| Quantum resistance metrology in graphene AJM Giesbers, G Rietveld, E Houtzager, U Zeitler, R Yang, KS Novoselov, ... Applied Physics Letters 93 (22), 222109, 2008 | 118 | 2008 |
| DC conductivity measurements in the Van der Pauw geometry G Rietveld, CV Koijmans, LCA Henderson, MJ Hall, S Harmon, ... IEEE transactions on instrumentation and measurement 52 (2), 449-453, 2003 | 94 | 2003 |
| Anomalous temperature dependence of the work function in G Rietveld, NY Chen, D Van der Marel Physical review letters 69 (17), 2578, 1992 | 88 | 1992 |
| Measurement infrastructure to support the reliable operation of smart electrical grids G Rietveld, JP Braun, R Martin, P Wright, W Heins, N Ell, P Clarkson, ... IEEE Transactions on Instrumentation and Measurement 64 (6), 1355-1363, 2015 | 73 | 2015 |
| Nucleation of a Complex Oxide during Epitaxial Film Growth: on SrTi VC Matijasevic, B Ilge, B Stäuble-Pümpin, G Rietveld, F Tuinstra, JE Mooij Physical review letters 76 (25), 4765, 1996 | 70 | 1996 |
| Utilization of PMU measurements for three-phase line parameter estimation in power systems V Milojević, S Čalija, G Rietveld, MV Ačanski, D Colangelo IEEE Transactions on Instrumentation and Measurement 67 (10), 2453-2462, 2018 | 69 | 2018 |
| Characterization of a wideband digitizer for power measurements up to 1 MHz G Rietveld, D Zhao, C Kramer, E Houtzager, O Kristensen, C de Leffe, ... IEEE Transactions on Instrumentation and Measurement 60 (7), 2195-2201, 2011 | 62 | 2011 |
| The case for redefinition of frequency and ROCOF to account for AC power system phase steps AJ Roscoe, A Dyśko, B Marshall, M Lee, H Kirkham, G Rietveld 2017 IEEE International Workshop on Applied Measurements for Power Systems …, 2017 | 60 | 2017 |
| Phase comparison of high-current shunts up to 100 kHz GC Bosco, M Garcocz, K Lind, U Pogliano, G Rietveld, V Tarasso, B Voljc, ... IEEE Transactions on Instrumentation and Measurement 60 (7), 2359-2365, 2011 | 53 | 2011 |
| Universal jump in slope of the chemical potential at second-order phase transitions D Van der Marel, G Rietveld Physical review letters 69 (17), 2575, 1992 | 49 | 1992 |
| Field measurement of frequency and rocof in the presence of phase steps PS Wright, PN Davis, K Johnstone, G Rietveld, AJ Roscoe IEEE Transactions on Instrumentation and Measurement 68 (6), 1688-1695, 2018 | 45 | 2018 |
| An automated cryogenic current comparator resistance ratio bridge for routine resistance measurements JM Williams, T Janssen, G Rietveld, E Houtzager Metrologia 47 (3), 167, 2010 | 41 | 2010 |
| Metrology for smart electrical grids G Rietveld, JP Braun, PW Wright, U Grottker CPEM 2010, 529-530, 2010 | 32 | 2010 |
| Electrical units in the new SI: Saying goodbye to the 1990 values N Fletcher, G Rietveld, J Olthoff, I Budovsky, M Milton NCSLI Measure 9 (3), 30-35, 2014 | 31 | 2014 |
| The plasmon density of states of a layered electron gas H Morawitz, I Bozovic, VZ Kresin, G Rietveld, D Van Der Marel Zeitschrift für Physik B Condensed Matter 90 (3), 277-281, 1993 | 31 | 1993 |
| Doping dependence of the chemical potential in cuprate high-Tc superconductors I. La2− xSrxCuO4 G Rietveld, M Glastra, D van der Marel Physica C: Superconductivity 241 (3-4), 257-272, 1995 | 28 | 1995 |
| Dealing with front-end white noise on differentiated measurements such as frequency and ROCOF in power systems AJ Roscoe, SM Blair, B Dickerson, G Rietveld IEEE Transactions on Instrumentation and Measurement 67 (11), 2579-2591, 2018 | 27 | 2018 |
| Ultimate current resolution of a cryogenic current comparator J Sesé, A Camón, C Rillo, G Rietveld IEEE Transactions on Instrumentation and Measurement 48 (6), 1306-1313, 1999 | 27 | 1999 |
| Sm Ba Cu O films grown at low temperature and pressure HM Appelboom, VC Matijasevic, F Mathu, G Rietveld, B Anczykowski, ... Physica C: Superconductivity 214 (3-4), 323-334, 1993 | 27 | 1993 |
| A multistep approach for accurate permittivity measurements of liquids using a transmission line method D Zhao, G Rietveld, GM Teunisse IEEE Transactions on Instrumentation and Measurement 60 (7), 2267-2274, 2010 | 26 | 2010 |
Helko van den BromPrincipal scientist, VSLVerified email at vsl.nl
