| Optical design of color light-emitting diode ring light for machine vision inspection J Dong, R Lu, Y Shi, R Xia, Q Li, Y Xu Optical Engineering 50 (4), 043001-043001-11, 2011 | 40 | 2011 |
| Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry J Dong, R Lu Applied Optics 51 (23), 5668-5675, 2012 | 37 | 2012 |
| Line-scanning laser scattering system for fast defect inspection of a large aperture surface J Dong Applied Optics 56 (25), 7089-7098, 2017 | 32 | 2017 |
| Development of a cross-scale weighted feature fusion network for hot-rolled steel surface defect detection Y Zhang, W Wang, Z Li, S Shu, X Lang, T Zhang, J Dong Engineering Applications of Artificial Intelligence 117, 105628, 2023 | 29 | 2023 |
| Characterization of weakly absorbing thin films by multiple linear regression analysis of absolute unwrapped phase in angle-resolved spectral reflectometry J Dong, R Lu Optics Express 26 (9), 12291-12305, 2018 | 16 | 2018 |
| Three-dimensional photothermal microscopy of KDP crystals J Chen, J Dong, Q Zhang, Z Wu Interferometry XVII: Techniques and Analysis 9203, 250-255, 2014 | 12 | 2014 |
| Automated determination of best focus and minimization of optical path difference in Linnik white light interferometry J Dong, R Lu, Y Li, K Wu Applied Optics 50 (30), 5861-5871, 2011 | 12 | 2011 |
| A five-point stencil based algorithm used for phase shifting low-coherence interference microscopy J Dong, R Lu Optics and lasers in engineering 50 (3), 502-511, 2012 | 10 | 2012 |
| Robust dynamic phase-shifting common-path shearography using LCPG and pixelated micropolarizer array P Yan, X Liu, J Dong, Y Wang, B Wang, J Li, F Sun Optics and Lasers in Engineering 153, 106997, 2022 | 9 | 2022 |
| Calibration and measurement performance analysis for a spectral band charge-coupled-device-based pyrometer Y Zhang, W Zhang, Z Dong, S Shu, J Dong, C Xing Review of Scientific Instruments 91 (6), 2020 | 9 | 2020 |
| Effects of sample surface morphology on laser-induced breakdown spectroscopy L Yang, Y Zhang, Z Zhang, Y Li, Y Xiang, J Dong, Y Wei, S Chang, R Lu Journal of Analytical Atomic Spectrometry 37 (8), 1642-1651, 2022 | 6 | 2022 |
| Heat coupling effect on photothermal detection with a moving Gaussian excitation beam J Dong, R Lu Applied Optics 58 (31), 8695-8701, 2019 | 6 | 2019 |
| Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP Z Wu, J Chen, J Dong Third International Symposium on Laser Interaction with Matter 9543, 435-441, 2015 | 6 | 2015 |
| Development of a" turn-key" system for weak absorption measurement and analysis J Chen, J Dong, Z Wu Pacific Rim Laser Damage 2013: Optical Materials for High Power Lasers 8786 …, 2013 | 6 | 2013 |
| Achromatic phase shifter with eight times magnification of rotation angle in low coherence interference microscopy J Dong, R Lu Applied Optics 50 (8), 1113-1123, 2011 | 6 | 2011 |
| Dynamic non-uniform phase shift measurement via Doppler frequency shift in vortex interferometer J Dong, Z Tian, S Wang, L Xie, Y Li, E Zhao Optics Letters 48 (8), 2018-2021, 2023 | 5 | 2023 |
| Dual-wavelength Mach-Zehnder interferometry-assisted photothermal spectroscopy for characterization of surface contaminants J Dong, P Yan, L Yang, Y Zhang, T Zhang, L Zhang, S Zhou, J Li Optics Express 28 (20), 29865-29875, 2020 | 5 | 2020 |
| Dual-loop Sagnac interferometer with a geometric phase shifter for quadrature phase bias locking J Dong, R Lu Optics Letters 44 (22), 5422-5425, 2019 | 5 | 2019 |
| Multi-channel averaging detection for fast imaging of weakly absorbing defects in surface thermal lensing J Dong, R Lu, T Zhang, L Yang, Y Zhang, Z Wu, J Chen Review of Scientific Instruments 89 (11), 2018 | 4 | 2018 |
| In-situ investigation of damage processes on fused silica induced by a pulsed 355nm laser with high repetition rate J Chen, J Dong, Z Wu High Power Lasers for Fusion Research III 9345, 56-61, 2015 | 4 | 2015 |
