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Guilherme Cardoso Medeiros
Guilherme Cardoso Medeiros
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Device-Aware Test: A New test Approach Towards DPPB Level
M Fieback, L Wu, GC Medeiros, H Aziza, S Rao, EJ Marinissen, M Taouil, ...
2019 IEEE International Test Conference (ITC), 1-10, 2019
332019
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits
M Jenihhin, G Squillero, TS Copetti, V Tihhomirov, S Kostin, M Gaudesi, ...
Journal of Electronic Testing 32 (3), 273-289, 2016
202016
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing
L Wu, S Rao, GC Medeiros, M Taouil, EJ Marinissen, F Yasin, S Couet, ...
2019 IEEE European Test Symposium (ETS), 1-6, 2019
192019
Defect and Fault Modeling Framework for STT-MRAM Testing
L Wu, S Rao, M Taouil, GC Medeiros, M Fieback, EJ Marinissen, GS Kar, ...
IEEE Transactions on Emerging Topics in Computing, 2019
162019
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
AF Gomez, F Lavratti, G Medeiros, M Sartori, LB Poehls, V Champac, ...
Microelectronics Reliability 67, 150-158, 2016
142016
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs
GC Medeiros, M Taouil, M Fieback, LB Poehls, S Hamdioui
2019 IEEE European Test Symposium (ETS), 1-2, 2019
112019
Analyzing the behavior of FinFET SRAMs with resistive defects
TS Copetti, TR Balen, GC Medeiros, LMB Poehls
2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017
112017
Hard-to-Detect Fault Analysis in FinFET SRAMs
GC Medeiros, M Fieback, L Wu, M Taouil, LMB Poehls, S Hamdioui
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2021
92021
Intermittent Undefined State Fault in RRAMs
M Fieback, GC Medeiros, A Gebregiorgis, H Aziza, M Taouil, S Hamdioui
2021 IEEE European Test Symposium (ETS), 1-6, 2021
82021
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs
GC Medeiros, LMB Poehls, M Taouil, FL Vargas, S Hamdioui
Microelectronics Reliability 88, 355-359, 2018
72018
Detecting random read faults to reduce test escapes in FinFET SRAMs
GC Medeiros, M Fieback, A Gebregiorgis, M Taouil, LB Poehls, ...
2021 IEEE European Test Symposium (ETS), 1-6, 2021
52021
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
GC Medeiros, CC Gürsoy, L Wu, M Fieback, M Jenihhin, M Taouil, ...
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 792-797, 2020
52020
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs
G Medeiros, E Brum, LB Poehls, T Copetti, T Balen
2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018
52018
Analysing NBTI Impact on SRAMs with Resistive Defects
MT Martins, GC Medeiros, T Copetti, FL Vargas, LMB Poehls
Journal of Electronic Testing 33 (5), 637-655, 2017
52017
Analyzing NBTI impact on SRAMs with resistive-open defects
MT Martins, G Medeiros, T Copetti, F Vargas, LB Poehls
2016 17th Latin-American Test Symposium (LATS), 87-92, 2016
52016
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects
GC Medeiros, LB Poehls, FF Vargas
2016 29th International Conference on VLSI Design and 2016 15th …, 2016
52016
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects
T Copetti, GC Medeiros, M Taouil, S Hamdioui, LB Poehls, T Balen
Journal of Electronic Testing, 1-12, 2021
32021
Evaluating the Impact of Ionizing Particles on FinFET-based SRAMs with Weak Resistive Defects
T Copetti, GC Medeiros, M Taouil, S Hamdioui, LB Poehls, T Balen
2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020
32020
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs
TS Copetti, GC Medeiros, LMB Poehls, TR Balen
IFIP/IEEE International Conference on Very Large Scale Integration-System on …, 2017
32017
Gate-level modelling of NBTI-induced delays under process variations
T Copetti, G Medeiros, LB Poehls, F Vargas, S Kostin, M Jenihhin, J Raik, ...
2016 17th Latin-American Test Symposium (LATS), 75-80, 2016
32016
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