| Two-dimensional epitaxial superconductor-semiconductor heterostructures: A platform for topological superconducting networks J Shabani, M Kjærgaard, HJ Suominen, Y Kim, F Nichele, K Pakrouski, ... Physical Review B 93 (15), 155402, 2016 | 160* | 2016 |
| Field effect enhancement in buffered quantum nanowire networks F Krizek, JE Sestoft, P Aseev, S Marti-Sanchez, S Vaitiekėnas, L Casparis, ... Physical review materials 2 (9), 093401, 2018 | 54 | 2018 |
| Web-based biometric computer mouse advisory system to analyze a user's emotions and work productivity A Kaklauskas, EK Zavadskas, M Seniut, G Dzemyda, V Stankevic, ... Engineering Applications of Artificial Intelligence 24 (6), 928-945, 2011 | 53 | 2011 |
| Pulsed magnetic field measurement system based on colossal magnetoresistance-B-scalar sensors for railgun investigation T Stankevič, L Medišauskas, V Stankevič, S Balevičius, N Žurauskienė, ... Review of Scientific Instruments 85 (4), 044704, 2014 | 36 | 2014 |
| Structural properties of wurtzite InP–InGaAs nanowire core–shell heterostructures M Heurlin, T Stankevic, S Mickevičius, S Yngman, D Lindgren, ... Nano letters 15 (4), 2462-2467, 2015 | 33* | 2015 |
| Recommender system to analyze student’s academic performance A Kaklauskas, EK Zavadskas, M Seniut, V Stankevic, J Raistenskis, ... Expert Systems with Applications 40 (15), 6150-6165, 2013 | 33 | 2013 |
| Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire D Dzhigaev, A Shabalin, T Stankevič, U Lorenz, RP Kurta, F Seiboth, ... Journal of Optics 18 (6), 064007, 2016 | 30 | 2016 |
| Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam T Stankevič, D Dzhigaev, Z Bi, M Rose, A Shabalin, J Reinhardt, ... Applied Physics Letters 107 (10), 103101, 2015 | 28 | 2015 |
| Fast strain mapping of nanowire light-emitting diodes using nanofocused x-ray beams T Stankeviˇc, E Hilner, F Seiboth, R Ciechonski, G Vescovi, O Kryliouk, ... ACS nano 9 (7), 6978-6984, 2015 | 27 | 2015 |
| X-ray bragg ptychography on a single InGaN/GaN core–shell nanowire D Dzhigaev, T Stankevič, Z Bi, S Lazarev, M Rose, A Shabalin, ... ACS nano 11 (7), 6605-6611, 2017 | 20 | 2017 |
| Measurement of strain in InGaN/GaN nanowires and nanopyramids T Stankevič, S Mickevičius, M Schou Nielsen, O Kryliouk, R Ciechonski, ... Journal of Applied Crystallography 48 (2), 344-349, 2015 | 20 | 2015 |
| Magnetic diffusion inside the rails of an electromagnetic launcher: Experimental and numerical studies T Stankevič, M Schneider, S Balevičius IEEE Transactions on Plasma Science 41 (10), 2790-2795, 2013 | 19 | 2013 |
| Velocity-induced current profiles inside the rails of an electric launcher O Liebfried, M Schneider, T Stankevič, S Balevičius, N Žurauskienė IEEE Transactions on Plasma Science 41 (5), 1520-1525, 2013 | 15 | 2013 |
| First x-ray nanoimaging experiments at NanoMAX U Vogt, K Parfeniukas, T Stankevič, S Kalbfleisch, M Liebi, Z Matej, ... X-Ray Nanoimaging: Instruments and Methods III 10389, 103890K, 2017 | 9 | 2017 |
| Nanofocused x-ray beams applied for mapping strain in core-shell nanowires T Stankevič, D Dzhigaev, Z Bi, M Rose, A Shabalin, J Reinhardt, ... X-Ray Nanoimaging: Instruments and Methods II 9592, 95920D, 2015 | 9 | 2015 |
| Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography D Dzhigaev, T Stankevič, I Besedin, S Lazarev, A Shabalin, ... X-Ray Nanoimaging: Instruments and Methods II 9592, 95920S, 2015 | 9 | 2015 |
| Single pulse calibration of magnetic field sensors using mobile 43 kJ facility A Grainys, J Novickij, T Stankevič, V Stankevič, V Novickij, N Žurauskienė Measurement Science Review 15 (5), 244-247, 2015 | 7 | 2015 |
| Initial operation of the NanoMAX beamline at MAX IV U Johansson, D Carbone, S Kalbfleisch, A Bjorling, ... Microscopy and Microanalysis 24 (S2), 250-251, 2018 | 5 | 2018 |
| Self-assembled InN quantum dots on side facets of GaN nanowires Z Bi, M Ek, T Stankevic, J Colvin, M Hjort, D Lindgren, F Lenrick, ... Journal of Applied Physics 123 (16), 164302, 2018 | 5 | 2018 |
| Interferometric characterization of rotation stages for X-ray nanotomography T Stankevič, C Engblom, F Langlois, F Alves, A Lestrade, N Jobert, ... Review of Scientific Instruments 88 (5), 053703, 2017 | 5 | 2017 |
Voitech StankevicSemiconductor physics institute, Center for physical sciences and technologyVerified email at pfi.lt
