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Yuxi Ma
Yuxi Ma
Failure Analysis Engineer
Verified email at catl.com
Title
Cited by
Cited by
Year
Advances in materials design for all-solid-state batteries: from bulk to thin films
G Yang, C Abraham, Y Ma, M Lee, E Helfrick, D Oh, D Lee
Applied Sciences 10 (14), 4727, 2020
362020
Mechanical, thermal, and electrochemical properties of Pr doped ceria from wafer curvature measurements
Y Ma, JD Nicholas
Physical Chemistry Chemical Physics 20 (43), 27350-27360, 2018
142018
Fe3O4/ZrO2 Composite as a Robust Chemical Looping Oxygen Carrier: A Kinetics Study on the Reduction Process
Q Tang, Y Ma, K Huang
ACS Applied Energy Materials 4 (7), 7091-7100, 2021
112021
Patterned nickel interlayers for enhanced silver wetting, spreading and adhesion on ceramic substrates
G Hu, Q Zhou, A Bhatlawande, J Park, R Termuhlen, Y Ma, TR Bieler, ...
Scripta Materialia 196, 113767, 2021
102021
Silicon contamination of the praseodymium doped ceria oxygen surface exchange coefficient
Y Ma, JD Nicholas
Journal of the Electrochemical Society 168 (10), 104518, 2021
62021
Pt Current Collectors Artificially Boosting Praseodymium Doped Ceria Oxygen Surface Exchange Coefficients
Y Ma, TE Burye, JD Nicholas
Journal of Materials Chemistry A, 2021
42021
In Situ Stress, Elastic Constant, Oxygen Surface Exchange Coefficient, and Thermo-Chemical Expansion Coefficient Measurements on Praseodymium Doped Ceria Thin Films
Y Ma, JD Nicholas
ECS Transactions 78 (1), 395, 2017
22017
High temperature thermo-mechanical properties of praseodymium doped ceria thin films measured two ways
Y Ma, Q Zhou, JD Nicholas
Materials Advances 3 (3), 1574-1580, 2022
12022
Pt Current Collectors Artificially Boosting Ceria Oxygen Surface Exchange Coefficients
Y Ma, TE Burye, J Nicholas
Electrochemical Society Meeting Abstracts 243, 227-227, 2023
2023
Pt Current Collectors Artificially Boosting Si-Contaminated Praseodymium Doped Ceria Oxygen Surface Exchange Coefficients
Y Ma, T Burye, J Nicholas
Electrochemical Society Meeting Abstracts 241, 1622-1622, 2022
2022
High Performance Circuit Pastes for Solid Oxide Fuel Cell Applications
G Hu, Q Zhou, A Bhatlawande, J Park, R Termuhlen, Y Ma, TR Bieler, ...
2020
Mechano-Electro-Chemical Insights into the Danger of Using Precious Metal Electrodes for Oxygen Surface Exchange Measurements
Y Ma, JD Nicholas
Electrochemical Society Meeting Abstracts 237, 1799-1799, 2020
2020
A Comparison of Strontium Titanium Iron Oxide Perovskite Oxygen Surface Exchange Coefficients Obtained from Wafer Curvature vs. Optical Relaxation
Y Ma, T Chen, NH Perry, JD Nicholas
Electrochemical Society Meeting Abstracts 236, 1852-1852, 2019
2019
(Invited) Surface Contaminant Effects on the Properties of Pr-Doped Ceria Determined Via Wafer Curvature and X-Ray Diffraction Measurements
Y Ma, JD Nicholas
Electrochemical Society Meeting Abstracts 236, 1880-1880, 2019
2019
Mechanical, Thermal, and Electrochemical Properties of Mixed Ionic Electronic Conductors from Wafer Curvature Measurements
Y Ma
Michigan State University, 2019
2019
Using Mechano-Electro-Chemical Coupling to Measure the Thin Film Elastic Constants, Thermo-Chemical Expansion Coefficients, and Oxygen Surface Exchange Coefficients of …
Y Ma, JD Nicholas
Electrochemical Society Meeting Abstracts 233, 1942-1942, 2018
2018
Ni-Ta-Si Brazes for Planar Solid Oxide Fuel Cell Applications
Q Zhou, T Das, Y Ma, Y Qi, JD Nicholas, T Bieler
Electrochemical Society Meeting Abstracts 230, 1118-1118, 2016
2016
Praseodymium Doped Ceria Oxygen Surface Exchange Coefficient and Film Stress Measurements Via the Curvature Relaxation Technique
Y Ma, JD Nicholas
Electrochemical Society Meeting Abstracts 230, 4103-4103, 2016
2016
In Situ, Non-Contact Studies of Oxygen Exchange Kinetics in Thin Film Mixed Conducting Electrodes
NH Perry, T Chen, K Sasaki, JJ Kim, Y Ma, JD Nicholas, HL Tuller
Electrochemical Society Meeting Abstracts 230, 3079-3079, 2016
2016
Patterned Nickel Interlayers for Enhanced Silver Wetting, Spreading and Adhesion on Ceramic Substrates
J Nicholas, Q Zhou, A Bhatlawande, J Park, R Termuhlen, Y Ma, TR Bieler, ...
Scripta Materialia, 0
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