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Wouter Van den Broek
Wouter Van den Broek
Bestätigte E-Mail-Adresse bei physik.hu-berlin.de - Startseite
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Zitiert von
Jahr
Atomic-scale determination of surface facets in gold nanorods
B Goris, S Bals, W Van den Broek, E Carbó-Argibay, S Gómez-Graña, ...
Nature materials 11 (11), 930-935, 2012
3552012
Electron tomography based on a total variation minimization reconstruction technique
B Goris, W Van den Broek, KJ Batenburg, HH Mezerji, S Bals
Ultramicroscopy 113, 120-130, 2012
2532012
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert
Ultramicroscopy 171, 104-116, 2016
2022016
A novel quasi-one-dimensional topological insulator in bismuth iodide β-Bi4I4
G Autès, A Isaeva, L Moreschini, JC Johannsen, A Pisoni, R Mori, ...
Nature materials 15 (2), 154-158, 2016
1142016
Correction of non-linear thickness effects in HAADF STEM electron tomography
W Van den Broek, A Rosenauer, B Goris, GT Martinez, S Bals, S Van Aert, ...
Ultramicroscopy 116, 8-12, 2012
1002012
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scattering
W Van den Broek, CT Koch
Physical review letters 109 (24), 245502, 2012
702012
A practical method to determine the effective resolution in incoherent experimental electron tomography
HH Mezerji, W Van den Broek, S Bals
Ultramicroscopy 111 (5), 330-336, 2011
652011
Functional models of UMTS and integration into future networks
W Van Den Broek, AN Brydon, JM Cullen, S Kukkonen, A Lensink, ...
Electronics & communication engineering journal 5 (3), 165-172, 1993
491993
General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM
W Van den Broek, CT Koch
Physical Review B 87 (18), 184108, 2013
462013
A holographic method to measure the source size broadening in STEM
J Verbeeck, A Béché, W Van den Broek
Ultramicroscopy 120, 35-40, 2012
422012
Crystal Growth and Real Structure Effects of the First Weak 3D Stacked Topological Insulator Bi14Rh3I9
B Rasche, A Isaeva, A Gerisch, M Kaiser, W Van den Broek, CT Koch, ...
Chemistry of Materials 25 (11), 2359-2364, 2013
372013
Optimization of a FIB/SEM slice‐and‐view study of the 3D distribution of Ni4Ti3 precipitates in Ni–Ti
S Cao, W Tirry, W Van Den Broek, D Schryvers
Journal of microscopy 233 (1), 61-68, 2009
342009
Modular Design with 2D Topological-Insulator Building Blocks: Optimized Synthesis and Crystal Growth and Crystal and Electronic Structures of BixTeI (x = 2, 3)
A Zeugner, M Kaiser, P Schmidt, TV Menshchikova, IP Rusinov, ...
Chemistry of Materials 29 (3), 1321-1337, 2017
322017
FDES, a GPU-based multislice algorithm with increased efficiency of the computation of the projected potential
W Van den Broek, X Jiang, CT Koch
Ultramicroscopy 158, 89-97, 2015
322015
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy
W Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy 110 (5), 548-554, 2010
312010
Exploring different inelastic projection mechanisms for electron tomography
B Goris, S Bals, W Van den Broek, J Verbeeck, G Van Tendeloo
Ultramicroscopy 111 (8), 1262-1267, 2011
292011
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
M Schloz, TC Pekin, Z Chen, W Van den Broek, DA Muller, CT Koch
Optics Express 28 (19), 28306-28323, 2020
282020
Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network
RS Pennington, W Van den Broek, CT Koch
Physical Review B 89 (20), 205409, 2014
282014
Defocus and twofold astigmatism correction in HAADF-STEM
ME Rudnaya, W Van den Broek, RMP Doornbos, RMM Mattheij, ...
Ultramicroscopy 111 (8), 1043-1054, 2011
262011
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency
W Van den Broek, S Van Aert, D Van Dyck
Microscopy and Microanalysis 18 (2), 336-342, 2012
222012
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