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Kopycinska Mueller, Malgorzata
Kopycinska Mueller, Malgorzata
IKTS-MD
Verified email at ikts-md.fraunhofer.de
Title
Cited by
Cited by
Year
Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy
U Rabe, S Amelio, M Kopycinska, S Hirsekorn, M Kempf, M Göken, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2002
2832002
Contact mechanics and tip shape in AFM-based nanomechanical measurements
M Kopycinska-Müller, RH Geiss, DC Hurley
Ultramicroscopy 106 (6), 466-474, 2006
2172006
Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy
M Prasad, M Kopycinska, U Rabe, W Arnold
Geophysical research letters 29 (8), 13-1-13-4, 2002
2062002
High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques
U Rabe, M Kopycinska, S Hirsekorn, JM Saldana, GA Schneider, ...
Journal of Physics D: Applied Physics 35 (20), 2621, 2002
2002002
Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
DC Hurley, M Kopycinska-Mueller, AB Kos, RH Geiss
Measurement science and technology 16 (11), 2167, 2005
1362005
Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
M Kopycinska-Mueller, RH Geiss, J Mueller, DC Hurley
Nanotechnology 16 (6), 703, 2005
1102005
Evaluation of the contact resonance frequencies in atomic force microscopy as a method for surface characterisation
U Rabe, M Kopycinska, S Hirsekorn, W Arnold
Ultrasonics 40 (1-8), 49-54, 2002
762002
Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy
DC Hurley, M Kopycinska-Mueller, ED Langlois, AB Kos, N Barbosa
Applied physics letters 89 (2), 2006
732006
Detection of buried reference structures by use of atomic force acoustic microscopy
A Striegler, B Koehler, B Bendjus, M Roellig, M Kopycinska-Mueller, ...
Ultramicroscopy 111 (8), 1405-1416, 2011
522011
Quantitative evaluation of elastic properties of nano-crystalline nickel using atomic force acoustic microscopy
M Kopycinska-Müller, A Caron, S Hirsekorn, U Rabe, H Natter, ...
Zeitschrift für Physikalische Chemie 222 (2-3), 471-498, 2008
472008
Quantitative nanoscale modulus measurements and elastic imaging of SnO2 nanobelts
Y Zheng, RE Geer, K Dovidenko, M Kopycinska-Müller, DC Hurley
Journal of applied physics 100 (12), 2006
462006
Quantitative Elastic‐Property Measurements at the Nanoscale with Atomic Force Acoustic Microscopy
DC Hurley, M Kopycinska‐Müller, AB Kos, RH Geiss
Advanced Engineering Materials 7 (8), 713-718, 2005
422005
Anisotropic elastic properties of nanocrystalline nickel thin films
DC Hurley, RH Geiss, M Kopycinska-Müller, J Müller, DT Read, JE Wright, ...
Journal of materials research 20 (5), 1186-1193, 2005
422005
Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy
DC Hurley, M Kopycinska-Mueller, AB Kos
Jom 59, 23-29, 2007
412007
Influence of surface energy and relative humidity on AFM nanomechanical contact stiffness
DC Hurley, M Kopycinska-Mueller, D Julthongpiput, MJ Fasolka
Applied Surface Science 253 (3), 1274-1281, 2006
312006
Atomic force acoustic microscopy
U Rabe, M Kopycinska-Müller, S Hirsekorn
Acoustic scanning probe microscopy, 123-153, 2012
282012
Nanoscale imaging of elastic and piezoelectric properties of nanocrystalline lead calcium titanate
M Kopycinska, C Ziebert, H Schmitt, U Rabe, S Hirsekorn, W Arnold
Surface science 532, 450-455, 2003
272003
Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy
M Kopycinska-Müller, A Clausner, KB Yeap, B Köhler, N Kuzeyeva, ...
Ultramicroscopy 162, 82-90, 2016
212016
On the elastic properties of nanocrystalline materials and the determination of elastic properties on a nanoscale using the atomic force acoustic microscopy technique
M Kopycinska-Müller
PhD Thesis, 2005
202005
Elastic properties of clay minerals determined by atomic force acoustic microscopy technique
M Kopycinska-Müller, M Prasad, U Rabe, W Arnold
Acoustical Imaging, 409-416, 2007
182007
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