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Lee Barford
Lee Barford
Fellow, Keysight Technologies
Verified email at keysight.com
Title
Cited by
Cited by
Year
Method and apparatus for using parameters to simulate an electronic circuit
LA Barford, NH Chang, B Troyanovsky
US Patent 5,946,482, 1999
561999
An introduction to wavelets
LA Barford, RS Fazzio, DR Smith
Hewlett Packard, 1992
561992
Model-based diagnostic system with automated procedures for next test selection
V Kanevsky, LA Barford
US Patent 6,167,352, 2000
552000
Method and apparatus for extraction of nonlinear black-box behavioral models from embeddings of the time-domain measurements
LA Barford, LA Kamas, NB Tufillaro, DA Usikov
US Patent 6,850,871, 2005
532005
Revising a test suite using diagnostic efficacy evaluation
LA Barford
US Patent 7,139,676, 2006
512006
Method of controlling a device and a device controlled thereby
LA Barford, SA Newton
US Patent App. 11/933,189, 2009
472009
Apparatus and method for computer-aided design of sheet metal fabricated parts
SA Conradson, LA Barford, WD Fisher, MJ Weinstein, JD Wilker
US Patent 5,587,914, 1996
421996
Method of computer-aided prediction of collisions between objects including fabrication tools and parts to be fabricated
SA Conradson, LA Barford
US Patent 5,307,282, 1994
421994
An approach for fault detection and isolation in dynamic systems from distributed measurements
EJ Manders, LA Barford, G Biswas
IEEE Transactions on instrumentation and Measurement 51 (2), 235-240, 2002
402002
A GRAPHICAL, LANGUAGE-BASED EDITOR FOR GENERIC SOLID MODELS REPRESENTED BY CONSTRAINTS (CAD)
LA Barford
Cornell University, 1987
381987
Construction of behavioral models for microwave devices from time domain large‐signal measurements to speed up high‐level design simulations
D Schreurs, J Wood, N Tufillaro, L Barford, DE Root
International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2003
362003
Signal interpretation for monitoring and diagnosis, a cooling system testbed
EJ Manders, G Biswas, PJ Mosterman, LA Barford, RJ Barnett
IEEE Transactions on Instrumentation and Measurement 49 (3), 503-508, 2000
332000
Probabilistic diagnosis, in particular for embedded and remote applications
LA Barford, DR Smith
US Patent 6,691,249, 2004
322004
The construction and evaluation of behavioral models for microwave devices based on time-domain large-signal measurements
D Schreurs, J Wood, N Tufillaro, D Usikov, L Barford, DE Root
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No …, 2000
292000
Attribute grammars in constraint‐based graphics systems
LA Barford, BT Vander Zanden
Software: Practice and Experience 19 (4), 309-328, 1989
231989
System model determination for failure detection and isolation, in particular in computer systems
LA Barford, C Zurhorst
US Patent 6,587,960, 2003
202003
Fourier analysis from networked measurements using time synchronization
L Barford, J Burch
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings 3 …, 2005
192005
Fast time domain simulation in spice with frequency domain data
N Chang, L Barford, B Troyanovsky
1997 Proceedings 47th Electronic Components and Technology Conference, 689-695, 1997
191997
Diagnosis of data packet transfer faults using constraints
DR Manley, LA Barford
US Patent 7,051,240, 2006
182006
Method and system for minimal-time bit-error-rate testing
LA Barford
US Patent 6,816,988, 2004
182004
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