| Advances in atomic force microscopy FJ Giessibl Reviews of modern physics 75 (3), 949, 2003 | 2250 | 2003 |
| Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy FJ Giessibl Science 267 (5194), 68-71, 1995 | 1366 | 1995 |
| Noncontact atomic force microscopy S Morita, FJ Giessibl, E Meyer, R Wiesendanger Springer, 2015 | 892 | 2015 |
| Forces and frequency shifts in atomic-resolution dynamic-force microscopy FJ Giessibl Physical Review B 56 (24), 16010, 1997 | 797 | 1997 |
| High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork FJ Giessibl Applied Physics Letters 73 (26), 3956-3958, 1998 | 560 | 1998 |
| Atomic resolution on by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork FJ Giessibl Applied Physics Letters 76 (11), 1470-1472, 2000 | 553 | 2000 |
| Subatomic features on the silicon (111)-(7× 7) surface observed by atomic force microscopy FJ Giessibl, S Hembacher, H Bielefeldt, J Mannhart Science 289 (5478), 422-425, 2000 | 463 | 2000 |
| The force needed to move an atom on a surface M Ternes, CP Lutz, CF Hirjibehedin, FJ Giessibl, AJ Heinrich Science 319 (5866), 1066-1069, 2008 | 432 | 2008 |
| A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy FJ Gießibl Applied Physics Letters 78 (1), 123-125, 2001 | 304 | 2001 |
| Measuring the charge state of an adatom with noncontact atomic force microscopy L Gross, F Mohn, P Liljeroth, J Repp, FJ Giessibl, G Meyer Science 324 (5933), 1428-1431, 2009 | 299 | 2009 |
| Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy FJ Giessibl, H Bielefeldt, S Hembacher, J Mannhart Applied Surface Science 140 (3-4), 352-357, 1999 | 207 | 1999 |
| Revealing the hidden atom in graphite by low-temperature atomic force microscopy S Hembacher, FJ Giessibl, J Mannhart, CF Quate Proceedings of the National Academy of Sciences 100 (22), 12539-12542, 2003 | 186 | 2003 |
| Force microscopy with light-atom probes S Hembacher, FJ Giessibl, J Mannhart Science 305 (5682), 380-383, 2004 | 177 | 2004 |
| Physical interpretation of frequency-modulation atomic force microscopy FJ Giessibl, H Bielefeldt Physical Review B 61 (15), 9968, 2000 | 169 | 2000 |
| AFM's path to atomic resolution FJ Giessibl Materials Today 8 (5), 32-41, 2005 | 132 | 2005 |
| Revealing the angular symmetry of chemical bonds by atomic force microscopy J Welker, FJ Giessibl Science 336 (6080), 444-449, 2012 | 125 | 2012 |
| Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite S Hembacher, FJ Giessibl, J Mannhart, CF Quate Physical review letters 94 (5), 056101, 2005 | 119 | 2005 |
| Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum FJ Giessibl, BM Trafas Review of scientific instruments 65 (6), 1923-1929, 1994 | 119 | 1994 |
| Interplay of conductance, force, and structural change in metallic point contacts M Ternes, C González, CP Lutz, P Hapala, FJ Giessibl, P Jelínek, ... Physical review letters 106 (1), 016802, 2011 | 118 | 2011 |
| Friction traced to the single atom FJ Giessibl, M Herz, J Mannhart Proceedings of the National Academy of Sciences 99 (19), 12006-12010, 2002 | 113 | 2002 |
