Richard Leach
Zitiert von
Zitiert von
Review of in-situ process monitoring and in-situ metrology for metal additive manufacturing
SK Everton, M Hirsch, P Stravroulakis, RK Leach, AT Clare
Materials & Design 95, 431-445, 2016
Optical measurement of surface topography
R Leach
Springer 14, 326, 2011
Fundamental principles of engineering nanometrology
R Leach
Elsevier, 2014
Surface texture metrology for metal additive manufacturing: a review
A Townsend, N Senin, L Blunt, RK Leach, JS Taylor
Precision Engineering 46, 34-47, 2016
Characterisation of areal surface texture
R Leach
Springer Science & Business Media, 2013
Surface measurement errors using commercial scanning white light interferometers
F Gao, RK Leach, J Petzing, JM Coupland
Measurement Science and Technology 19 (1), 015303, 2007
X-ray computed tomography for additive manufacturing: a review
A Thompson, I Maskery, RK Leach
Measurement Science and Technology 27 (7), 072001, 2016
Quantification and characterisation of porosity in selectively laser melted Al–Si10–Mg using X-ray computed tomography
I Maskery, NT Aboulkhair, MR Corfield, C Tuck, AT Clare, RK Leach, ...
Materials Characterization 111, 193-204, 2016
The measurement of surface texture using stylus instruments.
RK Leach
Industrial X-ray computed tomography
S Carmignato, W Dewulf, R Leach
Springer International Publishing, 2018
Surface texture measurement for additive manufacturing
A Triantaphyllou, CL Giusca, GD Macaulay, F Roerig, M Hoebel, ...
Surface topography: metrology and properties 3 (2), 024002, 2015
Calibration of the scales of areal surface topography-measuring instruments: part 1. Measurement noise and residual flatness
CL Giusca, RK Leach, F Helary, T Gutauskas, L Nimishakavi
Measurement Science and Technology 23 (3), 035008, 2012
Bandwidth characteristics and comparisons of surface texture measuring instruments
R Leach, H Haitjema
Measurement Science and Technology 21 (3), 032001, 2010
Recent advances in traceable nanoscale dimension and force metrology in the UK
R Leach, D Chetwynd, L Blunt, J Haycocks, P Harris, K Jackson, ...
Measurement Science and Technology 17 (3), 467, 2006
Calibration of the scales of areal surface topography measuring instruments: part 2. Amplification, linearity and squareness
CL Giusca, RK Leach, F Helery
Measurement Science and Technology 23 (6), 065005, 2012
Advances in traceable nanometrology at the National Physical Laboratory
R Leach, J Haycocks, K Jackson, A Lewis, S Oldfield, A Yacoot
Nanotechnology 12 (1), R1, 2001
A vibrating micro-scale CMM probe for measuring high aspect ratio structures
JD Claverley, RK Leach
Microsystem Technologies 16 (8-9), 1507-1512, 2010
Towards geometrical calibration of x-ray computed tomography systems—a review
M Ferrucci, RK Leach, C Giusca, S Carmignato, W Dewulf
Measurement Science and Technology 26 (9), 092003, 2015
The European nanometrology landscape
RK Leach, R Boyd, T Burke, HU Danzebrink, K Dirscherl, T Dziomba, ...
Nanotechnology 22 (6), 062001, 2011
Geometrical metrology for metal additive manufacturing
RK Leach, D Bourell, S Carmignato, A Donmez, N Senin, W Dewulf
CIRP annals 68 (2), 677-700, 2019
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