Helmut Dosch
Helmut Dosch
DESY-Director, Hamburg
Bestätigte E-Mail-Adresse bei - Startseite
Zitiert von
Zitiert von
Molecular layering of fluorinated ionic liquids at a charged sapphire (0001) surface
M Mezger, H Schroder, H Reichert, S Schramm, JS Okasinski, S Schoder, ...
Science 322 (5900), 424-428, 2008
Critical phenomena at surfaces and interfaces: evanescent X-ray and neutron scattering
H Dosch
Springer, 2006
Observation of five-fold local symmetry in liquid lead
H Reichert, O Klein, H Dosch, M Denk, V Honkimäki, T Lippmann, ...
Nature 408 (6814), 839-841, 2000
High-resolution in situ x-ray study of the hydrophobic gap at the water–octadecyl-trichlorosilane interface
M Mezger, H Reichert, S Schöder, J Okasinski, H Schröder, H Dosch, ...
Proceedings of the National Academy of Sciences 103 (49), 18401-18404, 2006
Organic n-channel transistors based on core-cyanated perylene carboxylic diimide derivatives
RT Weitz, K Amsharov, U Zschieschang, EB Villas, DK Goswami, ...
Journal of the American Chemical Society 130 (14), 4637-4645, 2008
X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter
P Wochner, C Gutt, T Autenrieth, T Demmer, V Bugaev, AD Ortiz, A Duri, ...
Proceedings of the National Academy of Sciences 106 (28), 11511-11514, 2009
Kinetic hindrance during the initial oxidation of Pd (100) at ambient pressures
E Lundgren, J Gustafson, A Mikkelsen, JN Andersen, A Stierle, H Dosch, ...
Physical review letters 92 (4), 046101, 2004
Initial corrosion observed on the atomic scale
FU Renner, A Stierle, H Dosch, DM Kolb, TL Lee, J Zegenhagen
Nature 439 (7077), 707-710, 2006
Shape changes of supported Rh nanoparticles during oxidation and reduction cycles
P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch
Science 321 (5896), 1654-1658, 2008
Interfacial melting of ice in contact with SiO 2
S Engemann, H Reichert, H Dosch, J Bilgram, V Honkimäki, A Snigirev
Physical review letters 92 (20), 205701, 2004
Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene)
AC Dürr, F Schreiber, KA Ritley, V Kruppa, J Krug, H Dosch, B Struth
Physical review letters 90 (1), 016104, 2003
Depth-controlled grazing-incidence diffraction of synchrotron X radiation
H Dosch, BW Batterman, DC Wack
Physical review letters 56 (11), 1144, 1986
Glancing-angle X-ray scattering studies of the premelting of ice surfaces
H Dosch, A Lied, JH Bilgram
Surface science 327 (1-2), 145-164, 1995
Evanescent absorption in kinematic surface Bragg diffraction
H Dosch
Physical Review B 35 (5), 2137, 1987
X-ray diffraction study of the ultrathin Al2O3 layer on NiAl (110)
A Stierle, F Renner, R Streitel, H Dosch, W Drube, BC Cowie
Science 303 (5664), 1652-1656, 2004
High structural order in thin films of the organic semiconductor diindenoperylene
AC Dürr, F Schreiber, M Münch, N Karl, B Krause, V Kruppa, H Dosch
Applied Physics Letters 81 (12), 2276-2278, 2002
Morphology and thermal stability of metal contacts on crystalline organic thin films
AC Dürr, F Schreiber, M Kelsch, HD Carstanjen, H Dosch
Advanced Materials 14 (13‐14), 961-963, 2002
Structure of Ag (111)− p (4× 4)− O: No Silver Oxide
M Schmid, A Reicho, A Stierle, I Costina, J Klikovits, P Kostelnik, O Dubay, ...
Physical review letters 96 (14), 146102, 2006
Surface melting of ice single crystals revealed by glancing angle x-ray scattering
A Lied, H Dosch, JH Bilgram
Physical review letters 72 (22), 3554, 1994
Interplay between morphology, structure, and electronic properties at diindenoperylene-gold interfaces
AC Dürr, N Koch, M Kelsch, A Rühm, J Ghijsen, RL Johnson, JJ Pireaux, ...
Physical Review B 68 (11), 115428, 2003
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