| Localized dielectric loss heating in dielectrophoresis devices TJ Kwak, I Hossen, R Bashir, WJ Chang, CH Lee Scientific reports 9 (1), 18977, 2019 | 26 | 2019 |
| Data-driven RRAM device models using Kriging interpolation I Hossen, MA Anders, L Wang, GC Adam Scientific Reports 12 (1), 5963, 2022 | 10 | 2022 |
| On-Site/In Situ Continuous Detecting ppb-Level Metal Ions in Drinking Water Using Block Loop-Gap Resonators and Machine Learning S Oh, I Hossen, J Luglio, G Justin, JE Richie, H Medeiros, CH Lee IEEE Transactions on Instrumentation and Measurement 70, 1-9, 2021 | 5 | 2021 |
| Device Modeling Bias in ReRAM-based Neural Network Simulations O Yousuf, I Hossen, MW Daniels, M Lueker-Boden, A Dienstfrey, ... IEEE Journal on Emerging and Selected Topics in Circuits and Systems 13 (1 …, 2023 | 2 | 2023 |
| Interpolative Device Models for Hafnia-Based FeFETs I Hossen, AL Glasmann, S Najmaei, GC Adam 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
| Heteroscedastic Gaussian Process Regression for ReRAM Device Modeling I Hossen, Y Zang, MA Anders, L Wang, GC Adam 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM …, 2022 | 1 | 2022 |
| Neural Network Modeling Bias for Hafnia-based FeFETs O Yousuf, I Hossen, A Glasmann, S Najmaei, GC Adam Proceedings of the 18th ACM International Symposium on Nanoscale …, 2023 | | 2023 |
| A Temperature Sensor for Measuring Dielectric Loss Heating in a Dielectrophoresis Device I Hossen Marquette University, 2020 | | 2020 |
Osama YousufPhD Candidate at George Washington UniversityBestätigte E-Mail-Adresse bei gwu.edu
