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Co-authors
- Dr. Narender RanaTechnologist/Data Scientist, Western Digital CompanyVerified email at wdc.com
- Byung Cheol (Charles) KangApplication Scientist, NOVA Measuring InstrumentVerified email at novameasuring.com
- Sridhar MahendrakarSenior Manager- Metrology at Western Digital Corp.Verified email at wdc.com
- Taher KagalwalaKLAVerified email at kla-tencor.com
- Nelson Felixcornell universityVerified email at us.ibm.com
- Robin ChaoInternational Business MachineVerified email at us.ibm.com
- Daniel KoleskeTechnical Staff, Sandia National LaboratoriesVerified email at sandia.gov
- Fang FangAdvisory Engineer, expertised in Metrology & surface Characterization, IBMVerified email at udel.edu
- Timothy A. BrunnerASMLVerified email at asml.com
- Mainul Hossain, Ph.D., SMIEEEUniversity of Dhaka (2017-present), Globalfoundries, USA (2012-17), University of Central FloridaVerified email at du.ac.bd
- Stephen PeartonProfessor of Materials Science and Engineering, University of FloridaVerified email at mse.ufl.edu
- Bruce WesselsNorthwestern UniversityVerified email at northwestern.edu
- Gaurav K. Agrawal, PhDCollins AerospaceVerified email at collins.com
- Shoaib ZaidiUsman Institute of TechnologyVerified email at uit.edu
- Mary BretonTestsite Layout & Design Manager, IBMVerified email at us.ibm.com
- John A. OttResearch Engineer, IBMVerified email at us.ibm.com
- Nicolas LOUBETIBM ResearchVerified email at us.ibm.com