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Seyab Khan
Seyab Khan
Bestätigte E-Mail-Adresse bei tudelft.nl
Titel
Zitiert von
Zitiert von
Jahr
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
H Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...
IEEE transactions on device and materials reliability 14 (1), 182-193, 2013
662013
Bias temperature instability analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
592014
BTI impact on logical gates in nano-scale CMOS technology
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
512012
Trends and challenges of SRAM reliability in the nano-scale era
S Khan, S Hamdioui
5th International Conference on Design & Technology of Integrated Systems in …, 2010
442010
NBTI monitoring and design for reliability in nanoscale circuits
S Khan, NZ Haron, S Hamdioui, F Catthoor
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
322011
Modeling and mitigating NBTI in nanoscale circuits
S Khan, S Hamdioui
2011 IEEE 17th International On-Line Testing Symposium, 1-6, 2011
322011
Temperature dependence of NBTI induced delay
S Khan, S Hamdioui
2010 IEEE 16th International On-Line Testing Symposium, 15-20, 2010
322010
BTI impact on SRAM sense amplifier
I Agbo, S Khan, S Hamdioui
2013 8th IEEE Design and Test Symposium, 1-6, 2013
212013
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
172012
Temperature impact on NBTI modeling in the framework of technology scaling
MSK Seyab, S Hamdioui
HIPEAC 2010, 1-10, 2010
122010
Impact of partial resistive defects and bias temperature instability on sram decoder reliablity
S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 8th IEEE Design and Test Symposium, 1-6, 2013
112013
NBTI Modeling in the Framework of Temperature Variation
S Khan, S Hamdioui
Proc. of Design and Test in Europe (DATE), 978-981, 2010
62010
Bias temperature instability analysis in SRAM decoder
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 18th IEEE European Test Symposium (ETS 2013), 1-1, 2013
52013
Pancreatic enzyme replacement therapy in patients with pancreatic cancer: A national prospective study
PR Harvey, SC McKay, RJW Wilkin, GR Layton, S Powell-Brett, K Okoth, ...
Pancreatology 21 (6), 1127-1134, 2021
22021
2013 8th IEEE (DTS)
S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan
Impact of partial resistive defects and Bias Temperature Instability on SRAM …, 2013
22013
Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
MSK Seyab
12013
Comparitive BTI Analysis in Nano-scale Circuits Lifetime
S Khan, S Hamdioui
Proceedings of the 4th Workshop on Design for Reliability, 2012
12012
ReverseAge: An online NBTI combating technique using time borrowing
S Khan, S Hamdioui
2011 IEEE 6th International Design and Test Workshop (IDT), 36-41, 2011
12011
Temperature dependence of NBTI induced delay
MSK Seyab, S Hamdioui
IOLTS 2010, 1-6, 2010
12010
Randomized trial of directional coronary atherectomy vs balloon angioplasty for chronic total occlusions
SK Sharma, S Duvvuri, V Kakarala, S Khan, JD Marmur
JOURNAL OF THE AMERICAN COLLEGE OF CARDIOLOGY 29 (2), 60152-60152, 1997
11997
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