Follow
Benjamin Iniguez
Benjamin Iniguez
Department of Electronic Engineering, Universitat Rovira i Virgili, Spain
No verified email
Title
Cited by
Cited by
Year
Continuous analytic IV model for surrounding-gate MOSFETs
D Jimenez, B Iniguez, J Sune, LF Marsal, J Pallares, J Roig, D Flores
IEEE Electron Device Letters 25 (8), 571-573, 2004
3462004
Charge-based modeling of junctionless double-gate field-effect transistors
JM Sallese, N Chevillon, C Lallement, B Iniguez, F Prégaldiny
IEEE Transactions on Electron Devices 58 (8), 2628-2637, 2011
2642011
Explicit continuous model for long-channel undoped surrounding gate MOSFETs
B Iniguez, D Jimenez, J Roig, HA Hamid, LF Marsal, J Pallarès
IEEE Transactions on Electron Devices 52 (8), 1868-1873, 2005
2622005
Accurate modeling and parameter extraction method for organic TFTs
M Estrada, A Cerdeira, J Puigdollers, L Reséndiz, J Pallares, LF Marsal, ...
Solid-state electronics 49 (6), 1009-1016, 2005
2052005
Analytical model of the threshold voltage and subthreshold swing of undoped cylindrical gate-all-around-based MOSFETs
H Abd El Hamid, B Iñíguez, JR Guitart
IEEE transactions on electron devices 54 (3), 572-579, 2007
1822007
A short-channel DC SPICE model for polysilicon thin-film transistors including temperature effects
MD Jacunski, MS Shur, AA Owusu, T Ytterdal, M Hack, B Iniguez
IEEE Transactions on Electron Devices 46 (6), 1146-1158, 1999
1681999
Modeling of nanoscale gate-all-around MOSFETs
D Jimenez, JJ Saenz, B Iniguez, J Sune, LF Marsal, J Pallares
IEEE Electron device letters 25 (5), 314-316, 2004
1672004
Charge transport in organic and polymer thin-film transistors: Recent issues
O Marinov, MJ Deen, B Iniguez
IEE Proceedings-Circuits, Devices and Systems 152 (3), 189-209, 2005
1482005
Two-dimensional analytical threshold voltage and subthreshold swing models of undoped symmetric double-gate MOSFETs
H Abd El Hamid, JR Guitart, B Iñíguez
IEEE Transactions on Electron Devices 54 (6), 1402-1408, 2007
1372007
A compact model for organic field-effect transistors with improved output asymptotic behaviors
CH Kim, A Castro-Carranza, M Estrada, A Cerdeira, Y Bonnassieux, ...
IEEE Transactions on Electron Devices 60 (3), 1136-1141, 2013
1262013
Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs
B Iñiguez, TA Fjeldly, A Lázaro, F Danneville, MJ Deen
IEEE transactions on electron devices 53 (9), 2128-2142, 2006
1262006
The 2021 flexible and printed electronics roadmap
Y Bonnassieux, CJ Brabec, Y Cao, TB Carmichael, ML Chabinyc, ...
Flexible and printed electronics 6 (2), 023001, 2021
1202021
Mobility model for compact device modeling of OTFTs made with different materials
M Estrada, I Mejía, A Cerdeira, J Pallares, LF Marsal, B Iñiguez
Solid-State Electronics 52 (5), 787-794, 2008
1162008
Fully depleted SOI CMOS technology for heterogeneous micropower, high-temperature or RF microsystems
D Flandre, S Adriaensen, A Akheyar, A Crahay, L Demeûs, P Delatte, ...
Solid-State Electronics 45 (4), 541-549, 2001
1142001
Compact model for short channel symmetric doped double-gate MOSFETs
A Cerdeira, B Iñiguez, M Estrada
Solid-State Electronics 52 (7), 1064-1070, 2008
1132008
Explicit analytical charge and capacitance models of undoped double-gate MOSFETs
O Moldovan, D Jimenez, JR Guitart, FA Chaves, B Iniguez
IEEE Transactions on Electron Devices 54 (7), 1718-1724, 2007
1062007
Compact model for short-channel junctionless accumulation mode double gate MOSFETs
T Holtij, M Graef, FM Hain, A Kloes, B Iñíguez
IEEE Transactions on Electron Devices 61 (2), 288-299, 2013
1042013
Compact charge-based physical models for current and capacitances in AlGaN/GaN HEMTs
FM Yigletu, S Khandelwal, TA Fjeldly, B Iniguez
IEEE Transactions on Electron Devices 60 (11), 3746-3752, 2013
1012013
Universal compact model for long-and short-channel thin-film transistors
B Iñiguez, R Picos, D Veksler, A Koudymov, MS Shur, T Ytterdal, ...
Solid-State Electronics 52 (3), 400-405, 2008
932008
Self-heating and kink effects in a-Si: H thin film transistors
L Wang, TA Fjeldly, B Iniguez, HC Slade, M Shur
IEEE Transactions on electron devices 47 (2), 387-397, 2000
862000
The system can't perform the operation now. Try again later.
Articles 1–20