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Samah Mohamed A. Saeed
Samah Mohamed A. Saeed
Assistant Professor of Electrical Engineering, City College, City University of New York
Verified email at ccny.cuny.edu
Title
Cited by
Cited by
Year
Activation of logic encrypted chips: Pre-test or post-test?
M Yasin, SM Saeed, J Rajendran, O Sinanoglu
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 139-144, 2016
762016
Novel test-mode-only scan attack and countermeasure for compression-based scan architectures
SS Ali, SM Saeed, O Sinanoglu, R Karri
IEEE transactions on computer-aided design of integrated circuits and …, 2015
642015
New scan-based attack using only the test mode
SS Ali, O Sinanoglu, SM Saeed, R Karri
2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration …, 2013
552013
CAD-Base: An attack vector into the electronics supply chain
K Basu, SM Saeed, C Pilato, M Ashraf, MT Nabeel, K Chakrabarty, R Karri
ACM Transactions on Design Automation of Electronic Systems (TODAES) 24 (4 …, 2019
462019
Survey on quantum circuit compilation for noisy intermediate-scale quantum computers: Artificial intelligence to heuristics
J Kusyk, SM Saeed, MU Uyar
IEEE Transactions on Quantum Engineering 2, 1-16, 2021
302021
A lightweight approach to detect malicious/unexpected changes in the error rates of NISQ computers
N Acharya, SM Saeed
Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020
292020
Test-mode-only scan attack and countermeasure for contemporary scan architectures
SM Saeed, SS Ali, O Sinanoglu, R Karri
2014 International Test Conference, 1-8, 2014
252014
New scan attacks against state-of-the-art countermeasures and DFT
SS Ali, O Sinanoglu, SM Saeed, R Karri
2014 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2014
242014
Scan attack in presence of mode-reset countermeasure
SS Ali, SM Saeed, O Sinanoglu, R Karri
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 230-231, 2013
242013
Design for testability support for launch and capture power reduction in launch-off-shift and launch-off-capture testing
SM Saeed, O Sinanoglu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (3), 516-521, 2013
242013
Probing geometric excitations of fractional quantum hall states on quantum computers
A Kirmani, K Bull, CY Hou, V Saravanan, SM Saeed, Z Papić, A Rahmani, ...
Physical Review Letters 129 (5), 056801, 2022
192022
Towards reverse engineering reversible logic
SM Saeed, X Cui, R Wille, A Zulehner, K Wu, R Drechsler, R Karri
arXiv preprint arXiv:1704.08397, 2017
182017
On the difficulty of inserting trojans in reversible computing architectures
X Cui, SM Saeed, A Zulehner, R Wille, K Wu, R Drechsler, R Karri
IEEE Transactions on Emerging Topics in Computing 8 (4), 960-972, 2018
172018
Reversible circuits: Ic/ip piracy attacks and countermeasures
SM Saeed, A Zulehner, R Wille, R Drechsler, R Karri
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (11 …, 2019
112019
DfT support for launch and capture power reduction in launch-off-capture testing
SM Saeed, O Sinanoglu
2012 17th IEEE European Test Symposium (ETS), 1-6, 2012
112012
Expedited response compaction for scan power reduction
SM Saeed, O Sinanoglu
29th VLSI Test Symposium, 40-45, 2011
112011
IC/IP piracy assessment of reversible logic
SM Saeed, X Cui, A Zulehner, R Wille, R Drechsler, K Wu, R Karri
2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2018
102018
New scan-based attack using only the test mode and an input corruption countermeasure
SS Ali, SM Saeed, O Sinanoglu, R Karri
VLSI-SoC: At the Crossroads of Emerging Trends: 21st IFIP WG 10.5/IEEE …, 2015
82015
Data-driven reliability models of quantum circuit: From traditional ml to graph neural network
V Saravanan, SM Saeed
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022
72022
Test points for online monitoring of quantum circuits
N Acharya, M Urbanek, WA De Jong, SM Saeed
ACM Journal on Emerging Technologies in Computing Systems (JETC) 18 (1), 1-19, 2021
72021
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