Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy U Rabe, S Amelio, M Kopycinska, S Hirsekorn, M Kempf, M Göken, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2002
276 2002 High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques U Rabe, M Kopycinska, S Hirsekorn, JM Saldana, GA Schneider, ...
Journal of Physics D: Applied Physics 35 (20), 2621, 2002
197 2002 Contact mechanics and tip shape in AFM-based nanomechanical measurements M Kopycinska-Müller, RH Geiss, DC Hurley
Ultramicroscopy 106 (6), 466-474, 2006
193 2006 Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy M Prasad, M Kopycinska, U Rabe, W Arnold
Geophysical research letters 29 (8), 13-1-13-4, 2002
193 2002 Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods DC Hurley, M Kopycinska-Mueller, AB Kos, RH Geiss
Measurement science and technology 16 (11), 2167, 2005
129 2005 Elastic-property measurements of ultrathin films using atomic force acoustic microscopy M Kopycinska-Mueller, RH Geiss, J Mueller, DC Hurley
Nanotechnology 16 (6), 703, 2005
108 2005 Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation U Rabe, M Kopycinska, S Hirsekorn, W Arnold
Ultrasonics 40 (1-8), 49-54, 2002
71 2002 Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy DC Hurley, M Kopycinska-Mueller, ED Langlois, AB Kos, N Barbosa III
Applied physics letters 89 (2), 021911, 2006
69 2006 Detection of buried reference structures by use of atomic force acoustic microscopy A Striegler, B Koehler, B Bendjus, M Roellig, M Kopycinska-Mueller, ...
Ultramicroscopy 111 (8), 1405-1416, 2011
49 2011 Quantitative nanoscale modulus measurements and elastic imaging of Y Zheng, RE Geer, K Dovidenko, M Kopycinska-Müller, DC Hurley
Journal of applied physics 100 (12), 124308, 2006
45 2006 Quantitative evaluation of elastic properties of nano-crystalline nickel using atomic force acoustic microscopy M Kopycinska-Müller, A Caron, S Hirsekorn, U Rabe, H Natter, ...
Zeitschrift für Physikalische Chemie 222 (2-3), 471-498, 2008
44 2008 Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy DC Hurley, M Kopycinska-Mueller, AB Kos
Jom 59, 23-29, 2007
41 2007 Quantitative Elastic‐Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy DC Hurley, M Kopycinska‐Müller, AB Kos, RH Geiss
Advanced Engineering Materials 7 (8), 713-718, 2005
41 2005 Anisotropic elastic properties of nanocrystalline nickel thin films DC Hurley, RH Geiss, M Kopycinska-Müller, J Müller, DT Read, JE Wright, ...
Journal of materials research 20 (5), 1186-1193, 2005
40 2005 Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness DC Hurley, M Kopycinska-Mueller, D Julthongpiput, MJ Fasolka
Applied Surface Science 253 (3), 1274-1281, 2006
30 2006 Atomic force acoustic microscopy U Rabe, M Kopycinska-Müller, S Hirsekorn
Acoustic scanning probe microscopy, 123-153, 2013
28 2013 Nanoscale imaging of elastic and piezoelectric properties of nanocrystalline lead calcium titanate M Kopycinska, C Ziebert, H Schmitt, U Rabe, S Hirsekorn, W Arnold
Surface science 532, 450-455, 2003
28 2003 On the elastic properties of nanocrystalline materials and the determination of elastic properties on a nanoscale using the atomic force acoustic microscopy technique M Kopycinska-Müller
PhD Thesis, 2005
19 2005 Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy M Kopycinska-Müller, A Clausner, KB Yeap, B Köhler, N Kuzeyeva, ...
Ultramicroscopy 162, 82-90, 2016
18 2016 Elastic properties of clay minerals determined by atomic force acoustic microscopy technique M Kopycinska-Müller, M Prasad, U Rabe, W Arnold
Acoustical Imaging, 409-416, 2007
16 2007 
Bernd KöhlerSenior Scientist, Matrial Diagnostics, Fraunhofer IKTSBestätigte E-Mail-Adresse bei ikts.fraunhofer.de
