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Thomas Hantschel
Thomas Hantschel
Bestätigte E-Mail-Adresse bei imec.be
Titel
Zitiert von
Zitiert von
Jahr
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
P De Wolf, R Stephenson, T Trenkler, T Clarysse, T Hantschel, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
2232000
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
P De Wolf, R Stephenson, T Trenkler, T Clarysse, T Hantschel, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
2232000
Highly conductive diamond probes for scanning spreading resistance microscopy
T Hantschel, P Niedermann, T Trenkler, W Vandervorst
Applied Physics Letters 76 (12), 1603-1605, 2000
1182000
Two-dimensional carrier profiling of InP structures using scanning spreading resistance microscopy
P De Wolf, M Geva, T Hantschel, W Vandervorst, RB Bylsma
Applied physics letters 73 (15), 2155-2157, 1998
1111998
Heterojunction photovoltaic cell
T Hantschel, K Littau, S Elrod
US Patent App. 11/017,380, 2006
95*2006
Evaluating probes for “electrical” atomic force microscopy
T Trenkler, T Hantschel, R Stephenson, P De Wolf, W Vandervorst, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
842000
Evaluating probes for “electrical” atomic force microscopy
T Trenkler, T Hantschel, R Stephenson, P De Wolf, W Vandervorst, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
842000
Extrusion/dispensing systems and methods
DK Fork, T Hantschel
US Patent 7,765,949, 2010
702010
Probe tip configuration and a method of fabrication thereof
T Hantschel, W Vandervorst
US Patent 6,504,152, 2003
682003
Conductive diamond tips with sub‐nanometer electrical resolution for characterization of nanoelectronics device structures
T Hantschel, C Demeulemeester, P Eyben, V Schulz, O Richard, ...
physica status solidi (a) 206 (9), 2077-2081, 2009
662009
Scanning probe system with spring probe and actuation/sensing structure
T Hantschel, EM Chow, DK Fork, MA Rosa, D De Bruyker
US Patent 6,734,425, 2004
622004
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts
X Ke, S Bals, D Cott, T Hantschel, H Bender, G Van Tendeloo
Microscopy and Microanalysis 16 (2), 210-217, 2010
592010
Extruding/dispensing multiple materials to form high-aspect ratio extruded structures
DK Fork, T Hantschel
US Patent 7,799,371, 2010
572010
J-Springs-innovative compliant interconnects for next-generation packaging
L Ma, Q Zhu, T Hantschel, DK Fork, SK Sitaraman
52nd Electronic Components and Technology Conference 2002.(Cat. No …, 2002
562002
Probe and method of manufacturing mounted AFM probes
T Hantschel, W Vandervorst
US Patent 6,690,008, 2004
552004
Evaluation of the electrical contact area in contact-mode scanning probe microscopy
U Celano, T Hantschel, G Giammaria, RC Chintala, T Conard, H Bender, ...
Journal of Applied Physics 117 (21), 214305, 2015
532015
Carbon nanotube growth for through silicon via application
R Xie, C Zhang, MH Van der Veen, K Arstila, T Hantschel, B Chen, ...
Nanotechnology 24 (12), 125603, 2013
512013
Observation of diameter dependent carrier distribution in nanowire-based transistors
A Schulze, T Hantschel, P Eyben, AS Verhulst, R Rooyackers, ...
Nanotechnology 22 (18), 185701, 2011
492011
Scanning probe system with spring probe
T Hantschel, EM Chow, DK Fork
US Patent 6,668,628, 2003
482003
Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon
P Eyben, F Clemente, K Vanstreels, G Pourtois, T Clarysse, E Duriau, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2010
472010
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