Philipp Michael Pelz
Philipp Michael Pelz
Postdoctoral Researcher, UC Berkeley
Verified email at - Homepage
Cited by
Cited by
On-the-fly scans for X-ray ptychography
PM Pelz, M Guizar-Sicairos, P Thibault, I Johnson, M Holler, A Menzel
Applied Physics Letters 105 (25), 251101, 2014
Low-dose cryo electron ptychography via non-convex Bayesian optimization
PM Pelz, WX Qiu, B Robert, G Kassier, RJD Miller
Scientific Reports, 9883, 2017
Photo-double-ionization of ethylene and acetylene near threshold
B Gaire, SY Lee, DJ Haxton, PM Pelz, I Bocharova, FP Sturm, N Gehrken, ...
Physical Review A 89 (1), 013403, 2014
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
BH Savitzky, LA Hughes, SE Zeltmann, HG Brown, S Zhao, PM Pelz, ...
arXiv preprint arXiv:2003.09523, 2020
The 4D Camera–An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments
P Ercius, I Johnson, H Brown, P Pelz, SL Hsu, B Draney, E Fong, ...
Microscopy and Microanalysis 26 (S2), 1896-1897, 2020
Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
PM Pelz, HG Brown, J Ciston, SD Findlay, Y Zhang, M Scott, C Ophus
arXiv preprint arXiv:2008.12768, 2020
py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
BH Savitzky, SE Zeltmann, LA Hughes, HG Brown, S Zhao, PM Pelz, ...
Microscopy and Microanalysis, 1-32, 2021
A three-dimensional reconstruction algorithm for scanning transmission electron microscopy data from thick samples
HG Brown, PM Pelz, SL Hsu, Z Zhang, R Ramesh, K Inzani, E Sheridan, ...
arXiv preprint arXiv:2011.07652, 2020
Phase Contrast Imaging in Thick, Heterogeneous Samples via S-Matrix Phase Retrieval and Depth Sectioning
P Pelz, H Brown, S Findlay, M Scott, J Ciston, C Ophus
Microscopy and Microanalysis 26 (S2), 462-464, 2020
Advanced Phase Reconstruction Methods Enabled by Four-Dimensional Scanning Transmission Electron Microscopy
C Ophus, TR Harvey, FS Yasin, HG Brown, PM Pelz, BH Savitzky, ...
Microscopy and Microanalysis 25 (S2), 10-11, 2019
Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm
W Van den Broek, M Schloz, TC Pekin, PM Pelz, PH Lu, M Kruth, V Grillo, ...
Microscopy and Microanalysis 25 (S2), 58-59, 2019
Electron Ptychography of Single Biological Macromolecules
PM Pelz, R Bücker, G Ramm, H Venugopal, G Kassier, D Eggert, PH Lu, ...
Microscopy and Microanalysis 25 (S2), 72-73, 2019
Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations
C Ophus, H Brown, LR Dacosta, P Pelz, J Schwartz, R Yalisove, ...
Microscopy and Microanalysis 26 (S2), 456-458, 2020
Engineering Chiral Structures Through Strain Release: Electron Tomography Study of Twisted Nanowires
X Song, A Bruefach, PM Pelz, H Devyldere, M Scott
Microscopy and Microanalysis 25 (S2), 1804-1805, 2019
A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations
PM Pelz, A Rakowski, LR DaCosta, BH Savitzky, MC Scott, C Ophus
Microscopy and Microanalysis, 1-14, 2021
Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix
PM Pelz, HG Brown, S Stonemeyer, SD Findlay, A Zettl, P Ercius, Y Zhang, ...
Physical Review Research 3 (2), 023159, 2021
Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data
PM Pelz, I Johnson, C Ophus, P Ercius, MC Scott
arXiv preprint arXiv:2104.06336, 2021
A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations
PM Pelz, A Rakowski, LR DaCosta, BH Savitzky, MC Scott, C Ophus
arXiv preprint arXiv:2104.01496, 2021
Scalable multicomponent spectral analysis for high-throughput data annotation
RP Xian, R Ernstorfer, PM Pelz
arXiv preprint arXiv:2102.05604, 2021
Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography
R Yalisove, SH Sung, J Schwartz, C Groschner, P Pelz, H Zheng, Y Jiang, ...
Microscopy and Microanalysis 26 (S2), 1860-1862, 2020
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