology
B Datta, D Kumar
Report, UMass Amherst, 2005
92005
A high sensitivity and process tolerant digital thermal sensing scheme for 3-D Ics
B Datta, W Burleson
Proceedings of the 21st edition of the great lakes symposium on Great lakes…, 2011
72011
Analysis and mitigation of nbti-impact on pvt variability in repeated global interconnect performance
B Datta, W Burleson
Proceedings of the 20th symposium on Great lakes symposium on VLSI, 341-346, 2010
72010
On-chip thermal sensing in deep sub-micron CMOS
B Datta
62007
Circuit-level NBTI macro-models for collaborative reliability monitoring
B Datta, W Burleson
Proceedings of the 20th symposium on Great lakes symposium on VLSI, 453-458, 2010
52010
Collaborative sensing of on-chip wire temperatures using interconnect based ring oscillators
B Datta, W Burleson
Proceedings of the 18th ACM Great Lakes symposium on VLSI, 41-46, 2008
52008
On temperature planarization effect of copper dummy fills in deep nanometer technology
B Datta, W Burleson
2009 10th International Symposium on Quality Electronic Design, 494-499, 2009
42009
A 12.4μm2133.4μW 4.56mV/C resolution digital on-chip thermal sensing circuit in 45nm CMOS utilizing sub-threshold operation
B Datta, W Burleson
2011 12th International Symposium on Quality Electronic Design, 1-7, 2011
32011
A 45.6 2 13.4 W 7.1 V/V Resolution Sub-Threshold Based Digital Process-Sensing Circuit in 45nm CMOS
B Datta, W Burleson
32011
A Tunable Soft-Error Filtering Circuit Based on Programmable-Threshold Inverters
B Datta, V Burleson
Proc. Int. Symp. on Circuits and Systems (ISCAS), 2011
12011
Temperature measurement in content addressable memory cells using bias-controlled VCO
B Datta, WP Burleson
2008 IEEE International SOC Conference, 147-150, 2008
12008
Temperature Effects on Practical Energy Optimization of Sub-Threshold Circuits in Deep Nanometer Technologies
B Datta, W Burleson
Journal of Low Power Electronics 7 (3), 403-419, 2011
2011
Thermal effects and sensor design in nanometer CMOS
B Datta
University of Massachusetts Amherst, 2011
2011
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