| Transparent arrays of bilayer-nanomesh microelectrodes for simultaneous electrophysiology and two-photon imaging in the brain Y Qiang, P Artoni, KJ Seo, S Culaclii, V Hogan, X Zhao, Y Zhong, X Han, ... Science advances 4 (9), eaat0626, 2018 | 133 | 2018 |
| Template-free construction of tin oxide porous hollow microspheres for room-temperature gas sensors L Zhou, Z Hu, HY Li, J Liu, Y Zeng, J Wang, Y Huang, L Miao, G Zhang, ... ACS Applied Materials & Interfaces 13 (21), 25111-25120, 2021 | 34 | 2021 |
| Electron irradiation-induced defects for reliability improvement in monolayer MoS2-based conductive-point memory devices X Wu, Y Gu, R Ge, MI Serna, Y Huang, JC Lee, D Akinwande npj 2D Materials and Applications 6 (1), 31, 2022 | 22 | 2022 |
| Sulfurization Engineering of One‐Step Low‐Temperature MoS2 and WS2 Thin Films for Memristor Device Applications Y Gu, MI Serna, S Mohan, A Londoño‐Calderon, T Ahmed, Y Huang, ... Advanced Electronic Materials, 2100515, 2021 | 16 | 2021 |
| ReSe2-Based RRAM and Circuit-Level Model for Neuromorphic Computing Y Huang, Y Gu, X Wu, R Ge, YF Chang, X Wang, J Zhang, D Akinwande, ... Frontiers in Nanotechnology 3, 782836, 2021 | 11 | 2021 |
| Resistance state evolution under constant electric stress on a MoS 2 non-volatile resistive switching device X Wu, R Ge, Y Huang, D Akinwande, JC Lee RSC advances 10 (69), 42249-42255, 2020 | 10 | 2020 |
| Reliability Improvement and Effective Switching Layer Model of Thin‐Film MoS2 Memristors Y Huang, Y Gu, S Mohan, A Dolocan, ND Ignacio, S Kutagulla, ... Advanced Functional Materials 34 (15), 2214250, 2024 | 9 | 2024 |
| Embedded emerging memory technologies for neuromorphic computing: Temperature instability and reliability YF Chang, I Karpov, R Hopkins, D Janosky, J Medeiros, B Sherrill, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 7 | 2021 |
| “Cut-and-paste” method for the rapid prototyping of soft electronics XX Yang, YF Huang, ZH Dai, J Barber, PL Wang, NS Lu Science China Technological Sciences 62, 199-208, 2019 | 6 | 2019 |
| Effect of temperature on analog memristor in neuromorphic computing Y Huang, R Hopkins, D Janosky, YC Chen, YF Chang, JC Lee IEEE Transactions on Electron Devices 69 (11), 6102-6105, 2022 | 4 | 2022 |
| On the stochastic nature of conductive points formation and their effects on reliability of MoS2 RRAM: Experimental characterization and Monte Carlo simulation Y Huang, X Wu, Y Gu, R Ge, D Akinwande, JC Lee Microelectronics Reliability 126, 114274, 2021 | 4 | 2021 |
| Understanding the resistive switching mechanism of 2-D RRAM: Monte Carlo modeling and a proposed application for reliability research Y Huang, Y Gu, YF Chang, YC Chen, D Akinwande, JC Lee IEEE Transactions on Electron Devices 70 (4), 1676-1681, 2023 | 2 | 2023 |
| Nano Helical-Shaped Dual-Functional Resistive Memory for Low-Power Crossbar Array Application YC Chen, S Sarkar, JG Gibbs, Y Huang, JC Lee, CC Lin, CH Lin ACS Applied Engineering Materials 1 (1), 252-257, 2022 | 1 | 2022 |
| Direct-Grown Helical-Shaped Tungsten-Oxide-Based Devices with Reconfigurable Selectivity for Memory Applications YC Chen, Y Huang, S Sarkar, J Gibbs, J Lee Journal of Low Power Electronics and Applications 12 (4), 55, 2022 | 1 | 2022 |
| 2D RRAM and Verilog-A model for Neuromorphic Computing Y Huang, X Wu, Y Gu, R Ge, J Zhang, YF Chang, D Akinwande, JC Lee 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), 1-4, 2021 | 1 | 2021 |
| Self-Selective Dielectric-Fuse Effect with Ambient Factors in Oxide-Based Memory YC Chen, Y Huang, JC Lee, JB Stouffer ECS Journal of Solid State Science and Technology 12 (6), 065003, 2023 | | 2023 |
| 2D memristor reliability and modeling for neuromorphic computing Y Huang | | 2023 |
| Understanding of the Interaction between Electrical and Thermal Properties on Bifunctional Memristors and Reprogrammable Memory J Stouffer, YC Chen, YF Chang, Y Huang APS March Meeting Abstracts 2023, Q34. 003, 2023 | | 2023 |
| Understand the Resistive Switching and Reliability Mechanisms of 2D TMD Material: Defect Engineering, Finite Element Analysis and Monte Carlo Modeling Y Huang, Y Gu, X Wu, R Ge, YF Chang, YC Chen, D Akinwande, J Lee APS March Meeting Abstracts 2023, T00. 253, 2023 | | 2023 |
| Understand the Resistive Switching Mechanism of 2D RRAM by Monte Carlo Modeling Yifu Huang, Yuqian Gu, Yao-Feng Chang, Deji Akinwande, Jack C. Lee 53rd IEEE Semiconductor Interface Specialists Conference (SISC), 2022 | | 2022 |
Jack C. LeeThe University of Texas at Austin, IEEE FellowBestätigte E-Mail-Adresse bei austin.utexas.edu
