| Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation B Beckhoff, R Fliegauf, M Kolbe, M Müller, J Weser, G Ulm Analytical chemistry 79 (20), 7873-7882, 2007 | 176 | 2007 |
| A new 28Si single crystal: counting the atoms for the new kilogram definition G Bartl, P Becker, B Beckhoff, H Bettin, E Beyer, M Borys, I Busch, L Cibik, ... Metrologia 54 (5), 693, 2017 | 120 | 2017 |
| Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry M Kolbe, B Beckhoff, M Krumrey, G Ulm Spectrochimica Acta Part B: Atomic Spectroscopy 60 (4), 505-510, 2005 | 105 | 2005 |
| Experimental search for the low-energy nuclear transition in 229Th with undulator radiation A Yamaguchi, M Kolbe, H Kaser, T Reichel, A Gottwald, E Peik New Journal of Physics 17 (5), 053053, 2015 | 91 | 2015 |
| Depth profile characterization of ultra shallow junction implants P Hönicke, B Beckhoff, M Kolbe, D Giubertoni, J van den Berg, G Pepponi Analytical and bioanalytical chemistry 396, 2825-2832, 2010 | 72 | 2010 |
| -subshell fluorescence yields and Coster-Kronig transition probabilities with a reliable uncertainty budget for selected high- and medium- elements M Kolbe, P Hoenicke, M Müller, B Beckhoff Physical Review A 86 (4), 042512, 2012 | 62 | 2012 |
| Attempt to optically excite the nuclear isomer in S Stellmer, G Kazakov, M Schreitl, H Kaser, M Kolbe, T Schumm Physical Review A 97 (6), 062506, 2018 | 59 | 2018 |
| Experimental Verification of the Individual Energy Dependencies of the Partial -Shell Photoionization Cross Sections of Pd and Mo P Hönicke, M Kolbe, M Müller, M Mantler, M Krämer, B Beckhoff Physical Review Letters 113 (16), 163001, 2014 | 41 | 2014 |
| Evaluation of high-resolution X-ray absorption and emission spectroscopy for the chemical speciation of binary titanium compounds F Reinhardt, B Beckhoff, H Eba, B Kanngiesser, M Kolbe, M Mizusawa, ... Analytical chemistry 81 (5), 1770-1776, 2009 | 38 | 2009 |
| Detector calibration and measurement of fundamental parameters for X-ray spectrometry F Scholze, B Beckhoff, M Kolbe, M Krumrey, M Müller, G Ulm Microchimica Acta 155, 275-278, 2006 | 31 | 2006 |
| Fundamental parameters of Zr and Ti for a reliable quantitative X‐ray fluorescence analysis M Kolbe, P Hönicke X‐Ray Spectrometry 44 (4), 217-220, 2015 | 30 | 2015 |
| Atomic layer deposition of high-κ dielectrics on sulphur-passivated germanium S Sioncke, HC Lin, G Brammertz, A Delabie, T Conard, A Franquet, ... Journal of The Electrochemical Society 158 (7), H687, 2011 | 30 | 2011 |
| Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils P Hönicke, M Kolbe, M Krumrey, R Unterumsberger, B Beckhoff Spectrochimica Acta Part B: Atomic Spectroscopy 124, 94-98, 2016 | 29 | 2016 |
| Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis F Reinhardt, J Osán, S Török, AE Pap, M Kolbe, B Beckhoff Journal of Analytical Atomic Spectrometry 27 (2), 248-255, 2012 | 28 | 2012 |
| A synchrotron-radiation-based variable angle ellipsometer for the visible to vacuum ultraviolet spectral range MD Neumann, C Cobet, H Kaser, M Kolbe, A Gottwald, M Richter, N Esser Review of Scientific Instruments 85 (5), 2014 | 26 | 2014 |
| Cascade L-shell soft-x-ray emission as incident x-ray photons are tuned across the 1 s ionization threshold D Sokaras, AG Kochur, M Mueller, M Kolbe, B Beckhoff, M Mantler, ... Physical Review A 83 (5), 052511, 2011 | 25 | 2011 |
| Determination of optical constants of thin films in the EUV R Ciesielski, Q Saadeh, V Philipsen, K Opsomer, JP Soulié, M Wu, ... Applied Optics 61 (8), 2060-2078, 2022 | 22 | 2022 |
| Towards passivation of Ge (100) surfaces by sulfur adsorption from a (NH4) 2S solution: A combined NEXAFS, STM and LEED study C Fleischmann, S Sioncke, S Couet, K Schouteden, B Beckhoff, M Müller, ... Journal of the Electrochemical Society 158 (5), H589, 2011 | 20 | 2011 |
| Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence P Hönicke, B Beckhoff, M Kolbe, S List, T Conard, H Struyff Spectrochimica Acta Part B: Atomic Spectroscopy 63 (12), 1359-1364, 2008 | 20 | 2008 |
| What are the correct L‐subshell photoionization cross sections for quantitative X‐ray spectroscopy? P Hönicke, M Kolbe, B Beckhoff X‐Ray Spectrometry 45 (4), 207-211, 2016 | 19 | 2016 |
Philipp HönickeHelmholtz-Zentrum Berlin and Physikalisch-Technische BundesanstaltVerified email at ptb.de
