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Siyu Isaac Parker Tian
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Year
Accelerated development of perovskite-inspired materials via high-throughput synthesis and machine-learning diagnosis
S Sun, NTP Hartono, ZD Ren, F Oviedo, AM Buscemi, M Layurova, ...
Joule 3 (6), 1437-1451, 2019
2452019
Fast and interpretable classification of small X-ray diffraction datasets using data augmentation and deep neural networks
F Oviedo, Z Ren, S Sun, C Settens, Z Liu, NTP Hartono, S Ramasamy, ...
npj Computational Materials 5 (1), 60, 2019
2322019
Two-step machine learning enables optimized nanoparticle synthesis
F Mekki-Berrada, Z Ren, T Huang, WK Wong, F Zheng, J Xie, IPS Tian, ...
npj Computational Materials 7 (1), 55, 2021
1182021
An invertible crystallographic representation for general inverse design of inorganic crystals with targeted properties
Z Ren, SIP Tian, J Noh, F Oviedo, G Xing, J Li, Q Liang, R Zhu, AG Aberle, ...
Matter 5 (1), 314-335, 2022
1012022
Embedding physics domain knowledge into a Bayesian network enables layer-by-layer process innovation for photovoltaics
Z Ren, F Oviedo, M Thway, SIP Tian, Y Wang, H Xue, J Dario Perea, ...
npj Computational Materials 6 (1), 9, 2020
392020
Inverse design of crystals using generalized invertible crystallographic representation
Z Ren, J Noh, S Tian, F Oviedo, G Xing, Q Liang, A Aberle, Y Liu, Q Li, ...
arXiv preprint arXiv:2005.07609 3 (6), 7, 2020
352020
Multi‐fidelity high‐throughput optimization of electrical conductivity in P3HT‐CNT composites
D Bash, Y Cai, V Chellappan, SL Wong, X Yang, P Kumar, JD Tan, ...
Advanced Functional Materials 31 (36), 2102606, 2021
332021
Physics-guided characterization and optimization of solar cells using surrogate machine learning model
Z Ren, F Oviedo, H Xue, M Thway, K Zhang, N Li, JD Perea, M Layurova, ...
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 3054-3058, 2019
202019
2019 IEEE 46th Photovoltaic Specialists Conf.(PVSC)
Z Ren, F Oviedo, H Xue, M Thway, K Zhang, N Li, JD Perea, M Layurova, ...
IEEE, 2019
112019
Machine learning and high-throughput robust design of P3HT-CNT composite thin films for high electrical conductivity
D Bash, Y Cai, V Chellappan, SL Wong, Y Xu, P Kumar, J Da Tan, ...
arXiv preprint arXiv:2011.10382, 2020
92020
Bridging the gap between photovoltaics R&D and manufacturing with data-driven optimization
F Oviedo, Z Ren, X Hansong, SIP Tian, K Zhang, M Layurova, ...
arXiv preprint arXiv:2004.13599, 2020
92020
An open-source environmental chamber for materials-stability testing using an optical proxy
R Keesey, A Tiihonen, AE Siemenn, TW Colburn, S Sun, NTP Hartono, ...
Digital Discovery 2 (2), 422-440, 2023
72023
Accelerating photovoltaic materials development via high-throughput experiments and machine-learning-assisted diagnosis
S Sun, NTP Hartono, ZD Ren, F Oviedo, AM Buscemi, M Layurova, ...
arXiv preprint arXiv:1812.01025, 2018
72018
Predicting synthesizability using machine learning on databases of existing inorganic materials
R Zhu, SIP Tian, Z Ren, J Li, T Buonassisi, K Hippalgaonkar
ACS omega 8 (9), 8210-8218, 2023
62023
Polymer MEMS sensor for flow monitoring in biomedical device applications
AGP Kottapalli, Z Shen, M Asadnia, S Tian, K Tao, J Miao, ...
2017 IEEE 30th International Conference on Micro Electro Mechanical Systems …, 2017
62017
Rapid and accurate thin film thickness extraction via UV-Vis and machine learning
SIP Tian, Z Liu, V Chellappan, YF Lim, Z Ren, F Oviedo, BH Teo, J Thapa, ...
2020 47th IEEE photovoltaic specialists conference (PVSC), 0128-0132, 2020
52020
What Information is Necessary and Sufficient to Predict Materials Properties using Machine Learning?
SIP Tian, A Walsh, Z Ren, Q Li, T Buonassisi
arXiv preprint arXiv:2206.04968, 2022
42022
Transfer Learning for Rapid Extraction of Thickness from Optical Spectra of Semiconductor Thin Films.
S TIAN, Z Ren, S Venkataraj, Y Cheng, D Bash, F Oviedo, J Senthilnath, ...
ArXiv 2207, 02209, 2022
22022
Tackling data scarcity with transfer learning: a case study of thickness characterization from optical spectra of perovskite thin films
SIP Tian, Z Ren, S Venkataraj, Y Cheng, D Bash, F Oviedo, J Senthilnath, ...
Digital Discovery 2 (5), 1334-1346, 2023
12023
Extracting film thickness and optical constants from spectrophotometric data by evolutionary optimization
R Dutta, SIP Tian, Z Liu, M Lakshminarayanan, S Venkataraj, Y Cheng, ...
Plos one 17 (11), e0276555, 2022
12022
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