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m nicolaidis
m nicolaidis
TIMA Laboratory
Verified email at imag.fr
Title
Cited by
Cited by
Year
Upset hardened memory design for submicron CMOS technology
T Calin, M Nicolaidis, R Velazco
IEEE Transactions on nuclear science 43 (6), 2874-2878, 1996
14041996
Time redundancy based soft-error tolerance to rescue nanometer technologies
M Nicolaidis
Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 86-94, 1999
6511999
Design for soft error mitigation
M Nicolaidis
IEEE Transactions on Device and Materials Reliability 5 (3), 405-418, 2005
4902005
On-line testing for VLSI—a compendium of approaches
M Nicolaidis, Y Zorian
Journal of Electronic Testing 12 (1), 7-20, 1998
4411998
Soft errors in modern electronic systems
M Nicolaidis
Springer Science & Business Media, 2010
3412010
Cost reduction and evaluation of a temporary faults-detecting technique
L Anghel, M Nicolaidis
Design, Automation, and Test in Europe, 423-438, 2008
2572008
Transparent bist for rams
M Nicolaidis
Proceedings-International-Test-Conference-1992-Cat.-No. 92CH3191-4. 1992 …, 1992
237*1992
Embedded robustness IPs for transient-error-free ICs
E Dupont, M Nicolaidis, P Rohr
IEEE Design & Test of Computers 19 (03), 56-70, 2002
1762002
Evaluation of a soft error tolerance technique based on time and/or space redundancy
L Anghel, D Alexandrescu, M Nicolaidis
Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000
1602000
Carry checking/parity prediction adders and ALUs
M Nicolaidis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 (1), 121-128, 2003
1572003
An SFS Berger check prediction ALU and its application to self-checking processor designs
JC Lo, S Thanawastien, TRN Rao, M Nicolaidis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1992
1531992
Theory of transparent BIST for RAMs
M Nicolaidis
IEEE Transactions on Computers 45 (10), 1141-1156, 1996
1381996
Efficient implementations of self-checking adders and ALUs
M Nicolaidis
FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing …, 1993
1321993
SEU-tolerant SRAM design based on current monitoring
F Vargas, M Nicolaidis
Proceedings of IEEE 24th International Symposium on Fault-Tolerant Computing …, 1994
1311994
Low-cost highly-robust hardened cells using blocking feedback transistors
M Nicolaidis, R Perez, D Alexandrescu
26th IEEE VLSI Test Symposium (vts 2008), 371-376, 2008
1072008
Fault-secure parity prediction arithmetic operators
M Nicolaidis, RO Duarte, S Manich, J Figueras
IEEE Design & Test of Computers 14 (2), 60-71, 1997
1051997
Measurement of inclusive spin structure functions of the deuteron
J Yun, SE Kuhn, GE Dodge, TA Forest, M Taiuti, GS Adams, MJ Amaryan, ...
Physical Review C 67 (5), 055204, 2003
1002003
Strongly code disjoint checkers
M Nicolaidis, B Courtois
IEEE Transactions on Computers 37 (6), 751-756, 1988
961988
New methods for evaluating the impact of single event transients in VDSM ICs
D Alexandrescu, L Anghel, M Nicolaidis
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002
922002
An efficient BICS design for SEUs detection and correction in semiconductor memories
B Gill, M Nicolaidis, F Wolff, C Papachristou, S Garverick
Design, Automation and Test in Europe, 592-597, 2005
912005
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