| Upset hardened memory design for submicron CMOS technology T Calin, M Nicolaidis, R Velazco IEEE Transactions on nuclear science 43 (6), 2874-2878, 1996 | 1404 | 1996 |
| Time redundancy based soft-error tolerance to rescue nanometer technologies M Nicolaidis Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 86-94, 1999 | 651 | 1999 |
| Design for soft error mitigation M Nicolaidis IEEE Transactions on Device and Materials Reliability 5 (3), 405-418, 2005 | 490 | 2005 |
| On-line testing for VLSI—a compendium of approaches M Nicolaidis, Y Zorian Journal of Electronic Testing 12 (1), 7-20, 1998 | 441 | 1998 |
| Soft errors in modern electronic systems M Nicolaidis Springer Science & Business Media, 2010 | 341 | 2010 |
| Cost reduction and evaluation of a temporary faults-detecting technique L Anghel, M Nicolaidis Design, Automation, and Test in Europe, 423-438, 2008 | 257 | 2008 |
| Transparent bist for rams M Nicolaidis Proceedings-International-Test-Conference-1992-Cat.-No. 92CH3191-4. 1992 …, 1992 | 237* | 1992 |
| Embedded robustness IPs for transient-error-free ICs E Dupont, M Nicolaidis, P Rohr IEEE Design & Test of Computers 19 (03), 56-70, 2002 | 176 | 2002 |
| Evaluation of a soft error tolerance technique based on time and/or space redundancy L Anghel, D Alexandrescu, M Nicolaidis Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000 | 160 | 2000 |
| Carry checking/parity prediction adders and ALUs M Nicolaidis IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 (1), 121-128, 2003 | 157 | 2003 |
| An SFS Berger check prediction ALU and its application to self-checking processor designs JC Lo, S Thanawastien, TRN Rao, M Nicolaidis IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1992 | 153 | 1992 |
| Theory of transparent BIST for RAMs M Nicolaidis IEEE Transactions on Computers 45 (10), 1141-1156, 1996 | 138 | 1996 |
| Efficient implementations of self-checking adders and ALUs M Nicolaidis FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing …, 1993 | 132 | 1993 |
| SEU-tolerant SRAM design based on current monitoring F Vargas, M Nicolaidis Proceedings of IEEE 24th International Symposium on Fault-Tolerant Computing …, 1994 | 131 | 1994 |
| Low-cost highly-robust hardened cells using blocking feedback transistors M Nicolaidis, R Perez, D Alexandrescu 26th IEEE VLSI Test Symposium (vts 2008), 371-376, 2008 | 107 | 2008 |
| Fault-secure parity prediction arithmetic operators M Nicolaidis, RO Duarte, S Manich, J Figueras IEEE Design & Test of Computers 14 (2), 60-71, 1997 | 105 | 1997 |
| Measurement of inclusive spin structure functions of the deuteron J Yun, SE Kuhn, GE Dodge, TA Forest, M Taiuti, GS Adams, MJ Amaryan, ... Physical Review C 67 (5), 055204, 2003 | 100 | 2003 |
| Strongly code disjoint checkers M Nicolaidis, B Courtois IEEE Transactions on Computers 37 (6), 751-756, 1988 | 96 | 1988 |
| New methods for evaluating the impact of single event transients in VDSM ICs D Alexandrescu, L Anghel, M Nicolaidis 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002 | 92 | 2002 |
| An efficient BICS design for SEUs detection and correction in semiconductor memories B Gill, M Nicolaidis, F Wolff, C Papachristou, S Garverick Design, Automation and Test in Europe, 592-597, 2005 | 91 | 2005 |
